A radiation sensor device may include at least one radiation sensor configured to capture radiation measurement data, a location circuit to determine physical location data, a clock to provide timestamp data, and one or more communication interfaces configured to communicate with a radiation mapping system through one or more of a communication network or a communications link. The device may include a processor configured to selectively control a frequency of operation of the one or more sensors to capture the radiation measurement data based on changes to the physical location data. The device may be configured to correlate the radiation measurement data to the physical location data and the timestamp and to determine an anomalous radiation measurement based on the radiation measurement data relative to background radiation data. The device may send an alert to the radiation mapping system in response to determining the anomalous radiation measurement.

A method for measuring alpha particle emissions may include obtaining a wafer emission rate, wherein the wafer emission rate is measured with a counter. The method may further include covering the wafer with a metal mesh grounded to a cathode of the counter wherein the metal mesh is grounded to the cathode outboard of the wafer and obtaining a mesh and wafer emission rate, wherein the mesh and wafer emission rate is measured with the counter. The method may further include replacing the wafer with a wafer carcass, obtaining a wafer carcass and mesh emission rate, and calculating a wafer carcass emissivity.

A radiotherapeutic detector device (14) comprising a detector arrangement (1) which has more than two carriers (2) which are arranged crosswise, and a detector field (7) is arranged on each carrier (2).

Radiation detectors and methods of using the radiation detectors that provide a route for surface decontamination during use are described. The detectors utilize light illumination of an internal surface during use. Light is in the longer UV-to-near-infrared spectra and desorbs contamination from internal surfaces of radiation detectors. The methods can be carried out while the detectors are in operation, preventing the appearance of the negative effects of radioactive and non-radioactive contamination during a detection regime and following a detection regime.

An apparatus for providing in-situ radiation measurements within a density equivalent package is disclosed. The apparatus may include a radiation detector embedded within the density equivalent package that is configured to measure an amount of exposure of a phantom material of the density equivalent package to radiation emitted by an irradiation device. The phantom material may have density equivalence with an object or substance for which radiation exposure information is sought and the phantom material may serve as a substitute for the object or substance. A signal including the measurement of the amount of exposure of the phantom material to the radiation may be provided to a processor of the apparatus for processing. The processor may process the signal to interpret and provide additional information relating to the measurement and may provide the information to a device communicatively linked to the apparatus.

Measuring and tracking energy emitted by a radiation source. A system includes an image sensor for sensing electromagnetic radiation and a scintillator. The scintillator absorbs energy emitted by a radiation source and scintillates the absorbed energy. The system is such that the image sensor senses an image frame depicting at least a portion of the scintillator when the radiation source emits the energy. The image frame comprises an indication of where the energy is absorbed by the scintillator.

Disclosed are systems and methods for simulating proximity detection of physical effects, the system including an external probe; a base unit associated with the external probe via a connector, the base unit comprising at least one processor coupled to the connector, the at least one processor configured to compute results based on an input received from the external probe; an input device; and a graphical display unit configured to display at least one of the computed results from the at least one processor and the input received from the input device and input received from the external probe.

Disclosed are systems and methods for simulating proximity detection of physical effects, the system including an external probe; a base unit associated with the external probe via a connector, the base unit comprising at least one processor coupled to the connector, the at least one processor configured to compute results based on an input received from the external probe; an input device; and a graphical display unit configured to display at least one of the computed results from the at least one processor and the input received from the input device and input received from the external probe.

The present disclosure describes methods for calibrating a spectral X-ray system to perform material decomposition with a single scan of an energy discriminating detector or with a single scan at each used X-ray spectrum. The methods may include material pathlengths exceeding the size of the volume reconstructable by the system. Example embodiments include physical and matching calibration phantoms. The physical calibration phantom is used to measure the attenuation of X-rays passing therethrough with all combinations of pathlengths through the calibration's basis materials. The matching digital calibration phantom is registered with the physical calibration phantom and is used to calculate the pathlength though each material for each measured attenuation value. A created data structure includes the X-ray attenuation for each X-ray spectrum or detector energy bin for all combinations of basis material pathlengths. The data structure is usable to perform a material decomposition on the X-ray projection of an imaged object.

The present disclosure describes methods for calibrating a spectral X-ray system to perform material decomposition with a single scan of an energy discriminating detector or with a single scan at each used X-ray spectrum. The methods may include material pathlengths exceeding the size of the volume reconstructable by the system. Example embodiments include physical and matching calibration phantoms. The physical calibration phantom is used to measure the attenuation of X-rays passing therethrough with all combinations of pathlengths through the calibration's basis materials. The matching digital calibration phantom is registered with the physical calibration phantom and is used to calculate the pathlength though each material for each measured attenuation value. A created data structure includes the X-ray attenuation for each X-ray spectrum or detector energy bin for all combinations of basis material pathlengths. The data structure is usable to perform a material decomposition on the X-ray projection of an imaged object.