An aspect of the disclosure relates to a latch array, including: a first set of master latches including a first set of clock inputs configured to receive a master clock, a first set of data inputs configured to receive a first set of data, and a first set of data outputs coupled to a set of bitlines, respectively; a second set of master latches including a second set of clock inputs configured to receive the master clock, a first set of write-bit inputs configured to receive a set of write-bit signals, and a set of write-bit outputs coupled to a set of write-bit lines, respectively; and an array of slave latches, wherein the slave latches in columns of the array include a second set of data inputs coupled to the set of bitlines, and a second set of write-bit inputs coupled to the set of write-bit lines, respectively.

Memory devices, controllers and associated methods are disclosed. In one embodiment, a memory device is disclosed. The memory device includes storage cells that are each formed with a metal-oxide-semiconductor (MOS) transistor having a floating body. Data is stored as charge in the floating body. A transfer interface receives a read command to access data stored in a first group of the storage cells. Sensing circuitry detects the data stored in the first group of storage cells. The transfer interface selectively performs a writeback operation of the sensed data associated with the read command.

Memory devices, controllers and associated methods are disclosed. In one embodiment, a memory device is disclosed. The memory device includes storage cells that are each formed with a metal-oxide-semiconductor (MOS) transistor having a floating body. Data is stored as charge in the floating body. A transfer interface receives a read command to access data stored in a first group of the storage cells. Sensing circuitry detects the data stored in the first group of storage cells. The transfer interface selectively performs a writeback operation of the sensed data associated with the read command.

Apparatuses and methods can be related to implementing a conditional write back scheme for memory. The data may be stored by memory cells of a memory array. The data may be moved to sense circuitry. The data can be conditionally held by the sense circuitry while a plurality of operations is performed. The results of the plurality of operations can dictate whether to commit the data to the memory cells.

A memory controlling device configured to connect to a memory module including a resistance switching memory cell array which is partitioned into a plurality of partitions including a first partition and a second partition is provided. A first controlling module accesses the memory module. A second controlling module determines whether there is a conflict for the first partition to which a read request targets when an incoming request is the read request, instructs the first controlling module to read target data of the read request from the memory module when a write to the second partition is in progress, and suspends the read request when a write to the first partition is in progress.

A memory controlling device configured to connect to a memory module including a resistance switching memory cell array which is partitioned into a plurality of partitions including a first partition and a second partition is provided. A first controlling module accesses the memory module. A second controlling module determines whether there is a conflict for the first partition to which a read request targets when an incoming request is the read request, instructs the first controlling module to read target data of the read request from the memory module when a write to the second partition is in progress, and suspends the read request when a write to the first partition is in progress.

A memory system comprises a first memory device and a processing device operatively coupled to the first memory device. The processing device is configured to determine whether to execute a write cycle, at the first memory device, to write data from a second memory device to the first memory device based on persisted data stored by the first memory device.

A processing device, operatively coupled with a memory device, is configured to receive a write request identifying data to be stored in a segment of the memory device. The processing device determines a write-to-write (W2W) time interval for the segment and determines whether the W2W time interval falls within a first W2W time interval range, the first W2W time interval range corresponds to a first pre-read voltage level. Responsive to the W2W time interval for the segment falling within the first W2W interval range, the processing device performs a pre-read operation on the segment using the first pre-read voltage level. The processing device identifies a subset of the data to be stored in the segment comprising bits of data that are different than corresponding bits of the data stored in the segment. The processing device further performs a write operation to store the subset of the data in the segment.

The present invention relates to systems and methods for implementing wear leveling in a flash memory device that emulates an EEPROM. The embodiments utilize an index array, which stores an index word for each logical address in the emulated EEPROM. Each bit in each index word is associated with a physical address for a physical word in the emulated EEPROM, and the index word keeps track of which physical word is the current word for a particular logical address. The use of the index word enables a wear leveling algorithm that allows for a programming command to a logical address to result in: (i) skipping the programming operation if the data stored in the current word does not contain a “1” that corresponds to a “0” in the data to be stored, (ii) reprogramming one or more bits of the current word in certain situations, or (iii) shifting to and programming the next physical word in certain situations.

Nonvolatile memory (e.g. phase change memory) devices, systems, and methods that minimize energy expenditure and wear while providing greatly improved error rate with respect to marginal bits are disclosed and described.