The invention relates to a microscope for microscopic examination of a sample comprising a microscope housing enclosing an illumination optics, a microscope stage and an imaging optics, an integrated sample chamber located within the microscope housing and formed by a separated housing section within said microscope housing, the housing section comprising a lid providing direct access to the microscope stage for placing the sample in the sample chamber, wherein said housing section comprises an interface for connection of an external incubation environment conditioning unit to the sample chamber, the interface being configured to provide a connection between said external incubation environment conditioning unit and the sample chamber, such that the environmental conditions in the sample chamber can be controlled when the external incubation environment conditioning unit is connected to the interface.

The present disclosure relates to a system and technique for a system for detecting fluorescing particles on a target comprising a viewing device configured to view the target and a light subsystem configured to illuminate the target, wherein the target includes a fluorescing particle that effectuates the fluorescent feedback second wavelength. In one example, no additional fluorescing agent or additive, other than the fluorescing particle, is added to the target. A passive cooling subsystem is configured to prevent overheating of the system without expending additional energy resources. The system includes a filter in operative communication with the viewing device having a selected filter wavelength configured to allow light to pass that is greater than the first wavelength and at least one non-transitory computer readable storage medium having instructions encoded thereon.

A module (104) for a microscope stand (100) comprises a control device (118) with at least one computer hardware component (120, 122) being configured to control the microscope stand (100). The module (104) further comprises a locating device (164) configured to interact with another locating device (162) formed in a housing (102) of the microscope stand (100) for mounting the module (104) at a predetermined installation site within the housing (102).

The invention relates to a method for operating a particle beam apparatus and/or a light microscope, to a computer program product and to a particle beam apparatus and a light microscope, by means of which this method is able to be carried out. The method includes a change in a first temperature of an object, wherein the object is arranged on an object receiving device rendered movable by a motor operated by a supply current. Changing the first temperature of the object alters a second temperature of the object receiving device from a first temperature value to a second temperature value. Further, the method includes changing the supply current of the motor from a first current value to a second current value, wherein the supply current is designed to hold the object receiving device in position, and changing a temperature of the object receiving device from the second temperature value to a third temperature value on account of heat generated by the motor, which is obtained by the second current value of the supply current and fed to the object receiving device. TOT1−15° C.≤TOT3≤TOT1+15° C. applies, where TOT1 is the first temperature value of the object receiving device and where TOT3 is the third temperature value of the object receiving device.

The invention relates to a method for operating a particle beam apparatus and/or a light microscope, to a computer program product and to a particle beam apparatus and a light microscope, by means of which this method is able to be carried out. The method includes a change in a first temperature of an object, wherein the object is arranged on an object receiving device rendered movable by a motor operated by a supply current. Changing the first temperature of the object alters a second temperature of the object receiving device from a first temperature value to a second temperature value. Further, the method includes changing the supply current of the motor from a first current value to a second current value, wherein the supply current is designed to hold the object receiving device in position, and changing a temperature of the object receiving device from the second temperature value to a third temperature value on account of heat generated by the motor, which is obtained by the second current value of the supply current and fed to the object receiving device. TOT1−15° C.≤TOT3≤TOT1+15° C. applies, where TOT1 is the first temperature value of the object receiving device and where TOT3 is the third temperature value of the object receiving device.

Cryogenic analysis systems are provided that can include: at least one sample stage operatively aligned with at least one cooling source; at least one thermal link operationally coupled between the sample stage and the cooling source; and at least one link support between the cooling source and the sample stage, the link support engaging the thermal link. Methods for cooling a sample within a cryogenic analysis system are provided with at least some of the methods including: thermally connecting a cooling source to a sample stage supporting a sample via a thermal link; and supporting the thermal link between the cooling source and the sample stage.

Cryogenic analysis systems are provided that can include: at least one sample stage operatively aligned with at least one cooling source; at least one thermal link operationally coupled between the sample stage and the cooling source; and at least one link support between the cooling source and the sample stage, the link support engaging the thermal link. Methods for cooling a sample within a cryogenic analysis system are provided with at least some of the methods including: thermally connecting a cooling source to a sample stage supporting a sample via a thermal link; and supporting the thermal link between the cooling source and the sample stage.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.

A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.