The invention relates to radiographic equipment comprising a height-adjustable board, a C-shaped arch, disposed transversally to the greater dimension of the board, said board being housed within the internal space defined between the two free extremities of the arch. The arch is slidingly mounted on a column by means of a connecting element in such a way that as the arch rotates around an imaginary rotational axis it causes the connecting element to slide or roll throughout the extension of the arch. It further comprises a rail extending parallel to the greater dimension of the board, on which the column rests. The arch features at its lower extremity an x-ray receiver and at its upper extremity an x-ray emission assembly.

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

The present invention provides a method for using ion filtering to adjust the number of ions delivered to a substrate. The method comprising a process chamber being provided that is operatively connected to a plasma source. The substrate is provided on a substrate support that is provided within the process chamber. An electrical bias source is provided that is operatively connected to an aperture plate that is provided in the process chamber. The substrate on the substrate support is processed using a plasma generated using the plasma source. A variable bias voltage from the electrical bias source is applied to the aperture plate during the plasma processing of the substrate. The plasma processing of the substrate can further comprise exposing the substrate to a plasma time division multiplex process which alternates between deposition and etching on the substrate.

The present invention provides a method for using ion filtering to adjust the number of ions delivered to a substrate. The method comprising a process chamber being provided that is operatively connected to a plasma source. The substrate is provided on a substrate support that is provided within the process chamber. An electrical bias source is provided that is operatively connected to an aperture plate that is provided in the process chamber. The substrate on the substrate support is processed using a plasma generated using the plasma source. A variable bias voltage from the electrical bias source is applied to the aperture plate during the plasma processing of the substrate. The plasma processing of the substrate can further comprise exposing the substrate to a plasma time division multiplex process which alternates between deposition and etching on the substrate.

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

An ion detector for secondary ion mass spectrometer, the detector having an electron emission plate coupled to a first electrical potential and configured to emit electrons upon incidence on ions; a scintillator coupled to a second electrical potential, different from the first electrical potential, the scintillator having a front side facing the electron emission plate and a backside, the scintillator configured to emit photons from the backside upon incidence of electrons on the front side; a lightguide coupled to the backside of the scintillator and confining flow of photons emitted from the backside of the scintillator; and a solid-state photomultiplier coupled to the light guide and having an output configured to output electrical signal corresponding to incidence of photons from the lightguide. A SIMS system includes a plurality of such detectors movable arranged over the focal plane of a mass analyzer.

A neutron imaging system includes a neutron generator, a flight tube, a stage, a neutron imaging module, and a neutron shield. The neutron generator is configured to provide neutrons. The flight tube has an input opening, an output opening, and a flight tube wall extending from the input opening to the output opening. The flight tube is positioned relative to the neutron generator to enable neutrons from the neutron generator to enter the flight tube through the input opening and exit the flight tube through the output opening. The stage is configured to support a sample object at a position to receive neutrons that pass through the entire length of the flight tube and then pass through the output opening of the flight tube. The neutron imaging module has a neutron-sensitive component that is sensitive to neutrons and configured to receive neutrons that pass through the sample object and generate neutron detection signals that can be used to generate an image or video of the sample object. The neutron shield surrounds at least a portion of the flight tube and at least a portion of the neutron imaging module to block at least a portion of stray neutrons that travel toward the neutron-sensitive component of the neutron imaging module, in which the stray neutrons do not enter the flight tube through the input opening of the flight tube.

A neutron imaging system includes a neutron generator, a flight tube, a stage, a neutron imaging module, and a neutron shield. The neutron generator is configured to provide neutrons. The flight tube has an input opening, an output opening, and a flight tube wall extending from the input opening to the output opening. The flight tube is positioned relative to the neutron generator to enable neutrons from the neutron generator to enter the flight tube through the input opening and exit the flight tube through the output opening. The stage is configured to support a sample object at a position to receive neutrons that pass through the entire length of the flight tube and then pass through the output opening of the flight tube. The neutron imaging module has a neutron-sensitive component that is sensitive to neutrons and configured to receive neutrons that pass through the sample object and generate neutron detection signals that can be used to generate an image or video of the sample object. The neutron shield surrounds at least a portion of the flight tube and at least a portion of the neutron imaging module to block at least a portion of stray neutrons that travel toward the neutron-sensitive component of the neutron imaging module, in which the stray neutrons do not enter the flight tube through the input opening of the flight tube.

This dosimeter comprises: a transducer material capable, when it is excited by a secondary ionizing radiation, of generating photons or electric charges, an amplifying layer capable, in response to its excitation by the primary ionizing radiation, of generating the secondary ionizing radiation.

This amplifying layer comprises a first and a second amplifying sublayer stacked on top of one another. The first and the second amplifying sublayers are composed of at least 70%, by weight, respectively, of at least one first and one second material, the atomic numbers of which are greater than or equal to 29. The atomic number of the first material being less than the atomic number of the second material. The first sublayer is interposed between the second sublayer and the transducer material.