Examples of the present disclosure relate to a particle beam dose profile measurement apparatus comprising a particle detector stack comprising a plurality of scintillator layers. Each scintillator layer of the detector stack is disposed along an axis of the apparatus such that the axis projects through each layer. Each scintillator layer is configured to produce scintillation light indicative of an energy deposition, in that scintillator, of a particle beam incident upon the detector stack along said axis. The apparatus comprises readout circuitry configured to measure the scintillation light of each scintillator layer; and dose profile determination circuitry configured to determine a dose profile of said particle beam within the detector stack. Said determining is based on the measured scintillation light of each scintillator layer, and a quenching correction.

A method and a system for automatically aligning a positionable X-ray source of an X-ray system in alignment with a mobile X-ray detector is disclosed where the X-ray system detects the position of the mobile X-ray detector using a 3D camera and then driving the positionable X-ray source to a position in alignment with the mobile X-ray detector.

The present invention relates to a radioactivity measurement method and a radioactivity measurement system using data expansion. A radioactivity measurement method using data expansion according to the present invention comprises the steps of: measuring radioactivity while performing energy scanning and temporal scanning; preparing a database from a time-energy-related data set obtained in result of the scanning; expanding the database by means of random distribution fitting; and obtaining a radioactivity measurement value of desired time from the database.

A radiological imaging apparatus includes a first panel where a plurality of radiation detecting elements are arrayed on a first substrate, a second panel where a plurality of radiation detecting elements are arrayed on a second substrate, and a sheet-shaped adhesion part configured to adhere a second-panel side face of the first panel and a first-panel side face of the second panel to each other, so that the first panel and the second panel are overlaid on each other in planar view as to an upper face of the first substrate. The adhesion part is configured to maintain adhesion of the first panel and the second panel, while tolerating change in relative positions thereof in a planar direction parallel to the upper face of the first substrate.

The present disclosure provides a spiral Computed Tomography (CT) device and a three-dimensional image reconstruction method. The spiral CT device includes: an inspection station configured to carry an object to be inspected, the inspection station defining an inspection space which is located above the inspection station and is used for accommodating the object to be inspected; a rotational supporting apparatus which is disposed around the inspection space in a plane parallel to a first direction and is rotatable around the inspection space in a detection state; a plurality of X-ray sources located on the rotational supporting apparatus and configured to transmit X-rays to pass through the inspection space; and a plurality of X-ray receiving apparatuses in one-to-one correspondence to the plurality of X-ray sources, the plurality of X-ray receiving apparatuses being located on the rotational supporting apparatus opposite to the plurality of X-ray sources respectively and configured to collect the X-rays passing through the inspection space, wherein the plurality of X-ray sources and the plurality of X-ray receiving apparatuses are rotational synchronously with the rotational supporting apparatus.

A setting method for setting at least a part of a region in which a structure of a specimen exists as a target region, for an evaluation of an internal structure of the specimen includes setting an arbitrary position from the region in which the structure of the specimen exists, and setting the target region based on the set position.

Systems, methods, and devices for determining relative and absolute positions and orientations of a detector and an inspection part of a CT system. In some cases positions/orientations of the detector and the inspection part can be defined, at least in part, by tilt angles relative to reference axes and/or planes defined by various combinations of the reference axes. In some embodiments, sensors coupled to the detector and to a stage assembly having the inspection part coupled thereto can be used to determine the tilt angles of the inspection part and the detector, respectively. Data from the sensors characterizing tilt angles of the detector and the inspection part can be used to adjust projectional radiographs of the inspection part to correct for the mechanical wobble of the stage. By using tilt data to adjust projectional radiographs, the quality of tomographic images and 3-dimensional reconstructions of the inspection part can be improved.

An ion chamber has a chamber having an interior volume. There is a first electrode and a second electrode in the chamber and separated by a gap. A collector electrode is positioned between the first electrode and the second electrode. The collector electrode is shaped to occlude a portion of the first electrode from the second electrode.

An optical system for modeling a distribution of plasma particles is provided. The system includes an electromagnetic wave generator configured to generate an electromagnetic wave having a first set of values of a parameter, a non-linear medium configured to receive, from the electromagnetic wave generator, the electromagnetic wave, an output detector configured to detect a second set of values of the parameter responsive to propagation of the electromagnetic wave through the non-linear medium, and a controller configured to select the first set of values of the parameter, communicate the first set of values of the parameter to the electromagnetic wave generator, receive, from the output detector, the second set of values of the parameter, and determine, based on the first set of values of the parameter and the second set of values of the parameter, a distribution of plasma particles.

A device includes sample tray units, a sample tray transporting unit, a sample tray handling unit, and a sample tray radiation stage unit. The sample tray units are configured to load samples. The sample tray transporting unit is configured to carry a sample tray unit to a radiation room. The sample tray handling unit is between the sample tray transporting unit and the sample tray radiation stage unit, and is configured to transfer the sample tray unit on the sample tray transporting unit to the sample tray radiation stage unit or return the sample tray unit on the sample tray radiation stage unit to the sample tray transporting unit. The sample tray radiation stage unit is configured to carry the sample tray unit and move the samples to be irradiated in the sample tray unit to a particle beam radiation area to receive radiation.