Patent classifications
G01T1/20
DETECTION OF BAD DETECTORS AT IDLE STATE
A fault checker system for an X-ray detector, comprising an input interface (IN) for receiving readings acquired by a target detector pixel not exposed to X-radiation. A converter (CV) is configured to convert the readings into a metric. A thresholder (CP) is configured to compare the metric against at least one threshold and, based on the comparing, provide an indication on whether the detector pixel is faulty.
SCINTILLATOR, MEASURING DEVICE, MASS SPECTROMETER, AND ELECTRON MICROSCOPE
Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).
SCINTILLATOR, MEASURING DEVICE, MASS SPECTROMETER, AND ELECTRON MICROSCOPE
Provided are a scintillator and the like capable of improving emission intensity. A scintillator (S) comprises a sapphire substrate (6), a GaN layer (4) that is provided on the incident side to the sapphire substrate (6) and includes GaN, a quantum well structure (3) provided on the incident side to the GaN layer (4), and a conductive layer (2) provided on the incident side to the quantum well structure (3), wherein a plurality of emitting layers (21) including InGaN and a plurality of barrier layers (22) including GaN are alternatively stacked in the quantum well structure (3), and an oxygen-containing layer (23) including oxygen is provided between the quantum well structure (3) and the conductive layer (2).
RADIATION DETECTOR, RADIOGRAPHIC IMAGING APPARATUS, AND METHOD OF MANUFACTURING RADIATION DETECTOR
A radiation detector includes a sensor substrate, a conversion layer, and a reinforcing substrate. In the sensor substrate, a plurality of pixels for accumulating electric charges generated in response to light converted from radiation are formed on a pixel region of a flexible base material. The conversion layer is provided on a first surface of the base material on which the pixels are provided and converts radiation into light. The reinforcing substrate is provided on a surface of the conversion layer opposite to a surface on the base material side and includes a porous layer having a plurality of through-holes to reinforce the stiffness of the base material.
RADIATION DETECTOR, RADIOGRAPHIC IMAGING APPARATUS, AND METHOD OF MANUFACTURING RADIATION DETECTOR
A radiation detector includes a sensor substrate, a conversion layer, and a reinforcing substrate. In the sensor substrate, a plurality of pixels for accumulating electric charges generated in response to light converted from radiation are formed on a pixel region of a flexible base material. The conversion layer is provided on a first surface of the base material on which the pixels are provided and converts radiation into light. The reinforcing substrate is provided on a surface of the conversion layer opposite to a surface on the base material side and includes a porous layer having a plurality of through-holes to reinforce the stiffness of the base material.
Scintillator panel, and radiation detector
A scintillator panel includes a substrate made of an organic material, a barrier layer formed on the substrate and including thallium iodide as a main component, and a scintillator layer formed on the barrier layer and including cesium iodide as a main component. According to this scintillator panel, moisture resistance can be improved by providing the barrier layer between the substrate and the scintillator layer.
Radiation monitor and radiation measurement method
Provided is a radiation monitor and the like capable of appropriately measuring radiation. A radiation monitor (100) includes: radiation detection units (11, 12); optical fibers (13p, 13q) that transmit light generated by a plurality of radiation detection elements (11a, 12a) to merge; a light detection unit (14) that converts the light after merging guided to the light detection unit into an electric pulse; a measurement device (15) that calculates a dose rate of radiation based on a count rate of the electric pulses; and an analysis/display device (16). Housings (11b, 12b) include a housing (11b) made of a first material and another housing (12b) made of a second material.
Radiation monitor and radiation measurement method
Provided is a radiation monitor and the like capable of appropriately measuring radiation. A radiation monitor (100) includes: radiation detection units (11, 12); optical fibers (13p, 13q) that transmit light generated by a plurality of radiation detection elements (11a, 12a) to merge; a light detection unit (14) that converts the light after merging guided to the light detection unit into an electric pulse; a measurement device (15) that calculates a dose rate of radiation based on a count rate of the electric pulses; and an analysis/display device (16). Housings (11b, 12b) include a housing (11b) made of a first material and another housing (12b) made of a second material.
Deep ultraviolet and infrared silicon sensor module
A sensor module that may include optics and a sensor located downstream to the optics. The optics may include a self-assembling polymer and luminescent elements embedded in the self-assembling polymer.
Deep ultraviolet and infrared silicon sensor module
A sensor module that may include optics and a sensor located downstream to the optics. The optics may include a self-assembling polymer and luminescent elements embedded in the self-assembling polymer.