A device and method for detecting a film thickness are provided. The device includes: a common electrode, a detection electrode, a common electrode voltage generating circuit, and a detection electrode signal processing circuit. A detection channel for a film to be detected is formed between a first common surface and a first detection surface. The common electrode voltage generating circuit is configured to generate a voltage on the common electrode, as to induce an effective signal voltage on the detection electrode. The detection electrode signal processing circuit includes: a reset voltage time sequence control circuit, a time sequence control circuit for transferring the effective signal voltage on the detection electrode and a differential amplifier.

A device and method for detecting a film thickness are provided. The device includes: a common electrode, a detection electrode, a common electrode voltage generating circuit, and a detection electrode signal processing circuit. A detection channel for a film to be detected is formed between a first common surface and a first detection surface. The common electrode voltage generating circuit is configured to generate a voltage on the common electrode, as to induce an effective signal voltage on the detection electrode. The detection electrode signal processing circuit includes: a reset voltage time sequence control circuit, a time sequence control circuit for transferring the effective signal voltage on the detection electrode and a differential amplifier.

Disclosed is a film thickness detection device, including a common unit (1) and a detection unit (2); the common unit (1) comprises at least one common electrode (11); the detection unit (2) comprises at least one sensor chip (21) and a signal processing unit (23); the sensor chips (21) are opposite to the common unit (1) in a first direction and are arranged at intervals; the spaces between the common unit (1) and the sensor chips (21) form a transport channel for a to-be-tested film; each of the sensor chips (21) comprises at least one row of multiple detection electrodes (211) arranged along a second direction; the second direction is perpendicular to a moving direction of the to-be-tested film; the first direction is perpendicular to a first plane; the first plane is parallel to the second direction; the sensor chips (21) are configured to induce electrical signals on the common electrodes (11) and output the electrical signals; and the signal processing unit (23) is electrically connected with the sensor chips (21), processes the electrical signals output by the sensor chips (21) and outputs the electrical signals.

Disclosed is a film thickness detection device, including a common unit (1) and a detection unit (2); the common unit (1) comprises at least one common electrode (11); the detection unit (2) comprises at least one sensor chip (21) and a signal processing unit (23); the sensor chips (21) are opposite to the common unit (1) in a first direction and are arranged at intervals; the spaces between the common unit (1) and the sensor chips (21) form a transport channel for a to-be-tested film; each of the sensor chips (21) comprises at least one row of multiple detection electrodes (211) arranged along a second direction; the second direction is perpendicular to a moving direction of the to-be-tested film; the first direction is perpendicular to a first plane; the first plane is parallel to the second direction; the sensor chips (21) are configured to induce electrical signals on the common electrodes (11) and output the electrical signals; and the signal processing unit (23) is electrically connected with the sensor chips (21), processes the electrical signals output by the sensor chips (21) and outputs the electrical signals.

Disclosed are systems and methods for modifying a counterfeit template and tracking a counterfeit note. The systems and methods may include receiving properties of a plurality of counterfeit notes and modifying a counterfeit template using the properties of the plurality of counterfeit notes. The systems and methods also may include receiving a counterfeit note, collecting data from the counterfeit note, and receiving a request for the data collected from the counterfeit note.

An apparatus and a corresponding method for checking value documents, involves at least one first sensor configured to detect electromagnetic radiation reflected and/or transmitted by a value document and to convert the radiation into corresponding first sensor signals. At least one second sensor is configured to detect sound waves reflected and/or transmitted by the value document and to convert the sound waves into corresponding second sensor signals, and an evaluation device configured to determine a first area value which characterizes a first area of the value document on the basis of the first sensor signals, to determine a second area value which characterizes a second area of the value document on the basis of the second sensor signals, and to infer a possible identification marking of the value document with a marking ink on the basis of the first and second area value.

An apparatus and a corresponding method for checking value documents, involves at least one first sensor configured to detect electromagnetic radiation reflected and/or transmitted by a value document and to convert the radiation into corresponding first sensor signals. At least one second sensor is configured to detect sound waves reflected and/or transmitted by the value document and to convert the sound waves into corresponding second sensor signals, and an evaluation device configured to determine a first area value which characterizes a first area of the value document on the basis of the first sensor signals, to determine a second area value which characterizes a second area of the value document on the basis of the second sensor signals, and to infer a possible identification marking of the value document with a marking ink on the basis of the first and second area value.

A security document has a security substrate, a security device and a structural weakness element, wherein the security device is coupled to the security substrate, wherein the structural weakness element is integrated with at least one of the security substrate or the security device, the structural weakness element defining an anti-harvesting area and a bulk area, and wherein the anti-harvesting area has one or more of structural fidelity or optical fidelity with the bulk area.

A security document has a security substrate, a security device and a structural weakness element, wherein the security device is coupled to the security substrate, wherein the structural weakness element is integrated with at least one of the security substrate or the security device, the structural weakness element defining an anti-harvesting area and a bulk area, and wherein the anti-harvesting area has one or more of structural fidelity or optical fidelity with the bulk area.

A paper sheet handling apparatus includes a stacking unit which allows paper sheets transported by a transport unit to be stacked therein in alignment with faces of an adjacent pair of the paper sheets being in contact with each other. A recognition unit recognizes which of a face or back of each of the paper sheets transported faces up, and how each of the paper sheets is oriented. A controller classifies the paper sheets into a plurality of types different in thickness distribution based on the result of recognition, manages the number of paper sheets of each type stacked in the stacking unit, and makes a determination whether to permit the stacking of the paper sheets in the stacking unit based on the type of the paper sheets recognized by the recognition unit, and the number of paper sheets of each type that have been stacked in the stacking unit.