Patent classifications
G03H2001/0033
Device for detecting objects by holography
A device for detecting at least one object present in a sample, the device including a light source to emit at least one incident wave at a wavelength λ, a detection volume intended to receive the object, and to receive at least one incident wave, an image sensor positioned to receive at least one scattered light wave obtained by diffraction of the incident wave on the object and a reference wave from the source and not diffracted on the object and to generate a holographic image, and a computer data processing device to digitally reconstruct the object based at least on the holographic image and the wavelength λ. The device also comprises a support comprising patterns organized to form at least one diffraction grating, the grating being periodic and having a pitch P, such that λ/2≤P≤2λ.
Methods of oil and gas exploration using digital imaging
Methods of oil and gas exploration that may include: obtaining wavefield data representing recordings from a propagating wavefield through a geophysical volume; obtaining at least one reference digital image of a portion or all of the geophysical volume generated from the recorded wavefield data, wherein the reference image may have a reference sampling ratio and a reference image quality value; selecting a holographic computational method of imaging the wavefield data; selecting a data subset from the wavefield data based on one or more parameters selected from the group consisting of field sampling, imaging sampling, and image quality; decimating the data subset, wherein the decimated data subset may represent a sampling ratio less than the reference sampling ratio; and generating a new digital image based on the selected holographic computational method of imaging, the data subset, and parameters corresponding to the data sub set.
Holographic reconstruction apparatus and method
Provided are an improved holographic reconstruction apparatus and method. A holographic reconstruction method includes: obtaining an object hologram of a measurement target object; extracting reference light information from the obtained object hologram; calculating a wavenumber vector constant of the extracted reference light information, and generating digital reference light by calculating a compensation term of the reference light information by using the calculated wavenumber vector constant; extracting curvature aberration information from the object hologram, and then generating digital curvature in which a curvature aberration is compensated for; calculating a compensated object hologram by multiplying the compensation term of the reference light information by the obtained object hologram; extracting phase information of the compensated object hologram; and reconstructing 3-dimensional (3D) shape information and quantitative thickness information of the measurement target object by calculating the quantitative thickness information of the measurement target object by using the extracted phase information of the compensated object hologram.
Digital holography microscope (DHM), and inspection method and semiconductor manufacturing method using the DHM
A low-cost digital holography microscope (DHM) that is capable of performing inspection at high speed while accurately inspecting an inspection object at high resolution, an inspection method using the DHM, and a method of manufacturing a semiconductor device by using the DHM are provided. The DHM includes: a light source configured to generate and output light; a beam splitter configured to cause the light to be incident on an inspection object and output reflected light from the inspection object; and a detector configured to detect the reflected light, wherein, when the reflected light includes interference light, the detector generates a hologram of the interference light, and wherein no lens is present in a path from the light source to the detector.
Large volume holographic imaging systems and associated methods
A holography sensor system is provided that includes an illuminator, a backscatter array, an array controller, and processing circuitry. The illuminator may be configured to output an illumination signal into a target volume. The backscatter array may comprise a plurality of backscatter elements. The array controller operably coupled to the backscatter elements, and the array controller may be configured to activate selected backscatter elements to enable the selected backscatter elements to transmit a backscatter signal in response to receipt of the illumination signal. The receiver may be configured to receive the backscatter signals from the selected backscatter elements. The processing circuitry may be configured to receive the backscatter data based on the backscatter signals from the receiver, aggregate the backscatter data with other backscatter data to form a holographic field measurement data set, and generate an image of the target volume based on the holographic field measurement data set.
Hybrid 3D inspection system
An optical inspection apparatus includes an interferometer module, which is configured to direct a beam of coherent light toward an area under inspection and to produce a first image of interference fringes of the area. The apparatus also includes a triangulation module configured to project a pattern of structured light onto the area, and at least one image sensor configured to capture the first image of interference fringes and a second image of the pattern that is reflected from the area. Beam combiner optics are configured to direct the beam of coherent light and the projected pattern to impinge on the same location on the area. A processor is configured to process the first and second images in order to generate a 3D map of the area.
Imaging device for in-line holographic imaging of an object
Example embodiments relate to imaging devices for in-line holographic imaging of objects. One embodiment includes an imaging device for in-line holographic imaging of an object. The imaging device includes a set of light sources configured to output light in confined illumination cones. The imaging device also includes an image sensor that includes a set of light-detecting elements. The set of light sources are configured to output light such that the confined illumination cones are arranged side-by-side and illuminate a specific part of the object. The image sensor is arranged such that the light-detecting elements detect a plurality of interference patterns. Each interference pattern is formed by diffracted light from the object originating from a single light source and undiffracted light from the same single light source. At least a subset of the set of light-detecting elements is arranged to detect light relating to not more than one interference pattern.
COLLOIDAL FINGERPRINTS FOR SOFT MATERIALS USING TOTAL HOLOGRAPHIC CHARACTERIZATION
Systems and methods for uniquely identifying fluid-phase products by endowing them with fingerprints composed of dispersed colloidal particles, and by reading out those fingerprints on demand using Total Holographic Characterization. A library of chemically inert colloidal particles is developed that can be dispersed into soft materials, the stoichiometry of the mixture encoding user-specified information, including information about the host material. Encoded information then can be recovered by high-speed analysis of holographic microscopy images of the dispersed particles. Specifically, holograms of individual colloidal spheres are analyzed with predictions of the theory of light scattering to measure each sphere's radius and refractive index, thereby building up the distribution of particle properties one particle at a time. A complete analysis of a colloidal fingerprint requires several thousand single-particle holograms and can be completed in ten minutes.
METHOD FOR CHARACTERISING A PARTICLE ON THE BASIS OF A HOLOGRAM
A method for characterizing a particle present in a sample, the sample lying between an image sensor and a light source and the sensor lying in a detection plane, includes illuminating the sample with the light source which emits an incident light wave propagating along a propagation axis, and acquiring an image of the sample with the sensor. The sensor is exposed to an exposure light wave. The image includes a plurality of elementary diffraction patterns each corresponding to one particle. The method also includes reconstructing a complex image representative of a complex amplitude of the light wave on a reconstruction surface passing through the sample, based on the acquired image; selecting a region of interest of the complex image corresponding to a particle of interest; forming an extracted image based on the region of interest; and characterizing the particle of interest depending on the extracted region of interest.
LENS-FREE HOLOGRAPHIC OPTICAL SYSTEM FOR HIGH SENSITIVITY LABEL-FREE MICROBIAL GROWTH DETECTION AND QUANTIFICATION FOR SCREENING, IDENTIFICATION, AND SUSCEPTIBILITY TESTING
Disclosed are optical interrogation apparatus that can produce lens-free images using an optoelectronic sensor array to generate a holographic image of sample objects, such as microorganisms in a sample. Also disclosed are methods of detecting and/or identifying microorganisms in a biological sample, such as microorganisms present in low levels. Also disclosed are methods of using systems to detect microorganisms in a biological sample, such as microorganisms present in low levels. In addition or as an alternative, the methods of using systems may identify microorganisms present in a sample and/or determine antimicrobial susceptibility of such microorganisms.