A memory device may include a memory cell array including a plurality of memory cells and a compensation resistor electrically connected to the memory cell array. The compensation resistor may generate a cell current compensating for a voltage drop generated in a parasitic resistor of a signal line connected to at least one memory cell of the plurality of memory cells. The compensation circuit may control a magnitude of resistance of a compensation resistor upon receiving an address corresponding to the memory cell. The compensation circuit may increase a magnitude of the cell current based on adjusting the magnitude of resistance of the compensation resistor to be substantially equal to a resistance value of the parasitic resistor.

A method is presented for mitigating conductance drift in intercalation cells for neuromorphic computing. The method includes forming a first electro-chemical random access memory (ECRAM) structure over a substrate and forming a second ECRAM over the substrate, the first and second ECRAMs sharing a common contact. The common contact can be either a source contact or a drain contact. Each of the first and second ECRAMs can include a tungsten oxide layer, an electrolyte layer, and a gate contact.

According to one embodiment, a storage device includes: a memory cell including a storage component to which a plurality of data values are allowed to set in response to a plurality of resistance values of the storage component and a selector connected in series to the storage component; a word line configured to provide a signal to select the memory cell; a bit line configured to receive a data signal from the memory cell; a first conversion circuit configured to nonlinearly convert a first current, generated in response to the data signal input to the bit line, into a first voltage; and a comparison circuit configured to compare the first voltage, converted by the first conversion circuit, with a plurality of reference voltages.

A detection circuit that can detect a two-terminal memory cell changing state. For example, in response to electrical stimuli, a memory cell will change state, e.g., to a defined higher resistance state or a defined lower resistance state. Other, techniques do not detect this state change until after the stimuli is completed and a subsequent sensing operation (e.g., read pulse) is performed. The detection circuit can detect the state change during application of the electrical stimuli that cause the state change and can do so by comparing the magnitudes or values of two particular current parameters.

According to one embodiment, a storage device includes: a memory cell including a storage component to which a plurality of data values are allowed to set in response to a plurality of resistance values of the storage component and a selector connected in series to the storage component; a word line configured to provide a signal to select the memory cell; a bit line configured to receive a data signal from the memory cell; a first conversion circuit configured to nonlinearly convert a first current, generated in response to the data signal input to the bit line, into a first voltage; and a comparison circuit configured to compare the first voltage, converted by the first conversion circuit, with a plurality of reference voltages.

Memory sense amplifiers and memory verification methods are described. According to one aspect, a memory sense amplifier includes a first input coupled with a memory element of a memory cell, wherein the memory element has different memory states at different moments in time, a second input configured to receive a reference signal, modification circuitry configured to provide a data signal at the first input from the memory element having a plurality of different voltages corresponding to respective ones of different memory states of the memory cell at the different moments in time, and comparison circuitry coupled with the modification circuitry and configured to compare the data signal and the reference signal at the different moments in time and to provide an output signal indicative of the memory state of the memory cell at the different moments in time as a result of the comparison to implement a plurality of verify operations of the memory states of the memory cell at the different moments in time.

A programmable integrated circuit includes: a crossbar switch constituted of a plurality of first wires arranged in a first direction, a plurality of second wires arranged in a second direction intersecting the first direction, and resistance change type elements connecting the first wires and the second wires; an output buffer group constituted of at least two output buffers operating with different drive powers; and a logic circuit group constituted of at least one logic circuit connected to an output of the second wire. The output buffers in the output buffer group is connected to an input of any one of a plurality of the first wires.

A device for performing a multiplication of a matrix with a vector. The device comprises a plurality of memory elements, a signal generator and a readout circuit. The signal generator is configured to apply programming signals to the memory elements. The signal generator is further configured to control a first signal parameter of the programming signals in dependence on matrix elements of the matrix and to control a second signal parameter of the programming signals in dependence on vector elements of the vector. The readout circuit is configured to read out memory values of the memory elements. The memory values represent result values of vector elements of a product vector of the multiplication. The memory elements may be in particular resistive memory elements or photonic memory elements. Additionally there is provided a related method and design structure for performing the multiplication of a matrix with a vector.

Embodiments of the present disclosure provide a memcapacitor, a programming method for a memcapacitor and a capacitive random access memory. The memcapacitor includes: a source electrode made of a metal material; a first dielectric layer disposed at an outer side of the source electrode in a horizontal direction; a programming electrode disposed at an outer side of the first dielectric layer in the horizontal direction; a second dielectric layer disposed at an upper surface of the source electrode and an upper surface of the first dielectric layer; and a reading electrode disposed at an upper surface of the second dielectric layer, where the reading electrode, the second dielectric layer and the source electrode form a capacitor.

Disclosed are methods, systems and devices for operation of memory device. In one aspect, a bitcell may represent a binary value, symbol, parameter or condition based on complementary impedance states of first and second memory elements. In one aspect, a first bitline and a second bitline may be coupled to terminals of the first and second memory elements. A circuit may detect the complementary impedance states responsive to a difference in a rates of charging of the first and second bitlines.