A memory system includes a dynamic random access memory (DRAM) device, a second memory device, and a memory controller circuit. The memory controller circuit is coupled to the DRAM device by a first data channel configured to transfer first data between the memory controller circuit and the DRAM device on behalf of a host, and is also coupled to the DRAM device by a second data channel configured to transfer second data between the memory controller circuit and the DRAM device on behalf of the second memory device while the first data is being transferred across the first data bus.

Disclosed herein is a method for designing a semiconductor device, the method including: assigning a plurality of wiring tracks including first and second tracks; connecting a first data I/O circuit to a first data node of a first circuit by a first signal bus arranged on the first wiring track; connecting a second data I/O circuit to a second data node of the first circuit by a second signal bus arranged on the second wiring track when a first design mode is selected; and connecting the first data I/O circuit to a second circuit by a second signal bus arranged on the second wiring track when a second design mode is selected.

A memory system includes semiconductor memory devices and a control device. Each of the semiconductor memory devices includes a first pad to which a first signal is input, a second pad to which a second signal is input, a third pad to which a third signal is input, a memory cell array, a sense amplifier, and a data register. In a first mode, after the first signal is switched, a command set instructing a data out operation is input via the second pad. In a second mode, after the first signal is switched, the command is input via at least the third pad. The control device executes a first operation assigning different addresses to the respective semiconductor memory devices and a second operation causing the modes of the respective semiconductor memory devices to be switched from the first to the second mode.

In an embodiment, a memory system may include at least two types of DRAM, which differ in at least one characteristic. For example, one DRAM type may be a high density DRAM, while another DRAM type may have lower density but may also have lower latency and higher bandwidth than the first DRAM type. DRAM of the first type may be on one or more first integrated circuits and DRAM of the second type may be on one or more second integrated circuits. In an embodiment, the first and second integrated circuits may be coupled together in a stack. The second integrated circuit may include a physical layer circuit to couple to other circuitry (e.g. an integrated circuit having a memory controller, such as a system on a chip (SOC)), and the physical layer circuit may be shared by the DRAM in the first integrated circuits.

The present invention provides a multi-die package including main die, a memory die, a first set of pins and a second set of pins. The main die includes a memory controller, a first set of pads, a second set of pads and a third set of pads. The memory die is coupled to the first set of pads and the second set of pads of the main die. The first set of pins is coupled to the third set of pads of the main die. The second set of pins is coupled to the second set of pads of the main die. The memory controller accesses the memory die through the first set of pads and the second set of pads, and the memory controller accesses a memory chip external to the multi-die package through the second set of pads and the third set of pads.

Techniques to couple a high bandwidth memory device on a silicon substrate and a package substrate are disclosed. Examples include selectively activating input/out (I/O) or command and address (CA) contacts on a bottom side of a logic layer for the high bandwidth device based on a mode of operation. The I/O and CA contacts are for accessing one or more memory devices include in the high bandwidth memory device via one or more data channels.

A nonvolatile memory device may include a plurality of memory planes and a plurality of plane-dedicated pad sets. The plurality of memory planes may include a plurality of memory cell arrays including nonvolatile memory cells and a plurality of page buffer circuits. Each of the plurality of page buffer circuits may be connected to ones of the nonvolatile memory cells included in each of the plurality of memory cell arrays through bitlines. A plurality of plane-dedicated pad sets may be connected to the plurality of page buffer circuits through a plurality of data paths respectively such that each of the plurality plane-dedicated pad sets is dedicatedly connected to each of the plurality of page buffer circuits. A bandwidth of a data transfer may be increased by reducing a data transfer delay and supporting a parallel data transfer, and power consumption may be decreased by removing data multiplexing and/or signal routing.

A voltage generating circuit 100 of the present invention includes a control logic 110, a voltage generating element 120 and a connecting element 130. The voltage generating element 120 includes a plurality of registers A-1, B-1, C-1, D-1, voltage generating blocks A-2, B-2, C-2 and a voltage switch 32. The registers A-1, B-1, C-1, D-1 hold data provided from control logic 110. The voltage generating blocks A-2, B-2, C-2 generate voltage based on voltage control data held by the registers A-1, B-1, C-1. The voltage switch 32 selects voltages based on selection control data held by the register D-1. The connecting element 130 includes signal lines for sequentially transmitting the voltage control data or the selection control data, signal lines for sequentially transmitting a clock signal CLK and signal lines for controlling output of data held by the registers.

Apparatuses and techniques for operating devices with multiple differential write clock signals having different phases are described. For example, a memory controller (e.g., of a host device) can provide two differential write clock signals to a memory device over an interconnect. The two differential write clock signals may have a phase offset of approximately ninety degrees. Instead of generating its own phase-delayed write clock signals using a component (e.g., a clock divider circuit) that can enter the metastable state, the memory device can use the multiple differential write clocks signals provided by the memory controller to process memory requests.

A method and system for suppressing power signature in a memory device during read operations. A memory array stores data in an even number of cells per bit, such as 2 cells per bit, where complementary data states are stored in each pair of cells. Differential read out of the memory array via the bitlines suppresses power signature because the same power consumption occurs regardless of the data being accessed from the memory array. Data output buffers that provide complementary data to a downstream circuit system are reset to the same logic state prior to every read operation such that only one output buffer (in the complementary output buffer pair) is ever driven to the opposite logic state in each read cycle. Hence the power consumption remains the same regardless of the data states being read out from the memory array and provided by the output buffers.