Providing for a configuration cells for junction nodes of a field programmable gate array (FPGA) is described herein. By way of example, a configuration cell can comprise non-volatile resistive switching memory to facilitate programmable storage of data as an input to a control circuit of a junction node. The control circuit can activate or deactivate a junction node of the FPGA in response to a value of the data stored in the non-volatile resistive switching memory. The control circuit can comprise an SRAM circuit for fast operation of the junction node. Moreover, the non-volatile memory of the configuration cell facilitates fast power-up of the control circuit utilizing data stored in the resistive switching memory, and minimizes power consumption associated with storing the data.

Described is an apparatus including memory cell with retention using resistive memory. The apparatus comprises: memory element including a first inverting device cross-coupled to a second inverting device; a restore circuit having at least one resistive memory element, the restore circuit coupled to an output of the first inverting device; a third inverting device coupled to the output of the first inverting device; a fourth inverting device coupled to an output of the third inverting device; and a save circuit having at least one resistive memory element, the save circuit coupled to an output of the third inverting device.

The present disclosure provides embodiments for methods and memory devices. One embodiment of a memory device includes a first volatile memory cell having a first volatile access transistor with a current electrode coupled with a first volatile bit line; a first non-volatile memory cell having a first non-volatile access transistor with a current electrode coupled with a first non-volatile bit line; and a transfer circuit coupled between the first volatile bit line and the first non-volatile bit line. The transfer circuit is configured to: couple data latched from the first volatile bit line with the first non-volatile bit line during a store operation, and couple the first volatile bit line with the first non-volatile bit line during a restore operation.

Technology for a system is described. The system can include one or more processors. The system can include a memory associated with the one or more processors. The system can include a memory controller comprising logic to create a reserved memory region in a system physical address (SPA) map. The memory controller can comprise logic to detect when the one or more processors are brought online. The memory controller can comprise logic to map the memory associated with the one or more processors that are brought online to the reserved memory region in the SPA map.

Various embodiments comprise devices to manage multiple memory types and reconfigure partitions in a memory device as directed by a host. In one embodiment, the apparatus is to manage commands through a first interface controller to mapped portions of a first memory not having an attribute enhanced set, and map portions of a second memory having the attribute enhanced set through a second interface controller. Additional devices are described.

According to one embodiment of the present disclosure, a device comprises a latching circuitry, where the latching circuitry comprises at least one correlated electron random access memory (CeRAM) element. The latching circuitry further comprises a control circuit coupled to the at least one CeRAM element. The control circuit is configured to receive at least one control signal. Based on the at least one control signal, perform at least one of storing data into the latching circuitry and outputting data from the latching circuitry.

A state-retaining logic cell may include a plurality of inverters, an output node non-volatile (NVM) storage cell, and an input node NVM storage cell. The plurality of inverters may include a feed-forward inverter and a feed-back inverter disposed in a back-to-back arrangement. The output node NVM storage cell may include first and second terminals, where the first terminal is connected adjacent an output node of the feed-forward and the feed-back inverters, and the second terminal is connected to a programming rail. The input node NVM storage cell may include first and second terminals, where the first terminal is connected adjacent an input node of the feed-forward and the feed-back inverters, and the second terminal is connected to the programming rail.

A memory cell includes a first bidirectional resistive memory element (BRME), and a second BRME, a first storage node, and a second storage node. A resistive memory write to the cell includes placing the first BRME and the second BRME in complementary resistive states indicative of the value being written. During a subsequent restoration operation, the value as written in the first BRME and second BRME is written to the first storage node and the second storage node while a wordline connected to the memory cell is deasserted.

A non-volatile static random access memory has an operating mode, a data backup mode and a data restore mode. The non-volatile static random access memory includes a memory cell and a power saving module. The memory cell includes a latch, a set of latch switch units, a set of backup memory units, a set of backup activation units, a backup setting unit and a driving signal transmission unit. The power saving module includes a control switch unit, a backup determination unit and a restore switch unit. When backup data is different from data stored in the latch, a backup driving signal is generated by a node voltage of the backup memory units and outputted to a backup determination unit, which drives the backup setting unit to turn on according to the backup driving signal, so as to change the backup data in the backup memory units and ensure correct backup.

A non-volatile memory (NVM) device includes a logic memory circuit, a NVM element, a writing circuit and a reading circuit. The input terminal of the writing circuit and the output terminal of the reading circuit are coupled to the output terminal of the logic memory circuit. The first output terminal of the writing circuit and the first input terminal of the reading circuit are coupled to the first terminal of the NVM element. The second output terminal of the writing circuit and the second input terminal of the reading circuit are coupled to the second terminal of the NVM element. During a writing period, the writing circuit writes the stored data of the logic memory circuit into the NVM element. During a reading period, the reading circuit restores the data of the NVM element to the output terminal of the logic memory circuit.