The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

A microscopy imaging system and methods for improving an assaying of a sample is disclosed.

A microscopy imaging system and methods for improving an assaying of a sample is disclosed.

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting device is arranged inside the sample chamber facing the sample carrier.

A microscope includes: a sample chamber; a microscope stage arranged below the sample chamber for having a sample carrier arranged thereon; a pipetting device for pipetting the sample carrier; and a moving mechanism for moving the pipetting device between a non-operating position in which the pipetting device is arranged outside the sample chamber sample carrier and an operating position in which the pipetting device is arranged inside the sample chamber facing the sample carrier.

An observation device includes an illumination optical system provided on a lower side of an installation position of a multi-well plate, a reflector that reflects light emitted from the illumination optical system, the reflector being provided on an upper side of the installation position, and an observation optical system that condenses the light reflected by the reflector, the observation optical system being provided on the lower side of the installation position. The reflector includes a plurality of curved surfaces where the light emitted from the illumination optical system enters. Each of the plurality of curved surfaces corresponds to one or more wells included in the multi-well plate, has positive power in a first direction in which the illumination optical system and the observation optical system are aligned, and has a center of curvature at a position deviating from a central axis of a well of the multi-well plate.

An observation device includes an illumination optical system provided on a lower side of an installation position of a multi-well plate, a reflector that reflects light emitted from the illumination optical system, the reflector being provided on an upper side of the installation position, and an observation optical system that condenses the light reflected by the reflector, the observation optical system being provided on the lower side of the installation position. The reflector includes a plurality of curved surfaces where the light emitted from the illumination optical system enters. Each of the plurality of curved surfaces corresponds to one or more wells included in the multi-well plate, has positive power in a first direction in which the illumination optical system and the observation optical system are aligned, and has a center of curvature at a position deviating from a central axis of a well of the multi-well plate.

An adapter which controls rotation of a microscope on which a slide is placed and an imaging unit and which easily performs correction of a rotation shift is provided. The adapter includes a first connection member connected to a microscope, a second connection member connected to an imaging unit, a rotation member arranged between the first and second connection members and configured to rotate the second connection member relative to the first connection member using optical axes of the microscope and the imaging unit at a center, a control member configured to be fixed on one of the first and second connection members and control the rotation of the connection member, and a driving member configured to be engaged with the first connection member or the second connection member and change a position of the second connection member relative to the first connection member around the optical axes.

Implementations of the disclosure are directed to predicting structured illumination parameters for a particular point in time, space, and/or temperature using estimates of structured illumination parameters obtained from structured illumination images captured by a structured illumination system. Particular implementations are directed to predicting structured illumination frequency, phase, orientation, and/or modulation order parameters.