Ion detectors of the type used in scientific instrumentation, such as mass spectrometers. More particularly, a self-contained particle detector includes an enclosure formed in part by a transmission mode secondary electron emissive element, the enclosure defining an internal environment and an external environment, wherein the transmission mode secondary electron emissive element has an externally facing surface and an internally facing surface and is configured such that impact of a particle on the externally facing surface causes emission of one or more secondary electrons from the internally facing surface.

A monocrystalline scintillator comprises a monocrystal and an optical plate wherein a first side of the monocrystal is adhered to the optical plate. The monocrystal comprises at least one of a rare earth garnet, a perovskite crystal, a rare-earth silicate, and a monocrystal oxysulphide. The scintillator assembly includes an adhesive adhering the optical plate to the first side of the monocrystal. The adhesive can comprise an ultra-high vacuum compatible adhesive. The adhesive is substantially transparent and has a refractive index matching the optical plate. The scintillator assembly can also include a reflective coating on the second side of the monocrystal. The monocrystalline scintillator assembly can be incorporated in a microchannel plate image intensifier tube to provide improved spatial resolution and temporal response.

The present invention provides a method for using ion filtering to adjust the number of ions delivered to a substrate. The method comprising a process chamber being provided that is operatively connected to a plasma source. The substrate is provided on a substrate support that is provided within the process chamber. An electrical bias source is provided that is operatively connected to an aperture plate that is provided in the process chamber. The substrate on the substrate support is processed using a plasma generated using the plasma source. A variable bias voltage from the electrical bias source is applied to the aperture plate during the plasma processing of the substrate. The plasma processing of the substrate can further comprise exposing the substrate to a plasma time division multiplex process which alternates between deposition and etching on the substrate.

The present invention provides a method for using ion filtering to adjust the number of ions delivered to a substrate. The method comprising a process chamber being provided that is operatively connected to a plasma source. The substrate is provided on a substrate support that is provided within the process chamber. An electrical bias source is provided that is operatively connected to an aperture plate that is provided in the process chamber. The substrate on the substrate support is processed using a plasma generated using the plasma source. A variable bias voltage from the electrical bias source is applied to the aperture plate during the plasma processing of the substrate. The plasma processing of the substrate can further comprise exposing the substrate to a plasma time division multiplex process which alternates between deposition and etching on the substrate.

A neutron imaging system includes a neutron generator, a flight tube, a stage, a neutron imaging module, and a neutron shield. The neutron generator is configured to provide neutrons. The flight tube has an input opening, an output opening, and a flight tube wall extending from the input opening to the output opening. The flight tube is positioned relative to the neutron generator to enable neutrons from the neutron generator to enter the flight tube through the input opening and exit the flight tube through the output opening. The stage is configured to support a sample object at a position to receive neutrons that pass through the entire length of the flight tube and then pass through the output opening of the flight tube. The neutron imaging module has a neutron-sensitive component that is sensitive to neutrons and configured to receive neutrons that pass through the sample object and generate neutron detection signals that can be used to generate an image or video of the sample object. The neutron shield surrounds at least a portion of the flight tube and at least a portion of the neutron imaging module to block at least a portion of stray neutrons that travel toward the neutron-sensitive component of the neutron imaging module, in which the stray neutrons do not enter the flight tube through the input opening of the flight tube.

A neutron imaging system includes a neutron generator, a flight tube, a stage, a neutron imaging module, and a neutron shield. The neutron generator is configured to provide neutrons. The flight tube has an input opening, an output opening, and a flight tube wall extending from the input opening to the output opening. The flight tube is positioned relative to the neutron generator to enable neutrons from the neutron generator to enter the flight tube through the input opening and exit the flight tube through the output opening. The stage is configured to support a sample object at a position to receive neutrons that pass through the entire length of the flight tube and then pass through the output opening of the flight tube. The neutron imaging module has a neutron-sensitive component that is sensitive to neutrons and configured to receive neutrons that pass through the sample object and generate neutron detection signals that can be used to generate an image or video of the sample object. The neutron shield surrounds at least a portion of the flight tube and at least a portion of the neutron imaging module to block at least a portion of stray neutrons that travel toward the neutron-sensitive component of the neutron imaging module, in which the stray neutrons do not enter the flight tube through the input opening of the flight tube.

A system for detecting gamma radiation by neutron activation of a material includes a switchable radiation source and at least a first detector. The switchable radiation source includes a primary source assembly having an alpha particle emitter, and a target assembly in which, upon irradiation of the target assembly by alpha particles from the primary source assembly, secondary radiation comprising neutrons is produced. An alignment, proximity or exposure of the primary source assembly relative to the target assembly is adjustable to control irradiation of the target assembly by the primary source assembly and thereby selectively irradiate a material under interrogation with the secondary radiation. The first detector is configured to detect gamma radiation prompted by neutron activation of the material under interrogation.

A system for detecting gamma radiation by neutron activation of a material includes a switchable radiation source and at least a first detector. The switchable radiation source includes a primary source assembly having an alpha particle emitter, and a target assembly in which, upon irradiation of the target assembly by alpha particles from the primary source assembly, secondary radiation comprising neutrons is produced. An alignment, proximity or exposure of the primary source assembly relative to the target assembly is adjustable to control irradiation of the target assembly by the primary source assembly and thereby selectively irradiate a material under interrogation with the secondary radiation. The first detector is configured to detect gamma radiation prompted by neutron activation of the material under interrogation.

A high-energy ray detector includes a detection unit in a vacuum container. The detection unit includes a first electron multiplier, a second electron multiplier, and an electron collector. Each of the first electron multiplier and the second electron multiplier has one or more MCPs each configured to emit electrons by interaction with an incident high-energy ray (-ray, X-ray (in particular hard X-ray), or neutron ray), and multiply and output the electrons. The electron collector is transmissive for the high-energy ray. The electron collector is configured to collect the electrons multiplied and output from each of the first electron multiplier and the second electron multiplier, and output an electric pulse signal.

Disclosed herein is a photomultiplier tube (PMT) comprising: an electron ejector configured for emitting primary electrons in response to an incident photon; a detector configured for collecting electrons and providing an output signal representative of the incident photon; and a series of electrodes between the electron ejector and the detector, wherein each of the electrodes is configured for emitting secondary electrons in response to incident electrons, and each of the electrodes includes a bi-metal arc-shaped sheet.