Patent classifications
G11C15/043
Search circuits, hammer address management circuits, and memory systems including the same
A search circuit includes a content-addressable memory (CAM) including a plurality of CAM cells configured to store a plurality of entry data, each entry data including a first bit corresponding to a least significant bit through a K-th bit corresponding to a most significant bit, the CAM configured to provide a plurality of matching signals indicating whether each of the plurality of entry data matches searching data, and a CAM controller configured to perform a partial searching operation such that the CAM controller applies comparison bits corresponding to a portion of the first through K-th bits as the searching data to the CAM and searches for target entry data among the plurality of entry data based on the plurality of matching signals indicating that the corresponding bits of the target entry data match the comparison bits.
Memory Device Comprising An Electrically Floating Body Transistor
A memory cell comprising includes a silicon-on-insulator (SOI) substrate, an electrically floating body transistor fabricated on the silicon-on-insulator (SOI) substrate, and a charge injector region. The floating body transistor is configured to have more than one stable state through an application of a bias on the charge injector region.
APPARATUSES, SYSTEMS, AND METHODS FOR ANALOG ROW ACCESS RATE DETERMINATION
Embodiments of the disclosure are drawn to apparatuses, systems, and methods for analog row access rate determination. Accesses to different row addresses may be tracked by storing one or more received addresses in a slice of stack. Each slice includes an accumulator circuit which provides a voltage based on charge on a capacitor. When a row address is received, it may be compared to the row addresses stored in the stack, and if there is a match, the charge on the capacitor in the associated accumulator circuit is increased. Each slice may also include a voltage to time (VtoT) circuit which may be used to identify the highest of the voltages provided by the accumulator circuits. The row address stored in the slide with the highest voltage may be refreshed.
APPARATUSES, SYSTEMS, AND METHODS FOR A CONTENT ADDRESSABLE MEMORY CELL
Embodiments of the disclosure are drawn to apparatuses and methods for content addressable memory (CAM) cells. Each CAM cell may include a comparator portion which stores a bit of information. Each CAM cell may also include a comparator portion, which compares an external bit to the stored bit. A group of CAM cells may be organized into a CAM register, with each CAM cell coupled in common to a signal line. Any of the CAM cells may change a voltage on the signal line if the external bit does not match the stored bit.
Memory device comprising an electrically floating body transistor
A memory cell comprising includes a silicon-on-insulator (SOI) substrate, an electrically floating body transistor fabricated on the silicon-on-insulator (SOI) substrate, and a charge injector region. The floating body transistor is configured to have more than one stable state through an application of a bias on the charge injector region.
TERNARY IN-MEMORY ACCELERATOR
A ternary processing cell used as a memory cell and capable of in-memory arithmetic is disclosed which includes a first memory cell, adapted to hold a first digital value, a second memory cell, adapted to hold a second digital value, wherein a binary combination of the first digital value and the second digital value establishes a first ternary operand, a ternary input establishing a second ternary operand, and a ternary output, wherein the ternary output represents a multiplication of the first ternary operand and the second ternary operand.
APPARATUS AND METHOD INCLUDING ANALOG ACCUMULATOR FOR DETERMINING ROW ACCESS RATE AND TARGET ROW ADDRESS USED FOR REFRESH OPERATION
Embodiments of the disclosure are drawn to apparatuses, systems, and methods for analog row access rate determination. Accesses to different row addresses may be tracked by storing one or more received addresses in a slice of stack. Each slice includes an accumulator circuit which provides a voltage based on charge on a capacitor. When a row address is received, it may be compared to the row addresses stored in the stack, and if there is a match, the charge on the capacitor in the associated accumulator circuit is increased. Each slice may also include a voltage to time (VtoT) circuit which may be used to identify the highest of the voltages provided by the accumulator circuits. The row address stored in the slide with the highest voltage may be refreshed.
Content addressable memory
A TCAM (Ternary Content Addressable Memory) according to the embodiment includes repeaters in a delay path for controlling the timing in the replica circuit that defines the timing of matching. According to the above configuration, the TCAM which consumes low power and operates at high speed can be realized.
Apparatus and method including analog accumulator for determining row access rate and target row address used for refresh operation
Embodiments of the disclosure are drawn to apparatuses, systems, and methods for analog row access rate determination. Accesses to different row addresses may be tracked by storing one or more received addresses in a slice of stack. Each slice includes an accumulator circuit which provides a voltage based on charge on a capacitor. When a row address is received, it may be compared to the row addresses stored in the stack, and if there is a match, the charge on the capacitor in the associated accumulator circuit is increased. Each slice may also include a voltage to time (VtoT) circuit which may be used to identify the highest of the voltages provided by the accumulator circuits. The row address stored in the slide with the highest voltage may be refreshed.
SRAM with error correction in retention mode
A method for storing information in SRAM bit cell arrays provides for lowering voltage supplied to the SRAM bit cell arrays, with voltage lowering controlled by a connected voltage control circuit. Writing, reading, and correcting information storable in the SRAM bit cell arrays is accomplished using an error correcting code (ECC) block connected to at least some of the SRAM bit cell arrays. The ECC block is configurable to repair stored information.