Patent classifications
G03H2222/44
ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION DEVICE, ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION METHOD, AND ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION PROGRAM
An electromagnetic wave phase/amplitude generation device includes a radiation unit configured to radiate electromagnetic waves of a random radiation pattern on a spatial frequency in which a state of the electromagnetic waves to be radiated for each divided region is determined to an imaging object, an imaging unit configured to generate a captured image by imaging scattered electromagnetic waves that are electromagnetic waves generated when the imaging object scatters the electromagnetic waves of the radiation pattern radiated by the radiation unit, and a generation unit configured to generate information indicating at least a phase and amplitude of the electromagnetic waves from the imaging object by performing an arithmetic sparsity constraint operation according to sparsity of the imaging object on the basis of the captured image generated by the imaging unit, information indicating the radiation pattern, and information indicating a signal of the imaging object.
Electromagnetic wave phase/amplitude generation device, electromagnetic wave phase/amplitude generation method, and electromagnetic wave phase/amplitude generation program
An electromagnetic wave phase/amplitude generation device includes a radiation unit configured to radiate electromagnetic waves of a random radiation pattern on a spatial frequency in which a state of the electromagnetic waves to be radiated for each divided region is determined to an imaging object, an imaging unit configured to generate a captured image by imaging scattered electromagnetic waves that are electromagnetic waves generated when the imaging object scatters the electromagnetic waves of the radiation pattern radiated by the radiation unit, and a generation unit configured to generate information indicating at least a phase and amplitude of the electromagnetic waves from the imaging object by performing an arithmetic sparsity constraint operation according to sparsity of the imaging object on the basis of the captured image generated by the imaging unit, information indicating the radiation pattern, and information indicating a signal of the imaging object.
Device and method allowing observation of an object with a large field of observation without use of magnifying optics between a light source and the object
A device and a method for observing an object by imaging, or by lensless imaging. The object is retained by a holder defining an object plane inserted between a light source and an image sensor, with no enlargement optics being placed between the object and the image sensor. An optical system is arranged between the light source and the holder and is configured to form a convergent incident wave from a light wave emitted by the light source, and for forming a secondary light source, conjugated with the light source, positioned in a half-space defined by the object plane and including the image sensor, such that the secondary source is closer to the image sensor than to the holder. This results in an image with a transversal enlargement factor having an absolute value of less than 1.
Projection system for measuring vibrations
Some embodiments are directed to a system for measuring vibrations of a surface of a mechanical part, by digital holography. The system includes a source of radiation emitting in a predetermined range of frequencies, a first separator element configured to define a first incident ray and a reference ray, a module for shaping a second incident ray from the first incident ray, and an optical element configured to make the reference ray and a radiation produced by a reflection of the incident ray on the surface of the mechanical part interfere. The module for shaping the second incident ray includes diffracting optical elements having a diffraction structure to diffract the incident radiation. The structure is from a polymer, sol-gel or photoresin material resting against a glass substrate, the structure including elements etched in a plane parallel and/or orthogonal to the substrate, with dimensions from 100 nanometres to 100 micrometres.
Holographic Imaging Device and Data Processing Method Therefor
A holographic imaging device and method realizes both a transmission type and a reflection type, and also realizes a long working distance wide field of view or ultra-high resolution. Object light emitted from an object, sequentially illuminated with parallel illumination light whose incident direction is changed, is recorded on a plurality of object light holograms for each incident direction using off-axis spherical wave reference light. The reference light is recorded on a reference light hologram using in-line spherical wave reference light being in-line with the object light. An object light wave hologram and its spatial frequency spectrum at the object position are generated for each incident direction using each hologram. A synthetic spectrum which occupies a wider frequency space is generated by matching each spectrum in the overlapping area, and a synthetic object light wave hologram with increased numerical aperture is obtained thereby.
HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAM
A lensless Fourier transform holography high accuracy reconstruction method using a charged particle beam apparatus which holds a sample on a diffraction surface of a diffraction grating provided on the downstream side of a traveling direction of the charged particle beam and which is formed of a material having permeability. The charged particle beam passed through the diffraction surface is image-formed, and the formed image is detected. An opening region of the diffraction grating is smaller than an irradiation region of the charged particle beam on the diffraction grating. Image data is obtained in a state where the irradiation region of the charged particle beam diffracted with the diffraction grating is within the irradiation region of the charged particle beam transmitted through the diffraction grating. Plural holograms obtained based on the image data are Fourier transformed and an intensity distribution image is displayed and stored.
PROJECTION SYSTEM FOR MEASURING VIBRATIONS
A system for measuring vibrations of a surface (VSURF) of a mechanical part (M), comprising a source (SOURCE) of radiation (L), a first separator element (ELI) configured to define a first incident ray (LB1) and a reference ray (RLB), a shaping module (DOEM) producing a second incident ray (LB2) from said first incident ray (LB1), and an optical element (OE) capable of an interferential addition of the reference ray (RLB) and a ray produced by a reflection of said second incident ray (LB2) on said surface (VSURF), the shaping module (DOEM) comprising one or more diffracting optical elements (DOE1, . . . , DOEn), each comprising at least one diffraction structure (FSTRUCT) diffracting all or part of the first incident ray (LB1) so as to illuminate a chosen surface of the mechanical part.
Imaging apparatus and methods using diffraction-based illumination
Imaging apparatus and methods using diffraction-based illumination are disclosed. An example apparatus includes a diffraction grating to redirect light from a light source toward a sample to thereby illuminate the sample. The example apparatus also includes an image sensor to detect a diffraction pattern created by the illuminated sample.
ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION DEVICE, ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION METHOD, AND ELECTROMAGNETIC WAVE PHASE/AMPLITUDE GENERATION PROGRAM
An electromagnetic wave phase/amplitude generation device includes a radiation unit configured to radiate electromagnetic waves of a random radiation pattern on a spatial frequency in which a state of the electromagnetic waves to be radiated for each divided region is determined to an imaging object, an imaging unit configured to generate a captured image by imaging scattered electromagnetic waves that are electromagnetic waves generated when the imaging object scatters the electromagnetic waves of the radiation pattern radiated by the radiation unit, and a generation unit configured to generate information indicating at least a phase and amplitude of the electromagnetic waves from the imaging object by performing an arithmetic sparsity constraint operation according to sparsity of the imaging object on the basis of the captured image generated by the imaging unit, information indicating the radiation pattern, and information indicating a signal of the imaging object.
Optical phase modulation systems and methods
Methods, systems, and devices for particle characterization by optical phase modulation and detection of aerosol backscattering. In some aspects, a compact and cost effective particle detector device to measure the aerosol density and its size distribution by backscattered focusing using projected optical modified field distribution imaging into the aerosol medium (air). The disclosed device can be used in a variety of scientific and industrial applications, e.g., such as a particle sensor for automobiles able to detect harmful pollution which may then be filtered from the car cabin, or warnings provided to the driver. The device can also capture and store data, enabling detailed pollution maps of various roadways in real-time.