A radiation hardened, digital to analog converter includes first and second serial communication circuits, a common bus interface configured to connect the first and second serial communication circuits to first and second digital serial communication buses, respectively, and a digital to analog converter circuit, where the first and second serial communication circuits are configured to receive data over the first and second digital serial communication buses, respectively, for use by the digital to analog converter circuit.

A radiation hardened, digital to analog converter includes first and second serial communication circuits, a common bus interface configured to connect the first and second serial communication circuits to first and second digital serial communication buses, respectively, and a digital to analog converter circuit, where the first and second serial communication circuits are configured to receive data over the first and second digital serial communication buses, respectively, for use by the digital to analog converter circuit.

A system and related method operate solid-states storage memory. The system performs a first tuning process that has a first set of tuning options, on a first portion of solid-states storage memory. The system identifies one or more second portions of solid-states storage memory, within the first portion of solid-states storage memory that fail readability after the first tuning process. The system performs a second tuning process that has a differing second set of tuning options, on each of the one or more second portions of solid-states storage memory.

The present disclosure relates to a memory architecture comprising a plurality of subarrays of memory cells, a plurality of sense amplifiers connected to the subarrays, a plurality of original pads, at least one redundant pad, multiple data lines, and a redundant register connected to the plurality of original pads, to the plurality of redundant pads and to the data lines. The redundant register implementing an interconnection redundancy and connecting one of the redundant pads to the data lines when an addressed original pad is found defective. The disclosure also relates to a System-on-Chip (SoC) component comprising a memory architecture, and an interconnection redundancy managing block included into the memory architecture. A related memory component and related methods for managing interconnection redundancy of the memory architecture and/or the SoC are also disclosed.

Methods, systems and apparatuses may provide for technology that includes a chip having a first die including a first processing logic to execute a first application instance and generate a first output of the first application instance, and a second processing logic to execute a second application instance and generate a second output of the second application instance. The chip may also include a second die coupled to the first die, wherein the second die includes a safety monitor detect a condition associated with one or more of an error in the first output, an error in the second output, or a discrepancy between the first output and the second output. The safety monitor may also initiate a transition of the chip into a safe state in response to the condition.

A method for tracing an error of a logic system design includes obtaining an assertion failure of a combinational cone of the logic system design, the combinational cone including a plurality of sub-cones; and obtaining machine learning models of the sub-cones. Each sub-cone represents a sub-circuitry of the logic system design and has one or more input signals and an output signal. The assertion failure indicates an actual signal value of the combinational cone at a current clock cycle being different from an expected output value at the current clock cycle. The method also includes: performing backtracing on the sub-cones according to the assertion failure, the machine learning models of the sub-cones, and dynamic backtracing sensitivities corresponding to the sub-cones, to obtain a backtracing result; and outputting one or more target sub-cones as candidate root causes of the assertion failure according to the backtracing result.

A computer system includes a BMC and a host of the BMC. The BMC receives a first message from a first remote device on an existing out-of-band management network. The BMC determines whether the first message is directed to a storage service or fabric service running on the host, the host being a storage device. The storage service provides access to user data stored on one or more storage devices connected to the host via a storage network that is isolated from the management network. When the first message is directed to the storage service or fabric service: the BMC extracts a service command from the first message; the BMC sends, through a BMC communication channel to the host, a second message containing the service command to the host. The BMC communication channel has been established for communicating baseboard management commands between the BMC and the host.

A system, method and computer program product synchronize a plurality of processes of one or more applications executed by a plurality of processors. In addition to the processors, the system includes a plurality of memories with each memory associated with a respective process and configured to maintain a local count representative of a message of the respective process with which the memory is associated and at least one remote count representative of a message of a corresponding process executed by another processor. The system also includes a reflector configured to reflect the local count of the respective process to a remote count of the corresponding process. For synchronization, a first process of a first application executed by a first processor is configured to enter a delay period if the local count and at least one remote count maintained by the memory associated with the first process fail to match.

Systems, methods, and apparatuses relating to circuitry to implement lockstep of processor cores are described. In one embodiment, a hardware processor comprises a first processor core comprising a first control flow signature register and a first execution circuit, a second processor core comprising a second control flow signature register and a second execution circuit, and at least one signature circuit to perform a first state history compression operation on a first instruction that executes on the first execution circuit of the first processor core to produce a first result, store the first result in the first control flow signature register, perform a second state history compression operation on a second instruction that executes on the second execution circuit of the second processor core to produce a second result, and store the second result in the second control flow signature register.

A memory device includes a plurality of data input pads and at least one test data input pad. The memory device also includes a plurality of data input circuits corresponding to a plurality of channels, respectively, the plurality of data input circuits suitable for transmitting respective data received through the data input pads to the corresponding channels. The memory device further includes a test control circuit suitable for selecting at least one data input circuit among the plurality of data input circuits based on test mode information and suitable for controlling the selected data input circuit to transmit set data to the corresponding channel, during a test operation.