A memory device includes pages arranged in columns and each constituted by a plurality of memory cells on a substrate, voltages applied to a first gate conductor layer, a second gate conductor layer, a first impurity layer, and a second impurity layer in each memory cell included in each of the pages are controlled to perform a page write operation of retaining, inside a channel semiconductor layer, a group of positive holes generated by an impact ionization phenomenon or by a gate-induced drain leakage current, the voltages applied to the first gate conductor layer, the second gate conductor layer, the first impurity layer, and the second impurity layer are controlled to perform a page erase operation of discharging the group of positive holes from inside the channel semiconductor layer, the first impurity layer of the memory cell is connected to a source line, the second impurity layer thereof is connected to a bit line, one of the first gate conductor layer or the second gate conductor layer is connected to a word line, and the other of the first gate conductor layer or the second gate conductor layer is connected to a first driving control line, the bit line is connected to a sense amplifier circuit with a first switch circuit therebetween, and in a page refresh operation, page data in a first group of memory cells belonging to a first page is read to the sense amplifier circuits, the first switch circuit is put in a non-conducting state, the page erase operation of the first group of memory cells is performed, the first switch circuit is put in a conducting state, and the page write operation of writing the page data in the sense amplifier circuits back to the first group of memory cells is performed.

A memory device includes a plurality of pages arranged in columns, each page is constituted by a plurality of memory cells arranged in rows on a substrate, the memory cells included in the page are memory cells of a plurality of semiconductor base materials that stand on the substrate in a vertical direction or that extend in a horizontal direction along the substrate, voltages applied to a first gate conductor layer, a second gate conductor layer, a first impurity layer, and a second impurity layer in each memory cell are controlled to perform a page write operation of retaining, inside a channel semiconductor layer, a group of positive holes generated by an impact ionization phenomenon or by a gate-induced drain leakage current, the voltages applied to the first gate conductor layer, the second gate conductor layer, the first impurity layer, and the second impurity layer are controlled to perform a page erase operation of discharging the group of positive holes from inside the channel semiconductor layer, and all memory cells included in a first page subjected to the page erase operation perform the page write operation at least once.

A storage device includes a power supply device including an auxiliary power supply device providing auxiliary power, configured to generate a deterioration monitoring signal indicating a degree of deterioration of the auxiliary power supply device, and configured to generate an output voltage based on external power or the auxiliary power; and a main system configured to operate based on the output voltage and perform a dump operation for backing up data in a sudden power off (SPO) situation, wherein the main system compares the degree of deterioration of the auxiliary power supply device with a preset reference value in response to the deterioration monitoring signal, and generates a voltage scaling command for controlling the power supply device to convert an average voltage level of the output voltage to a dynamic voltage scaling (DVS) level based on a result of the comparison.

Memory controllers, devices, modules, systems and associated methods are disclosed. In one embodiment, a memory system is disclosed. The memory system includes volatile memory configured as a cache. The cache stores first data at first storage locations. Backing storage media couples to the cache. The backing storage media stores second data in second storage locations corresponding to the first data. Logic uses a presence or status of first data in the first storage locations to cease maintenance operations to the stored second data in the second storage locations.

Some embodiments include apparatuses in which one of such apparatus includes a first memory cell including a first transistor having a first channel region coupled between a data line and a conductive region, and a first charge storage structure located between the first data line and the conductive region, and a second transistor having a second channel region coupled to and located between the first data line and the first charge storage structure; a second memory cell including a third transistor having a third channel region coupled between a second data line and the conductive region, and a second charge storage structure located between the second data line and the conductive region, and a fourth transistor having a fourth channel region coupled to and located between the second data line and the second charge storage structure; a conductive line forming a gate of each of the first, second, third, and fourth transistors; and a conductive structure located between the first and second charge storage structures and electrically separated from the conductive region.

Disclosed are fusion memory devices and methods of fabricating the same. The fusion memory device comprises a first memory device including a first substrate having active and inactive surfaces opposite to each other and a first memory cell circuit on the active surface of the first substrate, a non-memory device including a second substrate having active and inactive surfaces opposite to each other and a non-memory circuit on the active surface of the second substrate, the non-memory device being provided on the first memory device, and a second memory device on the inactive surface of the second substrate and including a second memory cell circuit different from the first memory cell circuit. The non-memory device lies between the first and second memory cell circuits and controls an electrical operation of each of the first and second memory cell circuits.

A storage device includes a module substrate extending in one direction, a non-volatile memory device mounted on the module substrate, a controller mounted on the module substrate, a first connector disposed at a first end of the module substrate and through which data stored in the non-volatile memory device is input/output, and a power management integrated circuit configured to control supplying of power to the controller and the non-volatile memory device. The controller is configured such that in response to a first level signal received from the first connector, the controller connects the non-volatile memory device to the first connector, and then control, after connecting the non-volatile memory device to the first connector, the power management integrated circuit to cut off supplying of the power to the controller.

A memory device includes a page made of a plurality of memory cells arranged in rows on a substrate. A page write operation is performed, during which, in each of the memory cells included in the page, a first voltage V1 is applied to a first drive control line PL, a second voltage V2 is applied to a word line WL, a third voltage V3 is applied to a source line SL, a fourth voltage V4 is applied to a bit line BL, a group of holes generated by an impact ionization phenomenon is retained in an inside of the channel semiconductor layer. A page erase operation is performed, during which the voltages to be applied to the first drive control line PL, the word line WL, the source line SL, and the bit line BL are controlled to discharge the group of holes from the inside of the channel semiconductor layer, and the voltage of the channel semiconductor layer is decreased. A page read operation is performed, during which a fifth voltage V5 that is lower than the first voltage V1 is applied to the first drive control line PL, a sixth voltage V6 that is lower than the second voltage V2 is applied to the word line WL, the third voltage V3 is applied to the source line, and a seventh voltage V7 that is lower than the fourth voltage V4 is applied to the bit line.

A storage device includes a main system; a power loss protection integrated circuit (PLP IC) configured to provide output power to the main system based on external or internal power; and an auxiliary power supply configured to provide the internal power to the PLP IC. The main system may operate in a dump mode where data is backed up in response to at least one of a first condition or a second condition being satisfied. The PLP IC may provide the output power based on the internal power in response to a sudden power off (SPO) occurring. The first condition is satisfied when the SPO occurs and an SPO time is longer than a maximum filtering time. The second condition is satisfied when the SPO occurs and a voltage level of the internal power provided by the auxiliary power supply is lower than a voltage level of a threshold voltage.

Disclosed is a dual inline memory module with temperature-sensing scenario modes. A plurality of volatile memory components and an EEPROM component are disposed on a module board. A plurality of LED components and a scenario-lighting controller are disposed at a radiant side of the module board. A light bar is located at the radiant side of the module board without direct installing relationship. A plurality of clamping-type heat spreaders are fastened to one another in a manner that the light bar is tightly clamped. Therein, the power of the scenario-lighting controller component is shared and linked with the power supply system of the LED components and the signals of the scenario-lighting controller component are shared and linked with the signal connection system of the EEPROM component. Accordingly, the lighting scenario performances controlled by the scenario-lighting controller accord with the sensing temperatures to adjust memory refreshing frequencies to avoid any incorrect performance caused by sensed temperature differences.