Patent classifications
G02B13/146
METHOD FOR CO-LOCATING DISSIMILAR OPTICAL SYSTEMS IN A SINGLE APERTURE
The system and method for combining two optical assemblies into the same volume, particularly when the field of view of the two assemblies are different, so that the overall volume and size, weight and power (SWaP) for the system is reduced. This also allows both subsystems (e.g., narrow field of view (NFOV) and wide field of view (WFOV) to use a single aperture and the same external protective window, reducing overall cost for a system of co-located dissimilar optical systems in a single aperture.
Lens system for high quality visible image acquisition and infra-red iris image acquisition
This disclosure is directed to systems and methods for acquiring IR light and visible light images. A lens may be configured to operate in at least a first configuration and a second configuration. The lens may have a first filter over a first portion of the lens and a second filter over a second portion of the lens. In the first configuration, a third filter may operate with the lens and the second filter to allow visible light from a first object located beyond a predetermined distance from the lens to pass and be focused on a sensor for image acquisition. In the second configuration, a fourth filter may operate with the lens and the first filter to allow IR light from a second object located within the predetermined distance to pass and be focused on the sensor for image acquisition.
Optical imaging system of camera lens assembly
The present disclosure provides an optical imaging system of a camera lens assembly. The optical imaging system is sequentially provided with a first lens, a second lens, a third lens and a fourth lens from an object side to an imaging side along an optical axis. The first lens has a positive refractive power, an object side surface and an image side surface of the first lens are both convex surface. An object side surface of the second lens is a convex surface, and an image side surface of the second lens is a convex surface. The third lens has a negative refractive power and the fourth lens has a negative refractive power. An effective focal length of the first lens f1, an effective focal length of the fourth lens f4, and an effective focal length of the optical imaging system f satisfy: 0.8<(f1+f4)/f<0.
IMAGING LENS AND MANUFACTURING METHOD OF LIGHT-SHIELDING ELEMENT
An imaging lens including an aperture and a lens with refractive power arranged from a zoom-in side to a zoom-out side along an optical axis is provided. The aperture includes a substrate and a light-shielding layer. The substrate includes a first middle region and a first outer edge region surrounding the first middle region. The first outer edge region allows visible light and infrared light to substantially pass therethrough. The light-shielding layer includes a second middle region and a second outer edge region surrounding the second middle region. The second outer edge region allows infrared light to substantially pass therethrough and substantially shields visible light. A thickness of the aperture is between 0.01 mm and 0.3 mm along a direction of an optical axis. Furthermore, an imaging lens and a manufacturing method of a light-shielding element are also provided.
RIGID-SCOPE OPTICAL SYSTEM, IMAGING APPARATUS, AND ENDOSCOPE SYSTEM
A rigid-scope optical system includes: an image-formation optical system that causes an image in each of wavelength bands to be formed in a predetermined imaging device, the wavelength bands including a fluorescence wavelength band and a visible light wavelength band; and a color-separation-prism optical system having a dichroic film that separates an optical path of light to be imaged into an optical path of the visible light wavelength band and an optical path of the fluorescence wavelength band, in which the image-formation optical system causes the respective images to be formed in a fluorescence imaging device and a visible light imaging device, the fluorescence imaging device and the visible light imaging device being disposed to cause an amount of misalignment to correspond to a difference between an optical path length of fluorescence and an optical path length of visible light.
Athermalized and achromatized multispectral optical systems and methods of designing same
An optical system for multispectral, infrared light having at least three element. Such systems include a first element having a first thermal glass constant-instantaneous Abbe number product and a first peak wavelength, and a second glass element having a second thermal glass constant-instantaneous Abbe number product and a second peak wavelength. The first product and the second product differing from one another by greater than 0.0075 K.sup.1. The first peak wavelength and the second peak wavelength are greater than 6 microns. The system also includes a third glass element having a third product and a third peak wavelength, the third wavelength differing from the first wavelength and the second by at least 3 microns, the third wavelength being in the range 1-5 microns. The sum of the first, second and third products being about zero. A doublet for transmitting multispectral light is also disclosed, as well as methods of designing such lenses.
COMPACT DUAL-BAND SENSOR
Dual-band optical imaging systems and methods. One example of a dual-band optical system includes an all-reflective shared optical sub-system configured to receive combined optical radiation including first optical radiation having wavelengths in a first waveband and second optical radiation having wavelengths in a second, different waveband, and an optical element positioned to receive the combined optical radiation from the all-reflective shared optical sub-system and having a dichroic coating configured to transmit the first optical radiation and to reflect the second optical radiation, the optical element being configured to transmit the first optical radiation toward a first focal plane and to reflect and focus the second optical radiation to a second focal plane. The all-reflective shared optical sub-system and the optical element are each positioned symmetrically about a primary optical axis extending between the first focal plane and the second focal plane.
IMAGING LENS AND IMAGING DEVICE
An imaging lens is provided with: a first lens with negative power; a second lens with negative power; a third lens with positive power; and a fourth lens with positive power. The cemented fourth lens is formed from an object side lens with negative power and an image side lens with positive power. The thickness of a resin adhesive layer that bonds the object side lens and the image side lens is 20 m or greater on the optical axis, and when Sg1H is the amount of sag in the image side lens surface of the object side lens and Sg2H is the amount of sag in the object side lens surface of the image side lens. The bonding operation is easy without damage occurring to the cemented surfaces, with a design that takes into account thickness of the resin adhesive layer; therefore various forms of aberration can be corrected.
SYSTEM AND METHOD LASER FOR PROCESSING OF MATERIALS
A multiple wavelength laser processing system is configured with a multiple wavelength laser source for generating a multiple wavelength coaxial laser processing beam. The laser processing system further includes a multiple wavelength optical system to deliver the coaxial laser processing beam to a laser-material interaction zone on the surface of a workpiece such that each of the a first and a second laser wavelengths in the processing beam impinge at least a portion of the interaction zone as respective first and second concentric laser spots. The multiple wavelength optical system includes a multiple wavelength beam collimator, a configurable chromatic optic, and a laser processing focus lens, wherein the configurable chromatic optic provides an adjustment to the relative focus distance of the first and second laser wavelengths.
Spectrometer and method for measuring the spectral characteristics thereof
Spectrometer and Method for Measuring the Spectral Characteristics thereof. The present invention provides an improved spectrometer and method for measuring the spectral characteristics of an object using the spectrometer. The spectrometer uses single aberration-corrected lens or mirror system such that the light passes through or reflects off that component only once. The lens or mirror system includes a plurality of different lens or mirror that may or may not be made up of different materials which act as one single system and wherein the lens or mirror are aligned such that the different wavelengths contained in the input signal are focused on one plane.