A laser sensor system including a common optical bench that is configured to receive and process different beams of a high energy laser (HEL). The common optical bench is configured to handle the different beams using a modular set of optical components. Optical components of the common optical bench include a filtering device configured to reduce the power of the beams, a common collecting optical element that is configured to set an imaging position and focal length for the beams, a position sensitive detector (PSD) arrangement that is configured to measure angular and positional errors in the beams, and various compaction optical elements, such as mirrors, that are configured to enable compaction of the laser sensor system by increasing the focal length of the beams.

Apparatus and techniques for laser-processing workpieces can be improved, and new functionalities can be provided. Some embodiments discussed relate to use of beam characterization tools to facilitate adaptive processing, process control and other desirable features. Other embodiments relate to laser power sensors incorporating integrating spheres. Still other embodiments relate to workpiece handling systems capable of simultaneously providing different workpieces to a common laser-processing apparatus. A great number of other embodiments and arrangements are also detailed.

Provided are an imaging apparatus and a mobile imaging apparatus capable of reducing the size and weight of a structure relating to focus adjustment. The imaging apparatus 1 includes: a central optical system 12 that captures an image with pan focus; an annular optical system 14 that is disposed concentrically with the central optical system 12; and an image sensor 20 that simultaneously captures an image to be formed through the central optical system and an image to be formed through the annular optical system 14. In the imaging apparatus 1, the central optical system 12 and the image sensor 20 are moved integrally along the optical axis L so as to adjust a focal point of the annular optical system 14.

A light source device includes: a fluorescent rod that contains a fluorescent substance; at least one light-guide element including a first end face, a second end face having a smaller area than that of the first end face, and a side surface portion that reflects incident light from the first end face to condense on the second end face, the second end face being optically joined to a surface of the fluorescent rod except for the emission surface; a plurality of excitation light sources arranged to face the first end face of the light-guide element; and a dichroic film provided on the surface of the fluorescent rod expect for the emission surface and having the properties of transmitting excitation light and reflecting fluorescent light.

The image display apparatus includes a light attenuation section that reflects a portion of light emitted from a light source and a scanning section that scans the light reflected by the light attenuation section. The light attenuation section transmits a portion of light emitted from the light source. The light attenuation section has reflectance and transmittance and the reflectance is smaller than the transmittance. The image display apparatus further includes a light receiving element on which the light transmitted through the light attenuation section is incident. The image display apparatus also includes a control section that controls activation of the light source in accordance with detection results of the light receiving element.

An illumination device includes: laser light sources having different radiant fluxes; and diffractive optical elements provided correspondingly to the respective laser light sources. A planar dimension of the diffractive optical element, which corresponds to the laser light source that emits a laser light having a minimum radiant flux, is smaller than a planar dimension of the diffractive optical element, which corresponds to the laser light source that emits a laser light having a maximum radiant flux.

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.

A laser sensor system including a common optical bench that is configured to receive and process different beams of a high energy laser (HEL). The common optical bench is configured to handle the different beams using a modular set of optical components. Optical components of the common optical bench include a filtering device configured to reduce the power of the beams, a common collecting optical element that is configured to set an imaging position and focal length for the beams, a position sensitive detector (PSD) arrangement that is configured to measure angular and positional errors in the beams, and various compaction optical elements, such as mirrors, that are configured to enable compaction of the laser sensor system by increasing the focal length of the beams.

An ophthalmic laser system uses a non-confocal configuration to determine a laser beam focus position relative to the patient interface (PI) surface. The system includes a light intensity detector with no confocal lens or pinhole between the detector and the objective lens. When the objective focuses the light to a target focus point inside the PI lens at a particular offset from its distal surface, the light signal at the detector peaks. The offset value is determined by fixed system parameters, and can also be empirically determined by directly measuring the PI lens surface by observing the effect of plasma formation at the glass surface. During ophthalmic procedures, the laser focus is first scanned insider the PI lens, and the target focus point location is determined from the peak of the detector signal. The known offset value is then added to obtain the location of the PI lens surface.

An additive manufacturing system including a two-dimensional energy patterning system for imaging a powder bed is disclosed. Improved structure formation, part creation and manipulation, use of multiple additive manufacturing systems, and high throughput manufacturing methods suitable for automated or semi-automated factories are also disclosed.