G02B21/08

Laser scanning microscope
09823456 · 2017-11-21 · ·

In order to allow precise observation of a specimen at an observation point with a desired depth without changing the working distance of an objective optical system while employing a simple configuration, a laser scanning microscope according to the present invention includes an objective lens having a plurality of optical elements that are disposed with gaps therebetween in an optical-axis direction and that condense laser light emitted from a light source onto a specimen and also having an adjustment ring that allows changing of the focal point by moving the optical elements in the optical-axis direction; a scanner that has a galvanometer mirror capable of oscillating about a predetermined oscillation axis and that scans the laser light condensed onto the specimen by the objective lens in accordance with an oscillation angle of the galvanometer mirror; a light detecting unit that obtains image information of the specimen on the basis of return light returned from the specimen scanned with the laser light; and a scanner controlling unit that controls the oscillation angle of the galvanometer mirror so as to maintain an observation range of the specimen observed by the light detecting unit on the basis of the positions of the optical elements moved by the adjustment ring.

TESTING EQUIPMENT WITH MAGNIFYING FUNCTION

Embodiments disclose a device for testing biological specimen. The device includes a sample carrier and a detachable cover. The sample carrier includes a specimen holding area. The detachable cover is placed on top of the specimen holding area. The detachable cover includes a magnifying component configured to align with the specimen holding area. The focal length of the magnifying component is from 0.1 mm to 8.5 mm. The magnifying component has a linear magnification ratio of at least 1.

SYSTEMS AND METHODS FOR THREE-DIMENSIONAL FLUORESCENCE POLARIZATION VIA MULTIVIEW IMAGING

Systems and methods for three-dimensional fluorescence polarization excitation that generates maps of positions and orientation of fluorescent molecules in three or more dimensions are disclosed.

MICROSCOPE SYSTEM
20170329117 · 2017-11-16 · ·

Provided is a microscope system including: an optical fiber in which laser light emitted from a light-source apparatus propagates; a microscope that irradiates a specimen with the laser light propagated in the optical fiber and that obtains an image of the specimen; a mode-scrambling device portion that causes elastic waves to propagate in the optical fiber to form elastic wave interference fringes in the optical fiber; and a control device that controls the driving of the mode-scrambling device.

Microscopic imaging system and method

A microscopic imaging system and a microscopic imaging method. The system includes: an illumination module configured to generate a laser illumination, an LCOS device located in a Fourier plane of the laser illumination and configured to modulate a phase of the laser illumination, a 4-F system configured to adjust a size of a light beam of the laser illumination, an excitation lens group configured to generate a point illumination focused in a sample plane, a detecting lens group configured to capture an image of a PSF of the point illumination, a camera sensor, and a controller configured to synchronously control a change in a phase pattern of the LCOS device and an image capture of the camera sensor.

Microscopic imaging system and method

A microscopic imaging system and a microscopic imaging method. The system includes: an illumination module configured to generate a laser illumination, an LCOS device located in a Fourier plane of the laser illumination and configured to modulate a phase of the laser illumination, a 4-F system configured to adjust a size of a light beam of the laser illumination, an excitation lens group configured to generate a point illumination focused in a sample plane, a detecting lens group configured to capture an image of a PSF of the point illumination, a camera sensor, and a controller configured to synchronously control a change in a phase pattern of the LCOS device and an image capture of the camera sensor.

Mirror image microscopy for increased collection

Methods for imaging a sample using fluorescence microscopy, systems for imaging a sample using fluorescence microscopy, and illumination systems for fluorescence microscopes. In some examples, a method includes positioning a dual convex paraboloidal mirror enclosure around the sample. The dual convex paraboloidal mirror enclosure includes an upper paraboloidal mirror and a lower paraboloidal mirror oriented antiparallel to each other. An aperture is defined in the lower paraboloidal mirror, a hemispherical dome is mounted in the aperture, and the sample is surrounded by the hemispherical dome. The method includes directing excitation light onto the sample to form a primary image at an upper vertex of the upper paraboloidal mirror and a secondary image at a lower vertex of the lower paraboloidal minor. The method includes imaging the sample through a detection objective of a microscope.

Mirror image microscopy for increased collection

Methods for imaging a sample using fluorescence microscopy, systems for imaging a sample using fluorescence microscopy, and illumination systems for fluorescence microscopes. In some examples, a method includes positioning a dual convex paraboloidal mirror enclosure around the sample. The dual convex paraboloidal mirror enclosure includes an upper paraboloidal mirror and a lower paraboloidal mirror oriented antiparallel to each other. An aperture is defined in the lower paraboloidal mirror, a hemispherical dome is mounted in the aperture, and the sample is surrounded by the hemispherical dome. The method includes directing excitation light onto the sample to form a primary image at an upper vertex of the upper paraboloidal mirror and a secondary image at a lower vertex of the lower paraboloidal minor. The method includes imaging the sample through a detection objective of a microscope.

BRILLOUIN IMAGING DEVICES, AND SYSTEMS AND METHODS EMPLOYING SUCH DEVICES
20220349754 · 2022-11-03 ·

A Brillouin modality can be supplemented by an auxiliary modality, such as an optical imaging modality or a spectroscopy modality. In some embodiments, the auxiliary modality can be used to guide the Brillouin measurement to a desired region of interest, so that acquisition times for the Brillouin measurement can be reduced as compared to interrogating the entire sample. The auxiliary modality may have an acquisition speed faster than that of the Brillouin modality. In some embodiment, the auxiliary modality determines a composition of materials within a voxel in the sample interrogated by the Brillouin modality. Using the information provided by the auxiliary modality, the Brillouin signatures corresponding to the materials within the voxel can be unmixed, thereby providing a more accurate measurement of the sample.

Low numerical aperture exclusion imaging

In accordance with one embodiment of the present invention an apparatus for a low numerical aperture exclusion imaging apparatus is provided. The apparatus may include an electromagnetic illumination source for illuminating a portion of a specimen; and for collecting an image created by the electromagnetic radiation an objective lens optically coupled to the electromagnetic illuminated portion of the specimen. The apparatus also includes an optical blocking plate disposed between the objective lens and a focusing lens. The optical blocking plate is positioned to substantially block undesired electromagnetic radiation from image sources distally aligned in the same optical axis as the specimen. This invention is enhances narrow depth of field characteristics in imaging. It also enhances discreet imaging in a narrow focus field by eliminating some or most of the light which contributes to wide depth of field focus. This is useful for optical sectioning ranging from microscopy to photography. Optical sectioning provides the information necessary for 3D image reconstructions and other X Axis spatial measurements.