A memory device to determine a voltage optimized to read a group of memory cells by reading the group of memory cells at a plurality of test voltages, computing bit counts at the test voltages respectively, and computing count differences in the bit counts for pairs of adjacent voltages in the test voltages. When a smallest one in the count differences is found at a side of a distribution of the count differences according to voltage, the memory device is configured to determine a location of an optimized read voltage, based on a ratio between a first count difference and a second count difference, where the first count difference is the smallest in the count differences, and the second count difference is closest in voltage to the first count difference.

According to an embodiment, a memory controller obtains first data in a first page using a first voltage, obtains a first shift amount based on a first and second number. The first and second numbers represent numbers of bits each of which has different values in a first and second manner between the first data and first expected data. The controller obtains second data in the second page using a second voltage and a second shift amount, and obtains a third shift amount based on a third and fourth number, the third and fourth numbers respectively represent numbers of bits each of which has different values in the first and second manner between the second data and second expected data.

Embodiments relate to improving the biasing of active electronic components such as, for example, sense amplifiers. Embodiments include an adjustable bias signal generator that receives a reference signal as an input and generates a corresponding bias signal as an output. The adjustable bias signal generator may comprise a voltage driver and capacitor divider circuitry. In some embodiments, the capacitor divider circuitry is configurable by selecting specific capacitor dividers using a digital code. In other embodiments, the voltage driver is adjustable by applying different trim settings to tune the output of the voltage driver. The voltage driver may be temperature compensated by multiplexing different trim settings that correspond to different temperatures.

A storage device performs a read operation, based on a temperature measured in a program operation or an erase operation. The storage device includes: a memory device including a plurality of memory blocks, the memory device measuring a temperature in a program operation or an erase operation; and a memory controller for setting an area in which the measured temperature is to be stored in the memory device, and controlling a read operation to be performed in the memory device. When a read command for a selected page among a plurality of pages included in each of the plurality of memory blocks is received from the memory controller, the memory device determines a read voltage and a pass voltage based on a temperature corresponding to the selected page and performs a read operation on the selected page by using the read voltage and the pass voltage.

A storage device includes a memory device and a memory controller. The memory device stores a history read table including root bit information, read voltage information, and error bit information on each of a plurality of memory blocks, and performs a read operation of reading data stored in the plurality of memory blocks based on the history read table. When the read operation fails, a memory controller changes a level of a read voltage, and controls the memory device to perform a read retry operation of retrying the read operation by using the changed read voltage. When the read retry operation passes, the memory controller determines whether the history read table is to be updated by comparing the root bit information of the read retry operation with the root bit information of the history read table.

A processing device in a memory system determines to send system state information associated with the memory device to a host system and identifies a subset of a plurality of event entries from a staging buffer based on one or more filtering factors, the plurality of event entries corresponding to events associated with the memory device. The processing device further sends the subset of the plurality of event entries as the system state information to the host system over a communication pipe having limited bandwidth.

An apparatus comprises a plurality of memory cells; a plurality of sense circuits, a sense circuit comprising a sense node selectively coupled to a bitline coupled to a first cell of the plurality of memory cells; and a controller to transpose a value indicative of a voltage of the first cell to the sense node; isolate the sense node from the bitline; and calibrate a parameter for the sense circuit based on outputs of the sense circuit for each of a plurality of different applied values of the parameter.

A system includes a memory device having a plurality of groups of memory cells and a processing device communicatively coupled to the memory device. The processing device is be configured to read a first group of memory cells of the plurality to determine a calibrated read voltage associated with the group of memory cells. The processing device is further configured to determine, using the calibrated read voltage associated with the first group of memory cells, a bit error rate (BER) of a second group of memory cells of the plurality. Prior to causing the memory device to perform a copyback operation on the plurality of groups of memory cells, the processing device is further configured to determine whether to perform a subsequent read voltage calibration on at least the second group of the plurality based, at least partially, on a comparison between the determined BER and a threshold BER.

An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to detect a power-up state of the memory device following a power loss event; detect a read error with respect to data residing in a block of the memory device, wherein the block is associated with a current voltage offset bin; and perform temporal voltage shift (TVS)-oriented calibration for associating the block with a new voltage offset bin.

An apparatus includes control circuits configured to connect to a plurality of non-volatile memory cells. The control circuits are configured to abort fine programming of the plurality of non-volatile memory cells at an intermediate stage and read the plurality of non-volatile memory cells at the intermediate stage to obtain first partial data of at least one logical page. The control circuits are configured obtain the at least one logical page of data by combining the first partial data with second partial data of the at least one logical page stored in data latches.