A microscope apparatus includes a base, a support disposed upright on the base, and an objective lens unit supported by the support and including an objective lens holder that holds an objective lens. The objective lens unit includes a drive source that moves the objective lens holder up and down and a driver that transmits a drive force of the drive source to the objective lens holder.

The invention relates to a eucentric digital microscope (10) that encompasses a stationary stand body (12) and a pivot unit (14) mounted pivotably on the stand body (12), the pivot unit (14) being mounted rotatably around a rotation axis (26) extending in a Y direction. The pivot unit (14) encompasses at least an optical system having an optical axis (15) extending orthogonally to the rotation axis (26), and a focal plane (92), the pivot unit (14) being arranged nondisplaceably at least in an X direction and in a Z direction relative to the rotation axis (26).

A microscope is provided. The microscope includes a lens system comprising a lens unit, which is adjustable along an optical axis of the lens system to correct an imaging error. The microscope further includes a motor-actuatable adjustment device, which is configured to adjust the lens unit along the optical axis. The microscope also includes a processor and a scanning unit, which is configured to deflect a light beam used for the image recording. The processor is configured to compare a position of an image which has been recorded after a correction adjustment of the lens unit to reference data, detect a change of the position of the image due to the correction adjustment of the lens unit based on the comparison, and activate the scanning unit in such a way that the change of the position of the image is at least partially compensated for.

Changing device for optical components in a microscope, comprising an optical component (12) having a flat surface (13), a carrier (1) for inserting and/or holding the optical component (12), and a receptacle (26) for holding the carrier (1) in an optical path of the microscope, characterized in that the carrier (1) has bearing surfaces (8) for the flat surface (13) of the optical component (1) and positioning surfaces (10) located in the same plane, which are not covered by the optical component (12), when inserting the latter, and the receptacle (26) has bearing surfaces (28) for contact with the positioning surfaces (10), and first attachment means (11) for attaching the carrier (1) positioned on the receptacle (26) in order for the positioning surfaces (10) to act upon the bearing surfaces (28).

An objective-changer apparatus for a microscope system comprising an objective-transfer element with at least one objective holder for holding an objective that has been provided with an adapter, wherein the objective-transfer element moves a selected active objective into position in a transfer position in controlled fashion and an objective axis of the active objective does not coincide with the optical axis of the microscope system in the transfer position. A receiving apparatus is adjustable in the direction of the optical axis of the microscope system and can be brought into contact with the adapter. The receiving apparatus transports the active objective along a transport path in a transport direction orthogonal to the microscope system's optical axis between the transfer position and a work position in line with the microscope system's optical axis. The transport path is shorter than the extent of the objective holder in the transport direction.

An example methodology implementing the disclosed techniques includes receiving a plurality of measured semiconductor properties of one or more partially completed semiconductor devices, determining a measure of short circuit current density (J.sub.SC) of each of the one or more partially completed semiconductor devices, the J.sub.SC, measure based on a measure of semiconductor diffusion length (L.sub.D) and a measure of thickness, and determining a current voltage relationship of each of the one or more partially completed semiconductor devices. The method also includes calculating a current voltage (JV) curve based on the J.sub.SC, measure and the current voltage relationship of each of the one or more partially completed semiconductor devices, wherein the JV curve provides an indication of maximum achievable power point (P.sub.max) and open circuit voltage (V.sub.oc) of a semiconductor device completed from the one or more partially completed semiconductor devices, and determining a predicted performance characteristic of the semiconductor device.

An objective lens switching device includes a prismatic cuvette perpendicular to a plane parallel to a direction of detection and a lighting direction, which are mutually perpendicular. The cross-section of the prism is a polygon with more than four sides with pairs of mutually perpendicular faces. At least several pairs of faces include one face designed to receive a planar light beam in the lighting direction and one face with a coupled lens or objective lens to detect fluorescent light in the direction of detection. The cuvette can rotate about an axis perpendicular to said plane, allowing a specific objective lens to be oriented in the direction of detection.

A digital microscope system comprises an imaging device configured to generate digital image data representing a target region of an object, the target region being determined by a changeable setting of the imaging device; and a controller configured to generate monitor image data corresponding to the digital image data generated in accordance with the setting, the monitor image data being configured to be displayed as a monitor image; wherein the controller is further configured to change the setting in response to a user input; and wherein the controller is further configured to compensate for a delay in updating the monitor image data in accordance with the changed setting by storing the digital image data generated in accordance with the unchanged setting in response to the user input and generating simulation monitor image data by performing digital image processing on the stored digital image data taking into account the changed setting, the simulation monitor image data being configured to be displayed as a simulation monitor image during the delay.

A microscope comprising a first turret bearing a plurality of lenses and a second turret bearing a plurality of filtering modules, the first turret and the second turret being borne on the same pivot and mounted to rotate, independently of each other, about this pivot, each lens of the first turret and each filtering module of the second turret being able to be arranged by rotation of the first turret and of the second turret into an active position of use in which a filtering module of the second turret is inserted into the optical path between a lens of the first turret and a detector.

The invention relates to the domain of microscope based imaging. The invention provides methods and apparatuses for providing improved microscope based digital imaging solutions that are capable of providing high quality images with a high level of image detail. The invention additionally provides solutions for artificial intelligence based controlling of a digital microscope's imaging functions to enable bright field/dark field imaging functionality to be combined with spectroscopic functions to obtain higher detail and more meaningful information about a specimen sample.