G02B21/0088

PHASE MODULATION DEVICE AND LASER MICROSCOPE
20170302498 · 2017-10-19 ·

The phase modulation device 3 includes a first phase modulation element 11 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of first electrodes in accordance with a first ratio of a second aberration component to a first aberration component of a wave front aberration generated by an optical system including an objective lens 4; a second phase modulation element 12 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of second electrodes in accordance with a second ratio of the second aberration component to the first aberration component; and a control circuit 13 which controls voltages applied to each of first electrodes and each of second electrodes in accordance with a distance from the objective lens to a light focusing position of the light flux.

SELECTIVE PLANE ILLUMINATION MICROSCOPY (SPIM) SYSTEMS AND METHODS

In one embodiment, a selective plane illumination microscopy system for capturing light emitted by an illuminated specimen includes a specimen stage having a top surface adapted to support a specimen holder and an opening adapted to provide access to a bottom of the holder, and a selective plane illumination microscopy optical system positioned beneath the stage, the optical system including an excitation objective, a detection objective, and an open-top, hollow prism that is adapted to contain a quid, wherein the prism is positioned within the opening of the stage and optical axes of the objectives are aligned with the prism such that the axes pass through the prism and intersect at a position near the top surface of the specimen stage.

LASER SCANNING MICROSCOPE
20170285315 · 2017-10-05 · ·

Provided is a laser scanning microscope including a stage on which a sample is placed, an objective lens that is disposed below the stage and that focuses laser light from a light source onto the sample, a scanner that scans the laser light focused by the objective lens over the sample, a condenser lens disposed opposite the objective lens with the stage interposed therebetween, and a light blocking cover that is disposed in an optical path between the condenser lens and the stage and that blocks external light entering the objective lens or the condenser lens from above the sample via the stage.

Upright and inverted microscope

A dual-configuration microscope is provided that may be converted into an upright or inverted microscope. The microscope includes a base and a body having a first portion and a second portion, wherein the body is rotatably coupled to the base. The microscope further includes an objective coupled to the first portion of the body, a condenser coupled to the second portion of the body and a stage positioned between the objective and the condenser. The microscope further includes a first and second knob configured to adjust the position of the objective, wherein the first knob is disposed proximal to the first portion of the body and the second knob is disposed proximal to the second portion of the body.

MICROSCOPE FOR EXAMINATION OF A SAMPLE AND CORRESPONDING METHOD OF OPERATING SUCH A MICROSCOPE
20220308329 · 2022-09-29 ·

A microscope for microscopic examination of a sample includes an illumination optics for illuminating the sample, an imaging optics for imaging the sample, a sample chamber for receiving the sample. The sample chamber has a door providing access into the sample chamber. The microscope further includes a first fan assembly arranged on a first side of the sample chamber for blowing atmosphere into the sample chamber or for draining atmosphere out of the sample chamber, through at least one first opening arranged on the first side in a first side wall of the sample chamber, and at least one second opening arranged on a second side in a second side wall of the sample chamber for allowing atmosphere from inside the sample chamber to exit the sample chamber or for allowing atmosphere from outside the sample chamber to enter the sample chamber.

DEVICE FOR OBSERVING A LIVING CELL OR A SET OF LIVING CELLS

The present invention relates to an imaging device for observing the development of a living cell or a set of living cells such as embryos, comprising a lighting system, means for relative displacement and an imaging system equipped with a wide-field camera which is adapted to allow the identification, the imaging and the observation of one or more living cells or sets of living cells to be observed. The invention also relates to a method for observing the development of embryos by means of such a device.

Infrared imaging microscope using tunable laser radiation

An imaging microscope (12) for generating an image of a sample (10) comprises a beam source (14) that emits a temporally coherent illumination beam (20), the illumination beam (20) including a plurality of rays that are directed at the sample (10); an image sensor (18) that converts an optical image into an array of electronic signals; and an imaging lens assembly (16) that receives rays from the beam source (14) that are transmitted through the sample (10) and forms an image on the image sensor (18). The imaging lens assembly (16) can further receive rays from the beam source (14) that are reflected off of the sample (10) and form a second image on the image sensor (18). The imaging lens assembly (16) receives the rays from the sample (10) and forms the image on the image sensor (18) without splitting and recombining the rays.

Microscopic imaging device, microscopic imaging method, and microscopic imaging program
09772483 · 2017-09-26 · ·

To provide a microscopic imaging device capable of easily switching the imaging method. During sectioning observation and normal observation, a measuring object is irradiated with pattern measurement light and uniform measurement light generated by a light modulation element, respectively. The measuring object is irradiated with the pattern measurement light and the uniform measurement light through a common light path. During the sectioning observation, a spatial phase of the pattern is sequentially moved on the measuring object by a predetermined amount by the light modulation element, and sectioning image data indicating an image of the measuring object is generated based on a plurality of pieces of image data generated at a plurality of phases of the pattern based on the light receiving signal. During the normal observation, normal image data indicating an image of the measuring object is generated based on the light receiving signal.

Microscope apparatus and objective lens unit
11249296 · 2022-02-15 · ·

A microscope apparatus includes a base, a support disposed upright on the base, and an objective lens unit supported by the support and including an objective lens holder that holds an objective lens. The objective lens unit includes a drive source that moves the objective lens holder up and down and a driver that transmits a drive force of the drive source to the objective lens holder.

Systems and methods for high frequency nanoscopy

Many embodiments provide a high frequency near-field probe based on a tapered waveguide combined with at least one optically-pumped high frequency radiation source and at least one optically-probed high frequency radiation detector.