An integrated circuit (IC) that is otherwise radiation tolerant implements a radiation tolerance limiting feature (RTLF) to ensure that the IC, as manufactured, will fail applicable radiation tolerance tests, thereby allowing it to be manufactured by any suitable IC foundry. Embodiments further include a programmable radiation tolerance feature (PRT) that can be actuated at an authorized actuation site after IC manufacture to override the RTLF, thereby rendering the IC radiation tolerant. The PRT and/or RTLF can include redundancy to ensure reliability. The PRT and/or RTLF can be obfuscated, encrypted, and/or password protected. Actuating the PRT can include applying a programming signal to the IC and/or uploading code to a programmable element after IC manufacture. A plurality of RTLFs can be included to ensure failure of any desired combination of applicable radiation tolerance tests, such as total radiation dosage, linear energy transfer events, radiation dose rate, and single event upset.

A programmable device includes a functional module, a pre-allocation manager, a first connection line, and a second connection line, wherein the pre-allocation managers are connected by the first connection lines, and the pre-allocation managers are connected to the functional modules by the second connection lines; the first connection lines are used for data transmission between the pre-allocation mangers, and a transmission direction is determined according to the configuration; the second connection lines are used for data transmission between the pre-allocation managers and the functional modules; the pre-allocation mangers are used for data transmission between the first connection lines and for data transmission between the first connection lines and the functional modules. The first connection lines are configured as connection line segments for transmission in both directions, and a wiring structure is designed in a direction and shape meeting wiring requirements.

A system and method for dynamically and automatically sharing resources of a coprocessor AI accelerator based on workload changes during training and inference of a plurality of neural networks. The method comprising steps of receiving a plurality of requests from each neural network and high-performance computing applications (HPCs) through a dynamic adaptive scheduler module. The dynamic adaptive scheduler module morphs the received requests into threads, dimensions and memory sizes. The method then receives the morphed requests from the dynamic adaptive scheduler module through client units. Each of the neural network applications is mapped with at least one of the client units on a graphics processing unit (GPU) hosts. The method then receives the morphed requests from the plurality of client units through a plurality of server units. Further, the method receives the morphed request from the plurality of server units through one or more coprocessors.

A system and method for dynamically and automatically sharing resources of a coprocessor AI accelerator based on workload changes during training and inference of a plurality of neural networks. The method comprising steps of receiving a plurality of requests from each neural network and high-performance computing applications (HPCs) through a dynamic adaptive scheduler module. The dynamic adaptive scheduler module morphs the received requests into threads, dimensions and memory sizes. The method then receives the morphed requests from the dynamic adaptive scheduler module through client units. Each of the neural network applications is mapped with at least one of the client units on a graphics processing unit (GPU) hosts. The method then receives the morphed requests from the plurality of client units through a plurality of server units. Further, the method receives the morphed request from the plurality of server units through one or more coprocessors.

In an approach, a processor receives an input indicative of a set of registers, the set of registers being configured for obtaining output data from a design-under-test (DUT) in a field-programmable gate array (FPGA) module. A processor executes a set of instructions for monitoring the output data in the set of registers;. A processor generates data indicative of at least one portion of changes of the output data in the set of registers during the execution of the set of instructions. A processor causes a separate machine to analyze the data via utilizing an interface to send the data to the separate machine.

In an approach, a processor receives an input indicative of a set of registers, the set of registers being configured for obtaining output data from a design-under-test (DUT) in a field-programmable gate array (FPGA) module. A processor executes a set of instructions for monitoring the output data in the set of registers;. A processor generates data indicative of at least one portion of changes of the output data in the set of registers during the execution of the set of instructions. A processor causes a separate machine to analyze the data via utilizing an interface to send the data to the separate machine.

A method and apparatus for estimating signal related delays in a PLD design is disclosed. The PLD design is modeled in relation to one or more stages, each of the stages including a driver and one or more receivers coupled to the driver with a wiring tree. The modeling is based on a selected set of parameters that include: slope related delays associated with the driver; a delay related to a layout of the wiring tree; and a parameter related to a slope transfer from a previous driver input. A predetermined set of values for each of the selected parameters are accessed; the estimated signal related delays are computed for each of the modeled stages; and are written to a computer-readable storage medium.

A programmable impedance element consists of a plurality of nominally identical two-port elements, each two-port element having an impedance element and two switches, the two-port elements arranged in a chain fashion with a structured set of switches such that a range of impedances can be obtained from each cell by dynamically changing the connections between the impedance elements in the cell. The common cell is constructed by connecting the nominally identical two-port impedance elements in a way that the number of possible combinations of the impedance elements is reduced to the subset of all possible combinations that uses the minimum possible number of connections. This structure allows the creation of matched impedances using industry standard devices. The connections between impedance elements are switches that may be “field-programmable,” i.e., that may be set on the chip after manufacture and configured during operation of the circuit, or alternatively may be mask programmable.

In one embodiment, a field programmable gate array (FPGA) includes: at least one programmable logic circuit to execute a function programmed with a bitstream; a self-test circuit to execute a self-test at a first voltage, the self-test and the first voltage programmed with first metadata associated with the bitstream, the self-test including at least one critical path length of the function; and a power controller to identify an operating voltage for the at least one programmable logic circuit based at least in part on the execution of the self-test at the first voltage.

In one embodiment, a field programmable gate array (FPGA) includes: at least one programmable logic circuit to execute a function programmed with a bitstream; a self-test circuit to execute a self-test at a first voltage, the self-test and the first voltage programmed with first metadata associated with the bitstream, the self-test including at least one critical path length of the function; and a power controller to identify an operating voltage for the at least one programmable logic circuit based at least in part on the execution of the self-test at the first voltage.