A method of testing anti-high temperature performance of a magnetic head comprises applying a plurality of second magnetic fields with different intensities in a second direction to the magnetic head, and measuring a second output parameter curve, and judging whether a variation that is beyond an allowable value is presented on the second output parameter curve, therein the second direction passes through the ABS and at an angle whose absolute value is an acute angle to the ABS. The present invention can screen out defective magnetic heads that possess poor anti-high temperature performance without heating the magnetic head.

A data storage device testing system may be configured with at least a test slot, a loader assembly, and an exchange assembly. The loader assembly can be positioned to respectively engage and disengage a test deck with the test slot. The exchange assembly may be configured to open an access port portion of the test deck and subsequently replace a tested data storage component housed within the first test deck with an untested data storage component.

A method and apparatus are directed to providing relative movement between a slider configured for heat-assisted magnetic recording and a magnetic recording medium, and causing protrusion of a portion of an air bearing surface (ABS) of the slider in response to activating at least a laser source while maintaining spacing between the protrusion and the medium. A magnitude of at least a portion of the protrusion is measured while maintaining spacing between the protrusion and the medium.

An apparatus comprises a spindle to rotate a magnetic recording medium and a magnetic field generator to expose a track of the medium to a DC magnetic field. The magnetic field generator is configured to saturate the track during an erase mode and reverse the DC magnetic field impinging the track during a writing mode. A laser arrangement heats the track during the erase mode and, during the writing mode, heats the track while the track is exposed to the reversed DC magnetic field so as to write a magnetic pattern thereon. A reader reads the magnetic pattern and generates a read signal. A processor is coupled to the reader and configured to measure one or more magnetic properties of the track using the read signal. The apparatus can further comprise a Kerr sensor that generates a Kerr signal using the magnetic pattern.