The object of the invention relates to an objective changing and focussing apparatus (10) for microscopes (100) containing a plurality of objectives (12), and having an optical axis Z, the essence of which is that it contains—a first rail system (16a) having a first guide rail (17a) fixed to the microscope (100) and a first moving member (18a) guided by the first guide rail (17a), wherein the first rail system (16a) is arranged along an axis X perpendicular to the optical axis Z, —a first drive unit (20a) in drive connection with the first rail system (16a), —a plurality of objective interface elements (24), adapted for being connected to the objectives (12), arranged next to one another along the X axis and fixed to the first moving member (18a) movably along the Z axis, —a second rail system (16b) having a second guide rail (17b) fixed to the microscope (100) and a second moving member (18b) guided by the second guide rail (17b), wherein the second rail system (16b) is arranged parallel to the optical axis Z, and defines a starting position along the X axis, and—a second drive unit (20b) having a second drive connection with the second rail system (16b), and the second moving member (18b) is provided with a lifting element (26) providing a releasable connection with an objective interface (24) located in the starting position. The object of the invention also relates to a microscope containing such an objective changing and focusing apparatus (10).

Provided is a medical observation apparatus including: a columnar microscope unit configured to image a minute part of an object to be observed with magnification and thereby output an imaging signal; and a support unit including a first joint unit holding the microscope unit in a rotationally movable manner around a first axis parallel to a height direction of the microscope unit, a first arm unit holding the first joint unit and extending in a direction different from the height direction of the microscope unit, a second joint unit holding the first arm unit in a rotationally movable manner around a second axis orthogonal to the first axis, and a second arm unit holding the second joint unit. In a plane passing through the first and second axes, a cross section of the microscope unit, the first and second joint units, and the first and second arm units is included in a circle that has a center at a focus position of the microscope unit and passes through an end point of the first joint unit that is at the maximum distance from the focus position. Thus, when imaging an object to be observed and displaying the image, the user's visual field for observing the displayed image can be sufficiently ensured.

Regarding a microscope system, a technique capable of suitably achieving a focusing on a surface of a sample is provided. The microscope system includes an irradiation optical system (laser light source 101 or the like) that irradiates a surface of a sample 3 on a stage 104 with light from an oblique direction, an observation optical system (camera 112 or the like) that forms an image of scattered light from the surface of the sample 3, a focus mechanism (piezo stage 106 or the like) that changes a height position of focus with respect to the surface of the sample 3, and a computer system 100 that acquires an image from the observation optical system. Regarding the sample 3, the computer system acquires a first image in a first focus state and a second image in a second focus state, in which the first image and the second image have different focus heights, calculates an amount of change between a position of a first spot pattern in the first image and a position of a second spot pattern in the second image, calculates an amount of change in height of the sample 3 based on an incident angle in the oblique direction and the amount of change in position of spot pattern, and adjusts the height position of the focus by using the amount of change in sample height so as to focus on the surface of the sample 3.

A method for operating an imaging system of a machine vision inspection system to provide an extended depth of field (EDOF) image. The method comprises (a) placing a workpiece in a field of view; (b) periodically modulating a focus position of the imaging system without macroscopically adjusting the spacing between elements in the imaging system, the focus position is periodically modulated over a plurality of positions along a focus axis direction in a focus range including a workpiece surface height; (c) exposing a first preliminary image during an image integration time while modulating the focus position in the focus range; and (d) processing the first preliminary image to remove blurred image contributions occurring in the focus range during the image integration time to provide an EDOF image that is focused throughout a larger depth of field than the imaging system provides at a single focal position.

In a microscope which can incline an imaging section, a height position of an observation target is automatically matched to a eucentric position. The microscope includes: a placement stage on which an observation target is placed; a lower stage lifting section that vertically movably supports the placement stage; a first driving mechanism that drives the lower stage lifting section; an imaging section that captures an image of the observation target; and an upper stage lifting section that vertically movably supports a fitting member along an optical axis and is swingable about a swinging axis orthogonal to the optical axis, wherein the first driving mechanism can drive the lower stage lifting section such that the surface of the observation target placed on the placement stage is matched to a focal position of imaging unit, or a height position of the swinging axis.

A method of image-based analysis of multiple samples includes using a sample holder having multiple locations of interest and multiple focal structures that are each associated, one or more, with the multiple locations of interest, wherein the multiple samples are dispersed across the multiple locations of interest and obtaining image areas of the multiple locations of interest. Multiple digital image areas are thus obtained for use in an analysis of the multiple samples with each of the image areas including at least one of the locations of interest and at least one of the focal structures. An image processing algorithm is used to analyse each of the digital image areas and check if the focal structure indicates that the image area is in clear focus. An indication is provided and/or remedial action is taken if the image processing algorithm indicates that any digital image areas are out of focus.

The disclosure features methods and systems that include positioning a surface of a coverslip overlying a sample relative to an object plane of a microscope system, projecting a two-dimensional pattern of light onto the surface, where a focal plane of the two-dimensional pattern at a position of the surface is rotated by an angle β relative to the object plane, obtaining a two-dimensional image of the pattern of light reflected from the surface using a detector that includes an imaging sensor oriented perpendicular to a direction of propagation of the reflected pattern of light at the sensor, analyzing the image to determine a line of best focus of the pattern within the image, determining an offset of the line of best focus from an expected position of the line of best focus within the image, and determining a position adjustment of the surface based on the offset.

An optical system includes a scanning unit, a first lens-element group including at least a first lens element, and a focusing unit which is designed to focus beams onto a focus, wherein the focusing unit includes a second lens-element group including at least a second lens element and an imaging lens. The imaging lens further includes a pupil plane and a wavefront manipulator. The wavefront manipulator is arranged in the pupil plane of the imaging lens or in a plane that is conjugate to the pupil plane, or the scanning unit of the optical system is arranged in a plane that is conjugate to the pupil plane and the wavefront manipulator is arranged upstream of the scanning unit in the light direction. The focus of the second lens-element group lies in the pupil plane of the imaging lens in all focal positions of the focusing unit.

A digital microscope having a pivoting stand, a method for calibrating said stand and a method for automatic focus tracking and image center tracking upon actuation of the pivoting stand. The pivoting stand includes an angle sensor for determining a current pivot angle of the pivot arm (07). The current pivot angle is processed in the control unit to execute automatic focus tracking and/or center tracking upon actuation of the pivot arm (07). Calibration is performed using two pivot angles, wherein deviating focus and image center positions are ascertained, and a pivot-angle-dependent function for focus and the image center position is ascertained therefrom.

In one aspect, the present disclosure provides a system for Fourier ptychographic microscopy, the system comprising (i) an image capture apparatus including an objective lens, (ii) at least one processor, and (iii) data storage including program instructions stored thereon that when executed by the at least one processor, cause the system to: (a) capture, via the image capture apparatus, a plurality of initial images of an object, wherein each of the plurality of initial images of the object have a first resolution, and (b) process each of the plurality of initial images in Fourier space to generate a final image of the object having a second resolution, wherein the second resolution is greater than the first resolution.