Patent classifications
G01T1/2914
Macropixel and macropixel-based particle and radiation detector
An arrangement for determining an energy spectrum of a beam of radiation or particles is disclosed. The arrangement comprises a plurality of polymeric bodies. Each of the plurality of polymeric bodies includes an optical waveguide. Each of the plurality of polymeric bodies has a scintillator disposed at a respective end of the optical waveguide. The scintillators are arranged relative to each other such that an energy resolution of a particle beam incident on the arrangement can be determined. Furthermore, a particle detector with the arrangement and an evaluation unit for reading out the particle detector are disclosed.
Sample inspection method and system
A sample may be inspected by making particles traverse the sample. The particles that have traversed the sample hit a detector one-by-one. In response thereto, the detector provides a sequence of respective detection outputs. The sequence of respective detection outputs is processed so as to identify respective locations where respective incident particles have hit the detector. An image is generated on the basis of the respective locations that have been identified. In order to determine a location where an incident particle has hit the detector, an evaluation is made with regard to pre-established respective associations between, on the one hand, respective locations where incident particles have hit the detector and, on the other hand, respective detection outputs.
MULTILAYER SCINTILLATOR DETECTOR AND METHOD FOR RECONSTRUCTING A SPATIAL DISTRIBUTION OF A BEAM OF IRRADIATION
A multilayer scintillation detector, includes at least three layers superposed on one another, and each extending parallel to a plane, called the detection plane, wherein each layer is formed by a first material, called a scintillation material, capable of interacting with an ionizing radiation and of forming, following the interaction, a scintillation light in a scintillation spectral band; each layer has a plurality of light guides, respectively extending parallel to the detection plane, according to a length, the light guides being disposed, over all or part of their length, parallel to an axis of orientation; the axis of orientation of the light guides of each layer is oriented, in the detection plane, according to an orientation, the orientations of the respective axes of orientation of at least three layers being different from one another, such that each layer has an associated orientation; and the scintillation material has a first refractive index.
METHOD FOR CORRECTING A SPECTRAL IMAGE
The invention concerns a method for processing energy spectra of radiation transmitted by an object irradiated by an ionising radiation source, in particular X-ray radiation, for medical imaging or non-destructive testing applications. The method uses a detector comprising a plurality of pixels, each pixel being capable of acquiring a spectrum of the radiation transmitted by the object. The method makes it possible, based on a plurality of detected spectra, to estimate a spectrum, referred to as the scattering spectrum, representative of radiation scattered by the object. The estimation involves taking into account a spatial model of the scattering spectrum. Each acquired spectrum is corrected taking into account the estimated scattering spectrum. The invention makes it possible to reduce the influence of the scattering, by the object, of the spectrum emitted by the source.
Ion chamber for radiation measurement
An ion chamber has a chamber having an interior volume. There is a first electrode and a second electrode in the chamber and separated by a gap. A collector electrode is positioned between the first electrode and the second electrode. The collector electrode is shaped to occlude a portion of the first electrode from the second electrode.
PHOTON INTERACTION CHARACTERISTICS FROM A SUBSET OF PIXELS
One embodiment provides a method, including: receiving a photon interaction occurring within a photon detector pixel array, wherein the photon detector pixel array comprises a plurality of pixels; determining a photoelectron cloud generated from the photon interaction, wherein the photon detector pixel array comprises an electric field, wherein an electrostatic repulsive force disperses a photon to the photoelectron cloud; identifying a subset of the plurality of pixels associated with the photon interaction, wherein each of the subset of the plurality of pixels corresponds to pixels activated by the photo electron cloud, wherein the subset of the plurality of pixels comprise a central pixel and a plurality of neighboring pixels, wherein the central pixel comprises the pixel having the highest amplitude response to the photon interaction; and determining, from the photoelectron cloud, a characteristic of the photon interaction, wherein the characteristic comprises at least one of: time, position, and energy of the interaction. Other aspects are described and claimed.
Adaptive Compton camera for medical imaging
To optimize an image quality and/or a sensitivity, a Compton camera is adaptable. A scatter detector and/or a catcher detector may move closer to and/or further away from a patient and/or each other. This adaptation allows a balancing of the image quality and the sensitivity by altering the geometry.
Device and method for measurement of proton beam source position and beamline center point
A device and a method for measuring proton beam source position and beamline center are disclosed. The device includes N quadrupole magnets, a laser, a target and a scintillation screen; the target and the scintillation screen are arranged in front of and behind the N-quadrupole lens, respectively; the N-quadrupole lens can be converted to a M-quadrupole lens; the position of proton beam after being focused by the N- or M-quadrupole lens on the scintillation screen is measured; according to the amplification factor and the proton beam position, the offset of the proton beam source from the beamline center, as well as the position of the beamline center on the scintillation screen are calculated; the disclosure can accurately determine the position of the beamline center and the proton beam source by the use of N quadrupole magnets, combined with a scintillation screen.
Gamma ray detection system and calibration method thereof
Gamma ray detection system (10) comprising a computation system including a signal processing and control system (30), a detection module assembly (13) including at least one detection module (14) configured for detecting gamma ray emissions from a target zone (4), each detection module comprising at least one scintillator plate (16) having a major surface (40a) oriented to generally face the target zone and lateral minor surfaces (40b) defining edges of the scintillator layer, and a plurality of photon detectors coupled to said at least one scintillator plate and connected to the signal processing and control system. The scintillator plate comprises a material having isotopes intrinsically emitting radiation causing intrinsic scintillation events in one or more scintillator plates having an intensity measurable by the photon detectors. The gamma ray detection system comprises a calibration module configured to execute a spatial calibration procedure based on measurements of a plurality of said intrinsic scintillation events output (37) by the photon detectors, the spatial calibration procedure for determining spatial positions of scintillating events in the scintillator plate as a function of the outputs of the photon detectors.
Radiological imaging apparatus, manufacturing method of the same, and imaging system
A radiological imaging apparatus includes a first panel where a plurality of radiation detecting elements are arrayed on a first substrate, a second panel where a plurality of radiation detecting elements are arrayed on a second substrate, and a sheet-shaped adhesion part configured to adhere a second-panel side face of the first panel and a first-panel side face of the second panel to each other, so that the first panel and the second panel are overlaid on each other in planar view as to an upper face of the first substrate. The adhesion part is configured to maintain adhesion of the first panel and the second panel, while tolerating change in relative positions thereof in a planar direction parallel to the upper face of the first substrate.