A method for estimating the remaining life of a solid state drive (SSD) device includes generating a sensing value by periodically measuring an environmental variable, generating a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device, calculating stress applied to the SSD device based on the load value, calculating damage of the SSD device based on a stress-life curve and the stress, and determining the remaining life of the SSD device based on a difference between a threshold value and the damage. The stress-life curve may represent a relationship between the stress and life of the SSD device.

A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed by components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.

Embodiments for automated testing of a virtualization management system are described. According to one aspect, a method includes generating a test case including a plurality of instances of commands and sending the test case to a plurality of interfaces supported by the virtualization management system. The method also includes generating a response file corresponding to each command in the test case. The method also includes comparing results from each interface to an instance of a command and in response to the results from each interface being identical, storing, the results in the response file corresponding to the command. The method also includes reporting an error in response to the results from each interface of the virtualization management system not being identical. The present document further describes examples of other aspects such as systems, computer products.

A system and method are provided for testing features of an embedded system. The system includes a low-powered computing device communicatively coupled to a control application interface, a sensor interface, and a robotic interface. The low-powered computing device may receive sensor signals generated during a test, provide sensor data corresponding to the sensor signals, receive commands for the test, and provide instructions for movement of a robotic handler corresponding to at least one of the commands for the test. The system also includes a computing device communicatively coupled to the control application interface, an image processing interface, and a database interface. The computing device may receive sensor data, receive image data corresponding to images of the embedded system captured during the test, receive tests capable of being performed, and provide commands for the test.

Embodiments for automated testing of a virtualization management system are described. According to one aspect, a method includes generating a test case including a plurality of instances of commands and sending the test case to a plurality of interfaces supported by the virtualization management system. The method also includes generating a response file corresponding to each command in the test case. The method also includes comparing results from each interface to an instance of a command and in response to the results from each interface being identical, storing, the results in the response file corresponding to the command. The method also includes reporting an error in response to the results from each interface of the virtualization management system not being identical. The present document further describes examples of other aspects such as systems, computer products.

The disclosed method comprises receiving operating environment data, such as resource availability data, from connected computing devices and services, analysing the data to create one or more policies governing log data storage and upload parameters, and sending the policies to the connected devices to enable them to limit resource consumption in the management of log data.

A log management method executed by a processor included in a log management device that manages logs of a plurality of devices, the log management method includes receiving a plurality of logs from one of the plurality of devices; generating a plurality of time stamps and a plurality of bodies by separation of the plurality of time stamps from the plurality of logs; sorting the plurality of time stamps and the plurality of bodies based on information included in the plurality of bodies; compressing the sorted plurality of bodies and the plurality of sorted time stamps; restoring, when a request to refer to the plurality of logs is received, the plurality of logs by decompressing the compressed plurality of bodies and the plurality of compressed time stamps; and outputting the restored plurality of logs.

A semiconductor system may include a first semiconductor device and a second semiconductor device. The first semiconductor device may be configured to output a reset signal, command/address signals and data. The second semiconductor device may be configured to generate internal commands, internal addresses and internal data for performing an initialization operation. The second semiconductor device may be configured to store the internal data in a plurality of memory cells selected by the internal commands and the internal addresses.

A semiconductor system may include a first semiconductor device and a second semiconductor device. The first semiconductor device may be configured to output commands and addresses. The first semiconductor device may be configured to output a strobe signal toggled and data after an initialization operation. The second semiconductor device may be configured to start the initialization operation if the commands have a first combination and stores internal data having a predetermined level during a set period of the initialization operation if the commands have a second combination.

A computer system includes creating a test suite, wherein the test suite includes a plurality of test cases for execution on a plurality of test agents. The method distributes a first portion of test cases to any available test agents, wherein each test case out of the first portion of test cases does not have any associated preconditions. The receives test results and event information for a first test case out of the first portion of test cases from a first test agent. Responsive to determining the event information for the first test case includes a satisfied condition for a second test case with one or more associated preconditions, the method determines whether the satisfied condition for the second test case relates to a global variable or local variable.