A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify a map region corresponding to a map image constructed by stitching together a plurality of second images acquired by the microscope at a higher magnification than the first magnification by performing object detection according to the type of the container on a first image that includes the container acquired by the microscope at the first magnification, and cause a display unit to display the first image and a range of the map region on the first image.

The present invention relates to digital pathology. In order to provide an improved handling of probes in digital pathology, a slide-holder (10) for digital pathology is provided that comprises a tray basis (12), a plurality of mounting means (14) and a plurality of slide-holder registration points (16). The tray basis is configured to carry a plurality of slides (20) to be imaged by a digital pathology system, for which the tray basis provides a plurality of slide-receiving positions. The plurality of mounting means are arranged on the tray basis to mount the plurality of slides on the tray basis in a plurality of slide-receiving positions to image each slide in a separate imaging position. The slide-holder registration points comprise a plurality of interacting portions (22) that provide a mechanical registration of the tray basis with a digital pathology system for each of the imaging positions.

A method of measuring optical properties of a specimen, for example, a uniaxial specimen, includes generating a plurality of illumination patterns incident on the specimen and, for each of the plurality of illumination patterns, collecting sample light passing through the specimen and detecting the collected sample light using a polarization state analyzer to form a set of polarization channels. The method also includes receiving a calibration tensor, converting the set of polarization channels for each of the illumination patterns into Stokes parameter maps using the calibration tensor, and deconvolving the Stokes parameter maps to provide volumetric measurement of permittivity tensor of the specimen, specifically, absorption, optical path length, optical anisotropy, and 3D orientation of the specimen.

A system includes: a light source; first and second gratings; and at least one reflective component that in a first position forms a first light path originating at the light source and extending to the first grating and thereafter to a subsequent component in the system, and that in a second position forms a second light path originating at the light source and extending to the second grating and thereafter to the subsequent component.

A method for evaluating measurement data from a light field microscope, and an apparatus for light field microscopy wherein the following steps are carried out: a) at least one sample position to be analyzed is selected in a sample; b) images of the sample, which each contain a set of partial images, are recorded at a sequence of recording times using a light field microscope; c) the positions corresponding to the selected sample positions are determined in the partial images of the images recorded in step b); d) the image signals are extracted from at least some of the partial images at the positions determined in partial step c); e) an integrated signal is obtained for a certain recording time by virtue of the image signals extracted for a certain position from partial images of this recording time in step d) being integrated to form the integrated signal; and f) a time profile of the integrated signal is obtained by virtue of step e) being carried out for a plurality of recording times.

Resolution of images used in processes such as sequencing by synthesis may be increased by structuring sites that would emit signals in the images to have different elevations. Differences in focus caused by these differences in elevation may be used to filter out background illumination, thereby providing an image in which in focus sites may be resolved even though the separation between any site and its nearest neighbor may be below the diffraction limit of the light that would be emitted.

A system can be used for imaging volumetric samples using a camera array to capture images under different illumination patterns at different axial planes of focus, and at optionally varying lateral fields of view. The sequence of images taken under the different illumination patterns and optional varying lateral fields of view can be processed to generate an image representation of the sample at a focus plane of the sample. Multiple image representations at different focus planes are assembled to form a 3D volumetric representation of the sample.

A super-resolution microscope avoids the need for complex phase plate optics normally used to produce a doughnut-shaped depletion beam by employing low-intensity regions of common diffraction patterns such as an Airy disk.

Among other things, a diluted sample is generated based on mixing a small sample of blood with a one or more diluents. A thin film of the diluted sample is formed on the surface of a contact optical microscopy sensor. Red blood cells within a portion of the thin film of the diluted sample are illuminated using light of a predetermined wavelength. One or more images of the diluted sample are acquired based on illuminating the red blood cells within the portion of the thin film of the diluted sample. The acquired one or more images of the diluted sample are then processed. The mean corpuscular hemoglobin in the red blood cells within the portion of the thin film of the diluted sample is determined based on processing the acquired images of the diluted sample.

A method and system for measuring the alignment between a substrate and a platform upon which it is disposed by using image processing algorithms are described herein. These algorithms automate the detection of edges of a microscope slide and the platform in a digital image. A reference line pattern in an image of the platform can be used to detect platform edges based on a computed location of the reference line pattern in the image.