Implementations of the disclosure are directed to predicting structured illumination parameters for a particular point in time, space, and/or temperature using estimates of structured illumination parameters obtained from structured illumination images captured by a structured illumination system. Particular implementations are directed to predicting structured illumination frequency, phase, orientation, and/or modulation order parameters.

An embodiment of a microscope system is described that comprises a sample stage configured to position a sample; and a spectrometer comprising an interferometer configure to provide a light beam to the sample stage and one or more detectors configured to detect light spectra in response to the light beam, wherein the spectrometer sends a notification to the sample stage after a scan comprising an acceptable measure of quality has been acquired from the detected light spectra at a first location, and the sample stage is further configured to count the notifications and initiate movement of the sample stage to a second location when a count value reaches a pre-determined number.

A kit (10) includes a light source (12) and an optical system (14) equipped with a lens assembly (25) defining a magnification optical axis (X-X). A frame (16) is crossable by the light generated by the light source (12). The frame (16) is configured for supporting a sample holder (H), a portable electronic apparatus (S) equipped with an image acquisition device (C), and the optical system (14), which are interposable between the sample holder (H) and the image acquisition device (C). The optical system (14) is configured for being movable in a guided manner on the frame (16), to allow aligning the optical axis (X-X) with the image acquisition device (C). A carrying body (18) is configured for receiving in abutment the frame (16) and housing the light source (12) directing light towards the optical system (14) through the frame (16).

A kit (10) includes a light source (12) and an optical system (14) equipped with a lens assembly (25) defining a magnification optical axis (X-X). A frame (16) is crossable by the light generated by the light source (12). The frame (16) is configured for supporting a sample holder (H), a portable electronic apparatus (S) equipped with an image acquisition device (C), and the optical system (14), which are interposable between the sample holder (H) and the image acquisition device (C). The optical system (14) is configured for being movable in a guided manner on the frame (16), to allow aligning the optical axis (X-X) with the image acquisition device (C). A carrying body (18) is configured for receiving in abutment the frame (16) and housing the light source (12) directing light towards the optical system (14) through the frame (16).

A sample attachment device includes a mount, a mounted depression, and a pressure release depression. Liquid and air bubbles can pass the pressure release depression. The mounted depression is on the mount. A cartridge is mounted on the mounted depression. The pressure release depression is in the mounted depression. The pressure release depression is vertically under the cartridge when the cartridge is mounted on the mounted depression.

The present invention relates to an observation holder, including an accommodation unit configured to accommodate an observation target, and an observation unit formed below the accommodation unit, wherein an observation target accommodated in the accommodation unit can be observed from below, the accommodation unit includes an accommodation unit main body in which a plurality of holes for accommodating an observation target are formed, and an accommodation unit upper portion formed on an upper portion of the accommodation unit main body, the accommodation unit upper portion includes a wall surrounding a space above the accommodation unit main body, as a storage for storing a predetermined liquid, and two adjacent holes of the plurality of holes are connected in the observation unit.

A microscopy system comprises a microscope for analyzing a sample, a computing device for processing measurement signals and at least one microphone for capturing sounds. The computing device is configured to evaluate captured sounds in order to identify a microscope activity in progress or command an intervention in the microscope activity in progress or identify ambient sounds based on microscope sounds.

A microscopy system comprises a microscope for analyzing a sample, a computing device for processing measurement signals and at least one microphone for capturing sounds. The computing device is configured to evaluate captured sounds in order to identify a microscope activity in progress or command an intervention in the microscope activity in progress or identify ambient sounds based on microscope sounds.

An observation device includes: a macro observation system; and a micro observation system. The macro observation system and the micro observation system are arranged so as to satisfy a first condition. The first condition is that a distance from a macro optical axis to a micro optical axis is equal to or less than a square root of a sum of squares of a first distance and a second distance. The first distance is a distance between the macro optical axis and a central axis of an outer diameter of the nosepiece. The second distance is a distance in a first direction between the central axis of the outer diameter and a side surface of the nosepiece. The first direction is a direction orthogonal to the macro optical axis and orthogonal to a line segment connecting the macro optical axis and the central axis of the outer diameter.

An observation device includes: a macro observation system; and a micro observation system. The macro observation system and the micro observation system are arranged so as to satisfy a first condition. The first condition is that a distance from a macro optical axis to a micro optical axis is equal to or less than a square root of a sum of squares of a first distance and a second distance. The first distance is a distance between the macro optical axis and a central axis of an outer diameter of the nosepiece. The second distance is a distance in a first direction between the central axis of the outer diameter and a side surface of the nosepiece. The first direction is a direction orthogonal to the macro optical axis and orthogonal to a line segment connecting the macro optical axis and the central axis of the outer diameter.