A method assess the quality of varnished wood surfaces. The method includes the following steps: a) creating a brightness map of the surface, b) creating a curvature map of the surface, c) ascertaining a cross-correlation of brightness map and curvature map, and d) evaluating the result of the cross-correlation to ascertain the proportion of the irregularities of the surface to be attributed to varnish flaws.

Provided are an inspection support device for a structure, an inspection support method for a structure, and a program capable of easily displaying related information from text data included in an inspection record or the like. An inspection support device (10) for a structure including a processor, in which the processor acquires three-dimensional model data (101) of the structure, inspection data (103), and a list of text data of a plurality of inspection points related to an inspection work of the structure, displays the list of text data on a display device (30), receives selection of the text data of at least one inspection point from the displayed list of text data, analyzes the selected text data to extract a corresponding portion (102) on the three-dimensional model data (101) and/or the inspection data (103), which are corresponding to the text data of the inspection point, and displays the extracted corresponding portion (102) on the three-dimensional model data (101) and/or the extracted inspection data (103) on the display device (30).

Provided is a classification condition setting support apparatus including: a basic information storage unit configured to store basic information including basic imaging information and a basic defect type; a classification condition setting unit; a basic defect type classification unit configured to classify the basic imaging information according to the classification condition; a classification result confirmation screen generator configured to generate a classification result confirmation screen including the number of pieces of classification basic imaging information, the basic defect type associated with the classification basic imaging information, and the number of pieces of correct answer basic imaging information, by classifying the target basic imaging information according to the classification condition; and a display unit.

A method for detecting structures is provided. The method can include receiving inspection image data characterizing a region of interest of an object being inspected. The regions of interest can include one or more structures of the object. The method can also include determining, using a computer vision algorithm, a structure within the region of interest with respect to photometric properties of pixel data in the inspection image data. The structure can be determined using a predictive model trained to determine image filter parameter values for image filters of the computer vision algorithm based on applying optimization techniques using training image data and annotation data. An indication of the structure can be provided, for example for display or storage in memory. Systems and computer-readable mediums implementing the method are also provided.

The present invention relates to a method of detecting an edge (or a contour line) of a pattern, which is formed on a workpiece (e.g., a wafer or a mask) for use in manufacturing of semiconductor, from an image generated by a scanning electron microscope. The pattern-edge detection method includes: generating an objective image of a target pattern formed on a workpiece; generating a feature vector representing features of each pixel constituting the objective image; inputting the feature vector to a model constructed by machine learning; outputting, from the model, a determination result indicating whether the pixel having the feature vector is an edge pixel or a non-edge pixel; and connecting a plurality of pixels, each having a feature vector that has obtained a determination result indicating an edge pixel, with a line to generate a virtual edge.

An automatic measuring system containing configurable integrated circuits is able to process information via captured images. The automatic measuring system includes a metering instrument, a camera, a recognition module, and a localization module. The metering instrument has at least one display for visually displaying a number and measures the amount of measurable substance or resources (i.e., electricity and water) consumed. The camera captures an image of the number representing at least a portion the amount of measurable substance. The recognition module is operable to generate a value in response to the image and the coordinates wherein the coordinates are used to decode the image via restoring captured image to the original readout counter value. The localization module is removably or remotely coupled to the camera and operable to generate the coordinates in accordance with the image captured by the camera.

A method and a system are disclosed for detecting the features of a water layer in layered enclosures of single unit dose products. Thanks to the method and the system of the invention, the layered enclosures may be manufactured to higher specifications and quality owing to real time control of the features of the water layer between the enclosure layers. The technical advantage of the method of the invention consists in the possibility to detect the features after formation of the layered enclosure is complete—hence inspecting the finished product—and to feed back the detected information to the very water laying device for a real time adjustment of the features of the water layer at the areas where acceptance criteria are not met.

A processor of the inspection support device acquires an image obtained by imaging a structure to be inspected and detects damage to the structure on the basis of the acquired image. In a case where two or more types of damage (cracking B and linear free lime C.sub.2) to the structure are detected, the processor determines whether or not two or more types of damage are detected from the same or adjacent positions. In a case where determination is made that the cracking B and the linear free lime C.sub.2 are detected from the same or adjacent positions when the processor outputs the damage detection result (a damage image, a damage diagram, and the like), the processor preferentially outputs a damage detection result of the linear free lime C.sub.2 in accordance with a priority of a damage type (FIG. 16A and FIG. 16B).

Methods, systems, and apparatus, including computer programs encoded on computer-storage media, for escape detection and mitigation for aquaculture. In some implementations, a method includes obtaining one or more images that depict one or more fish within a population of fish that are located within an enclosure; providing, to one or more detection models configured to classify fish that are depicted within the images as likely being member or as likely not being member of a type of fish, the one or images; generating, as a result of providing the one or more images to the one or more detection models, a value that reflects a quantity of fish that are depicted in the images that are likely a member of the type of fish; and detecting a condition based at least on the value.

A method for detecting a display panel defect, including: collecting a panel image of a to-be-detected display panel, a plurality of first pixels of the display panel corresponding to a plurality of second pixels in the panel image; converting the panel image into a binary image; dilating each bright spot region in the binary image such that adjacent bright spot regions communicate with each other to form at least one closed communication region in the binary image; determining a region of interest mask image in the binary image in accordance with the at least one closed communication region; determining a region of interest in accordance with the region of interest mask image and the panel image; and performing feature identification on the region of interest to determine a defect of the display panel.