Patent classifications
G06T2211/461
IMPROVED PHASE-CONTRAST AND DARK-FIELD CT RECONSTRUCTION ALGORITHM
A system and related method for signal processing. Interferometric projection data reconstructed into one or more images for a spatial distribution of a physical property of an imaged object. The interferometric projection data is derived from signals acquired by an X-ray detector (D), said signals caused by X-ray radiation after interaction of said X-ray radiation with an interferometer and with the object (OB) to be imaged, said interferometer (IF) having an inter-grating distance. The reconstructor (RECON) configured to perform, based on the projection data and a forward signal model, a reconstruction operation for one or more images in an image domain of a spatial distribution of at least one physical property of said object (OB) including a refractive index, wherein the reconstructor is configured to perform in the reconstruction operation a scaling operation based on the inter-grating distance of the interferometer and/or on a distance of a location in said image domain from said interferometer (IF).
CT IMAGING METHOD OF CORONARY ARTERY AND COMPUTER READABLE STORAGE MEDIUM
Exemplary embodiments of the present invention provide a CT imaging method of coronary artery and a computer-readable storage medium, the method comprising: generating and outputting a global optimal phase image of a coronary artery; and generating and outputting a local optimal phase image of a particular trunk of the coronary artery based on a trunk selection command.
GENERATION OF ARTIFICIAL CONTRAST-ENHANCED COMPUTED TOMOGRAPHY IMAGES
Disclosed herein are systems and methods for generating artificial contrast-enhanced computed tomography (CT) images. An exemplary computer-implemented method involves receiving representations of an examination region of an examination object after administration of a contrast agent. The representations result from CT examination of the examination region at different X-ray energies. The method involves generating a representation of the contrast agent signals on the basis of the received representations (e.g., a signal intensity distribution brought about by the contrast agent in the examination region). The method involves generating a synthetic representation of the examination region comprising an -fold addition of the representation of the contrast agent signals to one of the received representations or to a virtual non-contrast agent representation of the examination region. is a negative or positive real number. The method involves outputting, storing, and/or transmitting the synthetic representation to a separate computer system.
ROBUST RECONSTRUCTION FOR DARK-FIELD AND PHASE CONTRAST CT
A system and related method for signal processing. Interferometric projection data reconstructed into one or more images for a spatial distribution of a physical property of an imaged object. The interferometric projection data is derived from signals acquired by an X-ray detector (D), said signals caused by X-ray radiation after interaction of said X-ray radiation with an interferometer and with the object (OB) to be imaged, said interferometer (IF) having a reference phase. A reconstructor (RECON) reconstructs for the image(s) by fitting said data to a signal model by adapting fitting variables, said fitting variables including i) one or more imaging variables for the one or more images and ii), in addition to said one or more imaging variables, a dedicated phase variable for a fluctuation of said reference phase.
BEAM HARDENING CORRECTION FOR SCANNING DARK FIELD AND PHASE CONTRAST IMAGING
An apparatus and related method for processing image data supplied by a scanning phase contrast or dark-field imaging apparatus (MA). Beam hardening artifact in phase contrast and dark-field imaging can be reduced by applying a beam hardening processing operation by a beam hardening processing module (BHC) in respect of a plurality of detector readings that contribute signals to the same image pixel position or geometric ray of an imaging region of the apparatus (MA). In one embodiment, a phantom body (PB) is used to acquire calibration data on which the beam hardening processing is based.
DARK-FIELD AND PHASE-CONTRAST TOMOGRAPHY RECONSTRUCTION ALGORITHM
A signal processing system (SPS) and related method for tomographic reconstruction of phase contrast or dark-field imagery. An improved weighting model is used to eliminate sensitivity gradient variations to so reduce artifacts is the reconstructed imagery. The system (SPS) is not reliant on iterative reconstruction algorithms. Instead, quicker reconstruction algorithms such as filtered back-projection can be used herein.
System and method for regularized reconstruction of phase contrast computerized tomography
Reconstructing under-sampled PCT data includes obtaining under-sampled scan data of a subject-under-test, the object scan performed on a phase contrast computed tomography (PCT) system, performing a regularized Fourier analysis on the under-sampled scan data, correcting for one or more PCT system contributions to the under-sampled scan data by dividing the computed Fourier coefficients by Fourier coefficients representative of the one or more PCT system contributions, obtaining at least one of an absorption sinogram, a differential phase sinogram, and a dark field sinogram from the corrected Fourier coefficients, and performing tomographic reconstruction on the obtained absorption sinogram, the obtained differential phase sinogram, and the obtained dark field sinogram. A system and non-transitory computer readable medium are also disclosed.
SYSTEM AND METHOD FOR REGULARIZED RECONSTRUCTION OF PHASE CONTRAST COMPUTERIZED TOMOGRAPHY
Reconstructing under-sampled PCT data includes obtaining under-sampled scan data of a subject-under-test, the object scan performed on a phase contrast computed tomography (PCT) system, performing a regularized Fourier analysis on the under-sampled scan data, correcting for one or more PCT system contributions to the under-sampled scan data by dividing the computed Fourier coefficients by Fourier coefficients representative of the one or more PCT system contributions, obtaining at least one of an absorption sinogram, a differential phase sinogram, and a dark field sinogram from the corrected Fourier coefficients, and performing tomographic reconstruction on the obtained absorption sinogram, the obtained differential phase sinogram, and the obtained dark field sinogram. A system and non-transitory computer readable medium are also disclosed.
Iterative reconstruction scheme for phase contrast tomography
A method of tomographic imaging the real part of the refractive index of the internal structure of an image volume and a corresponding apparatus for performing the method. The method includes a two-step process of first retrieving phase projections of an image volume from projective intensity measurements through the image volume. The second step of the method includes iterative image reconstruction of an image of the image volume using phase projections taken at multiple projection angles. The first step of intensity measurements and subsequent phase retrieval can use one of many possible phase retrieval methods including the Bronnikov phase retrieval method. The second step of iterative image reconstruction can be performed using the total variation minimization method, the algebraic reconstruction technique method, or any other iterative image reconstruction method.
Method and apparatus for fault isolation, computer device, medium and program product
A method for fault isolation includes: acquiring a thermal imaging picture of a surface of a to-be-tested chip, the thermal imaging picture being obtained by scanning the to-be-tested chip to which a test signal is applied through an infrared thermal imaging device, and analyzing the thermal imaging picture to obtain a phase angle of each point on the surface of the to-be-tested chip; acquiring a three-dimensional image of the surface of the to-be-tested chip, the three-dimensional image being obtained by scanning the to-be-tested chip to which the test signal is applied through an image scanning device, and analyzing the three-dimensional image to obtain a three-dimensional coordinate of each point on the surface of the to-be-tested chip; calculating a three-dimensional coordinate of the fault in the to-be-tested chip according to the phase angle and the three-dimensional coordinate of each point on the surface of the to-be-tested chip.