Patent classifications
G06F11/16
Data storage system employing a hot spare to store and service accesses to data having lower associated wear
A controller monitors access frequencies of address ranges mapped to a data storage array. Based on the monitoring, the controller identifies frequently accessed ones of the address ranges that have lower associated wear, for example, those that are read more often than written. In response to the identifying, the controller initiates copying of a dataset associated with the identified address ranges from the data storage array to a spare storage device while refraining from copying other data from the data storage array onto the spare storage device. The controller directs read input/output operations (IOPs) targeting the identified address ranges to be serviced by access to the spare storage device. In response to a failure of a failed storage device among the plurality of primary storage devices, the controller rebuilds contents of the failed storage device on the spare storage device in place of the dataset associated with the identified address ranges.
MONITORING DEVICE, FAULT-TOLERANT SYSTEM, AND CONTROL METHOD
A monitoring device is mounted in each of a plurality of operational systems constituting a fault-tolerant system. The plurality of operational systems have an identical configuration including a processor system. The monitoring device includes a processor. The processor executes instruction to read data from a predetermined storage area in a memory of an accessory device to be monitored, connected to the processor system. The processor further executes instruction to compare the read data with reference data held in advance. The processor further executes instruction to separate the processor system connected to the accessory device to be monitored from the fault-tolerant system when the read data is different from the reference data.
Distributed modular I/O device with configurable single-channel I/O submodules
An input/output (I/O) device for a distributed modular I/O system includes a base adapted to be connected to an associated support structure. A terminal block is connected to the base and includes a plurality of wiring connections adapted to be connected to field wiring of an associated controlled system. The I/O device further includes first and second I/O modules each including a plurality of removable single-channel I/O submodules that are each releasably connected to the base and each configured for a select I/O operation for input and output of data relative to the associated controlled system. One or more pairs of the single-channel I/O submodules can be configured to be redundant within or between the first and second I/O modules. Each of the single-channel I/O submodules is operatively connected to wiring connections of the terminal block through the base. The I/O device further includes first and second network switches connected to the base. The first and second network switches are adapted to be respectively connected to first and second backplane circuits. The I/O device further includes first and second system modules connected to the base and each respectively connected to both of the first and second network switches. The first and second system modules are also each respectively operatively connected to all of the removable single-channel I/O submodules of both of the first and second I/O modules such that the first and second system modules control communication of I/O data between the first and second network switches and the single-channel I/O submodules.
Distributed modular I/O device with configurable single-channel I/O submodules
An input/output (I/O) device for a distributed modular I/O system includes a base adapted to be connected to an associated support structure. A terminal block is connected to the base and includes a plurality of wiring connections adapted to be connected to field wiring of an associated controlled system. The I/O device further includes first and second I/O modules each including a plurality of removable single-channel I/O submodules that are each releasably connected to the base and each configured for a select I/O operation for input and output of data relative to the associated controlled system. One or more pairs of the single-channel I/O submodules can be configured to be redundant within or between the first and second I/O modules. Each of the single-channel I/O submodules is operatively connected to wiring connections of the terminal block through the base. The I/O device further includes first and second network switches connected to the base. The first and second network switches are adapted to be respectively connected to first and second backplane circuits. The I/O device further includes first and second system modules connected to the base and each respectively connected to both of the first and second network switches. The first and second system modules are also each respectively operatively connected to all of the removable single-channel I/O submodules of both of the first and second I/O modules such that the first and second system modules control communication of I/O data between the first and second network switches and the single-channel I/O submodules.
DATA STORAGE DEVICE FOR INCREASING LIFETIME AND RAID SYSTEM INCLUDING THE SAME
A data storage device includes a nonvolatile memory arranged in drives and stripes, a buffer storing state information for each of the stripes, and a memory controller including a redundant array of independent disks (RAID) controller that operates in a spare region mode and performs data recovery using garbage collection based on the state information. The state information includes a first state indicating that none of the drives has malfunctioned, a second state indicating one of the drives has malfunctioned, and a third state indicating that data/parity stored in a malfunctioning drive has been recovered.
APPARATUS AND METHOD TO COLLECT MEMORY DUMP INFORMATION OF A FAULTY NODE IN A PARALLEL COMPUTER SYSTEM
An apparatus includes nodes each configured to relay data between the nodes. When a failure occurs in a first-node, a management-node determines, based on power consumption and/or memory usage of the nodes, a collection-node that transmits an instruction in first direction approaching the first-node and a second direction approaching a storage-node, respectively. A second-node that is neither an adjacent-node adjacent to the first-node nor the storage-node, upon receiving data including the instruction, transmit data obtained by adding an evaluation value for the second-node to the received data, in the first or second direction. Each of the adjacent-node and the storage-node, upon receiving data including the instruction, transmit data including an evaluation value for another node included in the received data and an evaluation value for the each node, to the collection-node which determines transmission routes between the collection-node and the first-node, and between the collection-node and the storage-node.
METHOD, APPARATUS, AND SYSTEM FOR TARGETED HEALING OF WRITE FAILS THROUGH BIAS TEMPERATURE INSTABILITY
Method, apparatus, and system for improving semiconductor device writeability at row/bit level through bias temperature instability. Such a device may comprise a plurality of cells of an array, wherein each of the cells comprises a pass gate and a latch; a plurality of word lines, wherein each word line comprises a supply voltage line (VCS) which supplies voltage to each latch of a first number of cells; an array VCS driver electrically connected to each VCS; and a control line configured to provide an operational array supply voltage, a first array supply voltage, or a second array supply voltage to each VCS, wherein the first array supply voltage and the second array supply voltage are greater than the operational array supply voltage. By virtue of BTI, application of the first array supply voltage may lead to improved writeability of one or more cells of the device.
Image recording system
An image recording system includes a plurality of image recording apparatuses. In a case where a certain image recording apparatus of the image recording apparatuses has a failure nozzle proportion of failure nozzles of all the nozzles of the recording head smaller than or equal to a threshold, image recording is performed on the certain image recording apparatus based on a recording instruction. In a case where the certain image recording apparatus has a failure nozzle proportion exceeding the threshold, a recording instruction is transmitted to a different image recording apparatus having a failure nozzle proportion smaller than that of the certain image recording apparatus, and image recording is performed on the different image recording apparatus based on the recording instruction.
Replication of xcopy command
A method, system and program product for implementing the xcopy command in a replication environment, the replication environment having a production site, a splitter, and a replication site, wherein the replication site has a journal, comprising, determining if the source and target LUNs of the xcopy command are replicated, based on a determination that both source and target LUNs are replicated, determining if the production and replication LUNs are synchronized, based on a positive determination that the LUNs are synchronized, and performing the xcopy command on the replication.
Semiconductor memory device and method of operating the same
A semiconductor memory device includes a memory cell array having a first group of main blocks, a second group of main blocks and redundancy blocks replacing the first group of main blocks or the second group of main blocks, a repair logic suitable for enabling a replacement signal when one or more of the second group of main blocks are defective, a control logic suitable for generating an address for the second group of main blocks in response to a dedicated command for access to one or more of the second group of main blocks, and an address decoder suitable for selecting one or more of the redundancy blocks based on the address for the second group of main blocks when the replacement signal is enabled.