Scanning Probe Microscope (SPM) system configured with the use of a composite material employing a non-metallic matrix and at least one of diamond particles, fused silica particles, boron carbide particles, silicon carbide particles, aluminum oxide particles, carbon fiber elements, carbon nanotube elements, and doped diamond particles to increase the structural integrity and/or strength of the SPM system, and a fraction of reinforcement ranging from at least 25% to at least 75% with advantageous modification of the Young's modulus, coefficient of thermal expansion, and thermal conductivity.

A microscope system may comprise a plurality of microscope modules, a cassette for holding a plurality of slides, a slide loader configured to move the plurality of slides between the cassette and the plurality of microscope modules, and a processor coupled to the slide loader. The processor may be configured with instructions which, when executed, cause the slide loader to move a slide into or from a selected microscope module among the plurality of microscope modules. Various other methods, systems, and computer-readable media are also disclosed.

The present disclosure pertains to two-photon microscopy, and specifically to methods and systems for optimizing the performance of entangled two-photon absorption (ETPA) microscopy. An ETPA microscope is described with time delay tunability to optimize the coincidence of entangled photons on a sample. The optimization allows for increased two-photon absorption by the sample, resulting in increased luminescence of the sample. The ETPA microscopy systems and methods described allow for nonlinear imaging using excitation energy intensities six orders of magnitude lower than comparable two-photon absorption microscopy techniques using classical light.

An image acquisition device includes a spatial light modulator modulating irradiation light, a control unit controlling a modulating pattern so that first and second light converging points are formed in an observation object, a light converging optical system converging the irradiation light, a scanning unit scanning positions of the first and second light converging points in the observation object in a scanning direction intersecting an optical axis of the light converging optical system, and a photodetector detecting first observation light generated from the first light converging point and second observation light generated from the second light converging point. The photodetector has a first detection area for detecting the first observation light and a second detection area for detecting the second observation light. The positions of the first and second light converging points are different from each other in a direction of the optical axis.

Optical systems including lens assemblies and methods of imaging fields of view using such optical systems are disclosed. An optical system for imaging a two dimensional field includes a first lens assembly, a first scanning mirror, a second lens assembly, and a two dimensional image sensor. The first lens assembly has a first transform function whose output is within 0.1% of f.sub.1*(c.sub.1*θ.sub.1+(1−c.sub.1)*sin(θ.sub.1)) for any ray of light that traverses the first lens assembly from a center of an entrance pupil of the first lens assembly at an angle θ.sub.1 relative to an optical axis of the first lens assembly. f.sub.1 is a focal length of the first lens assembly, and −0.5<c.sub.1<2.

A method for performing microscopy-based imaging of samples comprises: loading a sample holder (100) onto a support (50) configured to receive the sample holder (100); moving the sample holder (100) in a first direction, from a starting position on a first strip of the sample holder (100), to move the sample holder (100) relative to an imaging line of a line camera (10), to capture an image of the first strip of the sample holder (100); monitoring a focal plane using an autofocus system (15) as the sample holder (100) is moved in the first direction; in response to a signal from the autofocus system (15), moving an objective lens (25) along the optical axis to adjust the focal plane; and moving the sample holder (100) in a second direction, to align the imaging line of the line camera (10) with a position on a second strip of the sample holder (100).

An apparatus for obtaining a plurality of images of a sample includes a sample device suitable for holding a liquid sample; a first optical detection assembly including a first image acquisition device, the first optical detection assembly having an optical axis and an object plane, the object plane including an image acquisition area from which electromagnetic waves can be detected as an image by the first image acquisition device; one translation unit arranged to move the sample device and the first optical detection assembly relative to each other; and an image illumination device, wherein the apparatus is arranged to move the sample device and the first optical detection assembly relative to each other along a scanning path, which defines an angle theta relative to the optical axis, wherein theta is in the range of about 0.3 to about 89.7 degrees.

In the methods and systems, optical images of inspection care areas on a semiconductor wafer are acquired and analyzed to detect defects. However, during this analysis, the same threshold setting is not used for all inspection care areas. Instead, care areas are grouped into different care area groups, based on different design layouts and properties. Each group is associated with a corresponding threshold setting that is optimal for detecting defects in the inspection care areas belonging to that group. The assignment of the care areas to the different groups and the association of the different threshold settings with the different groups are noted in an index. This index is accessible during the analysis and used to ensure that each of the inspection care areas in a specific care area group is analyzed based on a corresponding threshold setting that is optimal for that specific care area group.

A novel method is disclosed to allow for the simultaneous capture of image data from multiple depths of a volumetric sample. The method allows for the seamless acquisition of a 2D or 3D image, while changing on the fly the acquisition depth in the sample. This method can also be used for auto focusing. Additionally this method of capturing image data from the sample allows for optimal efficiency in terms of speed, and light sensitivity, especially for the herein mentioned purpose of 2D or 3D imaging of samples when using a tilted configuration as depicted in FIG. 2. The method may be particularly used with an imaging sensor comprising a 2D array of pixels in an orthogonal XY coordinate system where gaps for electronic circuitry are present. Also other imaging sensor may be used. Further, an imaging device is presented which automatically carries out the method.

A method and device for the optical scanning of a chromatographic sample (3), where a sample plate (2) holding the sample (3) is illuminated with light from a first illumination device (13) and the light emitted by the sample plate (2) is detected by an optical detector device (15) which detects in cell form or area form, a second illumination device (14) is preferably firstly activated in a preparation step. The sample plate (2) is displaced in a first displacement direction relative to the detector device (15), illuminated by the first illumination device (13) and a first measurement image is recorded. The sample plate (2) is displaced in a second displacement direction relative to the detector device (15), illuminated by the second illumination device (14), and a second measurement image is recorded.