A method of automated measurement of motility and morphology parameters of the same single motile sperm. Automated motility and morphology measurements of the same single sperm are performed under different microscope magnifications. The same single motile sperm is automatically positioned and kept inside microscope field of view and in focus after magnification switch. A method of automated non-invasive measurement of sperm morphology parameters under high magnification of imaging. Sperm morphology parameters including subcellular structures are automatically measured without invasive sample staining. A method of automatically selecting sperms with normal motility and morphology and DNA integrity for infertility treatment.

A method of automated measurement of motility and morphology parameters of the same single motile sperm. Automated motility and morphology measurements of the same single sperm are performed under different microscope magnifications. The same single motile sperm is automatically positioned and kept inside microscope field of view and in focus after magnification switch. A method of automated non-invasive measurement of sperm morphology parameters under high magnification of imaging. Sperm morphology parameters including subcellular structures are automatically measured without invasive sample staining. A method of automatically selecting sperms with normal motility and morphology and DNA integrity for infertility treatment.

A device for mounting an object holder on a carrier that can be inserted into a cryostat includes at least one clamping element may be provided for non-positive connection of the object holder with the carrier. The at least one clamping element is arranged to enable damage-free mounting of the object holder on the carrier even in the case of large temperature changes, so that reproducible measuring conditions are created at large temperature changes. The at least one clamping element may be drive-connected via a lever to a piezoelectric element, which may be subjected to voltage by a control device as a function of temperature and of a bearing specification and is supported against the object holder or the carrier.

A device for mounting an object holder on a carrier that can be inserted into a cryostat includes at least one clamping element may be provided for non-positive connection of the object holder with the carrier. The at least one clamping element is arranged to enable damage-free mounting of the object holder on the carrier even in the case of large temperature changes, so that reproducible measuring conditions are created at large temperature changes. The at least one clamping element may be drive-connected via a lever to a piezoelectric element, which may be subjected to voltage by a control device as a function of temperature and of a bearing specification and is supported against the object holder or the carrier.

The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (δ) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

The present invention initially relates to a method for generating an image of a sample, said image being pieced together from a plurality of individual microscope images. A microscope is provided, for which a measurement value of a twist angle (δ) present between an image recording unit of the microscope and an object stage of the microscope and a measurement accuracy of this measurement value are known. There is a recording of a first individual microscope image of the sample using the microscope and a displacement of the image recording unit and the sample-supporting object stage relative to one another, whereupon a second individual microscope image (02) of the sample is recorded using the microscope. A search region is determined in the second or first individual microscope image, an overlap region between the individual microscope images being expected in said search region.

Diffraction-based imaging systems are described. Aspects of the technology relate to imaging systems having one or more sensors inclined at angles with respect to a sample plane. In some cases, multiple sensors may be used that are, or are not, inclined at angles. The imaging systems may have no optical lenses and are capable of reconstructing microscopic images of large sample areas from diffraction patterns recorded by the one or more sensors. Some embodiments may reduce mechanical complexity of a diffraction-based imaging system. A diffractive imaging system comprises a light source, a sample support configured to hold a sample along a first plane, and a first sensor comprising a plurality of pixels disposed in a second plane that is tilted at an inclined angle relative to the first plane. The first sensor is arranged to record diffraction images of the light source from the sample.

Diffraction-based imaging systems are described. Aspects of the technology relate to imaging systems having one or more sensors inclined at angles with respect to a sample plane. In some cases, multiple sensors may be used that are, or are not, inclined at angles. The imaging systems may have no optical lenses and are capable of reconstructing microscopic images of large sample areas from diffraction patterns recorded by the one or more sensors. Some embodiments may reduce mechanical complexity of a diffraction-based imaging system. A diffractive imaging system comprises a light source, a sample support configured to hold a sample along a first plane, and a first sensor comprising a plurality of pixels disposed in a second plane that is tilted at an inclined angle relative to the first plane. The first sensor is arranged to record diffraction images of the light source from the sample.

A method of providing an assembled image using a digital microscope, the digital microscope having an optical system, an image sensor having a predefined number of image pixels, and a stage, the stage being movable in relation to the optical system and the image sensor, includes receiving a user selection regarding an area of interest of the sample, the user selection indicating the position and extension of the area of interest, selecting one of a full resolution mode or and a reduced resolution mode, wherein individual images with a reduced number of image pixels are generated, moving the stage with respect to the optical system and the image sensor, and generating individual images of the area of interest in accordance with the selected one of the full resolution mode or the reduced resolution mode, and combining the individual images into the assembled image, representing the area of interest.

A method of providing an assembled image using a digital microscope, the digital microscope having an optical system, an image sensor having a predefined number of image pixels, and a stage, the stage being movable in relation to the optical system and the image sensor, includes receiving a user selection regarding an area of interest of the sample, the user selection indicating the position and extension of the area of interest, selecting one of a full resolution mode or and a reduced resolution mode, wherein individual images with a reduced number of image pixels are generated, moving the stage with respect to the optical system and the image sensor, and generating individual images of the area of interest in accordance with the selected one of the full resolution mode or the reduced resolution mode, and combining the individual images into the assembled image, representing the area of interest.