Patent classifications
G06V2201/121
Overlapping pattern projector
An optoelectronic device includes a semiconductor substrate, an array of optical emitters arranged on the substrate in a two-dimensional pattern, a projection lens and a diffractive optical element (DOE). The projection lens is mounted on the semiconductor substrate and is configured to collect and focus light emitted by the optical emitters so as to project optical beams containing a light pattern corresponding to the two-dimensional pattern of the optical emitters on the substrate. The DOE is mounted on the substrate and is configured to produce and project multiple overlapping replicas of the pattern.
SYSTEMS, METHODS AND, MEDIA FOR DETERMINING OBJECT MOTION IN THREE DIMENSIONS USING SPECKLE IMAGES
In accordance with some embodiments, systems, methods and media for determining object motion in three dimensions using speckle images are provided. In some embodiments, a system for three dimensional motion estimation is provided, comprising: a light source; an image sensor; and a hardware processor programmed to: cause the light source to emit light toward the scene; cause the image sensor to capture a first defocused speckle image of the scene at a first time and capture a second defocused speckle image of the scene at a second time; generate a first scaled version of the first defocused image; generate a second scaled version of the first defocused image; compare each of the first defocused image, the first scaled version, and the second scaled version to the second defocused image; and determine axial and lateral motion of the object based on the comparisons.
System and Method for Adaptive Range 3D Scanning
A scanner system is configured for acquiring three dimensional image information of an object. The scanner includes a projector, a camera, a graphics processing device, and a processor. The projector projects one of several pre-defined patterns upon the object. The camera captures an image from the object, which is received by the processor. The processor approximates mutual information from the object and the pattern using the graphics processing device, and selects a second pattern for projecting on the object.
DEPTH PROCESSING SYSTEM CAPABLE OF CAPTURING DEPTH INFORMATION FROM MULTIPLE VIEWING POINTS
A depth processing system includes a plurality of depth capturing devices and a host. The depth capturing devices are disposed around a specific region, and each generates a piece of depth information according to its own corresponding viewing point. The host combines a plurality of pieces of depth information generated by the plurality of depth capturing devices to generate a three-dimensional point cloud corresponding to the specific region according a relative space status of the plurality of depth capturing devices.
Method and Apparatus for Measuring 3Dimensional Structures
A method and apparatus for the generation of 3Dimensional data for an object consisting of one or more light projection systems, a means of generating a light pattern or structure, one or more sensors for observing the reflected light, one or more sensors for registering position, one or more calibration methods for rationalizing the data, and one or more algorithms for automatically analyzing the data to reproduce the 3D structure.
Video motion capture for wireless gaming
Embodiments of the present invention embody motion detection via a camera for mobile platform video gaming and exercise, in either integrated or separately attachable components. The system includes an oral care device. The oral care device, such as a toothbrush, includes one or more targets. Each target designates a specific area of the toothbrush, such as back side, a front side, a brush head or a brush end. A target can be a color or a tag, and can be removably coupled or integrally formed with the toothbrush. The system also includes an application configured to detect the targets, to determine that a property of any of the targets has changed. Based on at least the determination, the application is configured to monitor progress of brushing and to control an element in the application.
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND PROGRAM
The present disclosure relates to an information processing device, an information processing method, and a program that are capable of estimating the self-position by accurately and continuously estimating the self-movement. The information processing device according to an aspect of the present disclosure includes a downward imaging section and a movement estimation section. The downward imaging section is disposed on the bottom of a moving object traveling on a road surface and captures an image of the road surface. The movement estimation section estimates the movement of the moving object in accordance with a plurality of images representing the road surface and captured at different time points by the downward imaging section. The present disclosure can be applied, for example, to a position sensor mounted in an automobile.
IMAGE RECOGNITION DEVICE AND IMAGE RECOGNITION METHOD
An image recognition device includes: a camera unit that generates a distance signal and a luminance signal using reflected light from a plurality of subjects; an image generator that generates a range image from the distance signal and generates a luminance image from the luminance signal; and an image recognition processor that performs image recognition. The image recognition processor divides each of the range image and the luminance image into a plurality of regions, makes a determination, for each of the plurality of regions, as to whether the regions is a first region in which a specific object is clearly not present or a second region other than the first region, and performs image recognition processing on, among the plurality of regions, one or more regions other than the first region.
Method, computer program product and measuring system for operating a triangulation laser scanner to identify properties of a surface of a workpiece to be measured
A method, a computer program product and a measuring system are provided for operating a triangulation laser scanner to identify surface properties of a workpiece. The scanner has a CMOS sensor chip, an imaging optical unit, and a laser line light source configured to generate a laser line on the workpiece in compliance with a Scheimpflug condition. Data generated on the sensor chip is reduced to an amount of data only including actual lateral positions of image points of the laser line and a quality criterion for each of the image points. The quality criterion is a measure of an intensity distribution along a direction transverse to a local direction of extent of the image points of the laser line on the sensor chip and the reduced amount of data is analyzed with respect to the quality criterion regarding a presence of barcode and/or detection code information and/or texture information.
Overlapping pattern projector
An optoelectronic device includes a semiconductor substrate, an array of optical emitters arranged on the substrate in a two-dimensional pattern, a projection lens and a diffractive optical element (DOE). The projection lens is mounted on the semiconductor substrate and is configured to collect and focus light emitted by the optical emitters so as to project optical beams containing a light pattern corresponding to the two-dimensional pattern of the optical emitters on the substrate. The DOE is mounted on the substrate and is configured to produce and project multiple overlapping replicas of the pattern.