Patent classifications
G06F11/24
Frequency guard band validation of processors
It is determined that a guard band frequency for a first processor is to be determined. The guard band frequency is associated with a first system configuration. A validation start frequency is determined based, at least in part, on data associated with at least one of the first processor or a second processor. The validation start frequency is between a nominal operating frequency for the first processor and a system maximum operating frequency for the first processor. A guard band frequency for the second processor was previously determined. The guard band frequency for the first processor is determined based, at least in part, on the validation start frequency.
Smart Overclocking Method
The present invention provides a smart overclocking method which comprises: providing a computer device with a multi-core CPU and building an overclocking database in a BIOS of the computer device; booting the computer device and logging in the BIOS and performing an overclocking function; acquiring overclocking numerical data in the overclocking database; performing adjustment of the frequency and the voltage of the multi-core CPU on the multi-core CPU with the overclocking numerical data; performing a heavy load pressure test on the multi-core CPU; reading in real time the working frequency, the working voltage, and the working temperature of the multi-core CPU and determining whether they have exceeded limits. Hence, after a user performs an overclocking function, a BIOS unit performs an overclocking test and determines the working frequency, the working voltage, and the working temperature, thereby achieving the efficacy that the BIOS unit can offer the optimized proposals for overclocking.
TRAFFIC CAPTURE AND DEBUGGING TOOLS FOR IDENTIFYING ROOT CAUSES OF DEVICE FAILURE DURING AUTOMATED TESTING
A method for diagnosing a root cause of failure using automated test equipment is disclosed. The method comprises monitoring data traffic associated with testing a device under test (DUT) in the automated test equipment using a plurality capture modules, wherein the plurality of capture modules are programmed onto a programmable logic device, wherein the programmable logic device is controlled by a system controller and is operable to generate commands and data to test the DUT, wherein the plurality of capture modules are operable to selectively capture the data traffic to be monitored, and wherein the data traffic monitored comprises a flow of traffic between the DUT and the system controller. The method further comprises saving results associated with the monitoring in respective memories associated with each of the plurality of capture modules. Further, the method comprises transmitting the results upon request to an application program executing on the system controller.
SERVER TESTING APPLYING CONTROLLED FLOW AND TEMPERATURE
A server testing apparatus that exposes an operating server to a configured fluid flow rate (e.g., airflow) and temperature. After the server is docked within the server testing apparatus, a software load is applied to the server to mimic actual operation in the target environment. Then, fluid flow is applied into the inlet of the server at a designated flowrate and temperature. By testing the server for both fluid flowrate as well as temperature in a single apparatus at the same time, significant time may be saved. This is due largely to the fact that the server testing takes significant time to ensure that the server can operate long term in the environment in which that server or similar servers may be installed. Furthermore, the testing more accurately represents the operation of the server in the actual environment, thereby leading to better testing for the server.
BURN PROCESS DATA RETRIEVAL AND NOTIFICATION
Disclosed herein are methods, systems, and processes for burn process data retrieval and notification. A burn process that is ongoing and that is initiated to generate burn data associated with a testing computing device is detected at a computing device. A determination is made that the burn data has been generated by the testing computing device as part of the burn process. The burn data associated with the burn process generated by the testing computing device is then retrieved.
Intermittent display issue monitoring system
A system to detect intermittent failures of a display system including a display and a display processing system is provided. The system may include, but is not limited to, a sensor system configured to capture a light level of the display, and a processor configured to cause the display processing system to generate the static image on the display, determine, when the display is displaying the static image, a baseline light level of the display, validate an existence of an intermittent display error when the light level of the display is greater than the baseline light level by a first predetermined amount or when the light level of the display is less than the baseline light level by a second predetermined amount at least once over the predetermined amount of time, determine a recurrence rate, and associate an error type with each instance.
Intermittent display issue monitoring system
A system to detect intermittent failures of a display system including a display and a display processing system is provided. The system may include, but is not limited to, a sensor system configured to capture a light level of the display, and a processor configured to cause the display processing system to generate the static image on the display, determine, when the display is displaying the static image, a baseline light level of the display, validate an existence of an intermittent display error when the light level of the display is greater than the baseline light level by a first predetermined amount or when the light level of the display is less than the baseline light level by a second predetermined amount at least once over the predetermined amount of time, determine a recurrence rate, and associate an error type with each instance.
System and method for automated integration and stress testing of hardware and software service in management controller using containerized toolbox
Systems and methods for automated integration and stress testing of hardware and software services in a management controller using a containerized toolbox. The method utilizes a containerized toolbox module, which includes multiple testing tools for a web-based protocol, such as a Representational State Transfer (REST) protocol, and an Intelligent Platform Management Interface (IPMI) protocol. A management controller to be tested by the containerized toolbox module provides multiple services accessible under the web-based protocol and the IPMI protocol. In operation, the containerized toolbox module is provided at the management controller, and receives a testing command to perform a plurality of tests to the services of the management controller. Based on the testing command, the containerized toolbox module performs the tests to the services of the management controller using the testing tools of the containerized toolbox module.
Method of estimating remaining life of solid state drive device
A method for estimating the remaining life of a solid state drive (SSD) device includes generating a sensing value by periodically measuring an environmental variable, generating a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device, calculating stress applied to the SSD device based on the load value, calculating damage of the SSD device based on a stress-life curve and the stress, and determining the remaining life of the SSD device based on a difference between a threshold value and the damage. The stress-life curve may represent a relationship between the stress and life of the SSD device.
Method of estimating remaining life of solid state drive device
A method for estimating the remaining life of a solid state drive (SSD) device includes generating a sensing value by periodically measuring an environmental variable, generating a load value associated with the SSD device based on the sensing value and a distance between the sensor and the SSD device, calculating stress applied to the SSD device based on the load value, calculating damage of the SSD device based on a stress-life curve and the stress, and determining the remaining life of the SSD device based on a difference between a threshold value and the damage. The stress-life curve may represent a relationship between the stress and life of the SSD device.