Methods and apparatus for dynamically adjusting performance of partitioned memory. In one embodiment, the method includes receiving one or more configuration requests for the memory device, determining whether to grant the one or more configuration requests for the memory device, in response to the determining, implementing the one or more configuration requests within the memory device and operating the memory device in accordance with the implementing. The adjusting of the performance for the partitioned memory includes one or more of enabling/disabling refresh operations, altering a refresh rate for the partitioned memory, enabling/disabling error correcting code (ECC) circuity for the partitioned memory, and/or altering a memory cell architecture for the partitioned memory. Systems and applications that may benefit from the dynamic adjustment of performance are also disclosed.

An Integrated Circuit (IC) includes a non-volatile memory (NVM) and secure power-up circuitry. The NVM is configured to store an operational state of the IC. The secure power-up circuitry is configured to (i) during a power-up sequence of the IC, perform a first readout of the operational state from the NVM while a supply voltage of the IC is within a first voltage range, (ii) if the operational state read from the NVM in the first readout is a state that permits access to a sensitive resource of the IC, verify that the supply voltage is within a second voltage range, more stringent than the first voltage range, and then perform a second readout of the operational state from the NVM, and (iii) initiate a responsive action in response to a discrepancy between the operational states read from the NVM in the first readout and in the second readout.

Embodiments of information handling systems (IHSs) and computer-implemented methods are provided herein for testing system memory (or another volatile memory component) of an IHS. In the disclosed embodiments, memory testing is performed automatically: (a) during the pre-boot phase each time a new page of memory is allocated for the first time after a system boot, and (b) during OS runtime each time a read command is received and/or an event is detected. By proactively testing each page of memory, as the page is allocated but before information is stored therein, the systems and methods disclosed herein prevent “bad” memory pages from being used.

Disclosed herein are related to an age detector for determining an age of a memory block, and a method of operation of the age detector. In one configuration, a memory system includes a memory block and an age detector coupled to the memory block. In one aspect, the memory block generates a first set of data in response to a first power on, and generates a second set of data in response to a second power on. In one configuration, the age detector includes a storage block to store the first set of data from the memory block, and inconsistency detector to compare the first set of data and the second set of data. In one configuration, the age detector includes a controller to determine an age of the memory block, based on the comparison.

A method for operating a memory system includes performing a block access task on a first block in a memory device, the memory device having a plurality of blocks, generating log information when a power supply voltage becomes lower than a given level, the log information including a check point and block information, the check point indicating the block access task, the block information indicating a second block, and performing the block access task on the second block indicated in the block information of the log information when the power supply voltage becomes equal to or greater than the given level.

Disclosed are devices and methods for improving the initialization of devices housing memories. In one embodiment, a method is disclosed comprising writing a test program to a first region of a memory device during production of the memory device; executing a self-test program in response to detecting a first power up of the memory device, the self-test program stored within the test program; and retrieving and installing an image from a remote data source in response to detecting a subsequent power up of the memory device, the retrieving performed by the test program.

Various embodiments enable age tracking of one or more physical memory locations (e.g., physical blocks) of a memory die, which can be from part of a memory device. In particular, various embodiments provide age tracking of one or more physical memory locations of a memory die (e.g., memory integrated circuit (IC)) using one or more aging bins on the memory die, where each aging bin is associated with a different set of physical memory locations of the memory die. By use of an aging bin for a set of physical memory locations, various embodiments can enable a processing device that interacts with a memory die, after the memory die has been subjected to one or more reflow soldering processes, to determine how much the set of physical memory locations have aged after the one or more reflow soldering processes.

An information handling system may include a memory comprising a plurality of memory modules, each memory module comprising a plurality of memory chips, a host system comprising a host system processor configured to, during a boot of the information handling system, execute a basic input/output system of the information handling system configured to monitor for one or more faults of one or more memory modules of the plurality of memory modules, and control circuitry. The control circuitry may be configured to, in response to the one or more faults, determine if, all of one or more memory modules associated with a power control signal of such one or more memory modules have experienced faults, and if all of the one or more memory modules associated with the power control signal have experienced faults, de-assert the power control signal such that the one or more memory modules are de-energized.

An example memory sub-system includes a memory device and a processing device, operatively coupled to the memory device. The processing device is configured to detect a power-up state of the memory device following a power loss event; detect a read error with respect to data residing in a block of the memory device, wherein the block is associated with a current voltage offset bin; and perform temporal voltage shift (TVS)-oriented calibration for associating the block with a new voltage offset bin.

Apparatuses for characterizing system channels and associated methods and systems are disclosed. In one embodiment, a tester is coupled to an adaptor configured to plug into a CPU socket of a system platform (e.g., a motherboard). The motherboard includes a memory socket that is connected to the CPU socket through system channels. The adaptor may include a connector configured to physically and electrically engage with the CPU socket, an interface configured to receive test signals from the tester, and circuitry configured to internally route the test signals to the connector. The adaptor, if plugged into the CPU socket, can facilitate the tester to directly assess signal transfer characteristics of the system channels. Accordingly, the tester can determine optimum operating parameters for the memory device in view of the system channel characteristics.