G21K2201/062

NEUTRAL ATOM QUANTUM INFORMATION PROCESSOR

Systems and methods relate to arranging atoms into 1D and/or 2D arrays; exciting the atoms into Rydberg states and evolving the array of atoms, for example, using laser manipulation techniques and high-fidelity laser systems described herein; and observing the resulting final state. In addition, refinements can be made, such as providing high fidelity and coherent control of the assembled array of atoms. Exemplary problems can be solved using the systems and methods for arrangement and control of atoms.

System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements

An apparatus includes a crystal analyzer positioned relative to an x-ray source on a Rowland circle. The crystal analyzer includes crystal planes curved along at least one direction and configured to receive x-rays from the x-ray source and to disperse the received x-rays according to Bragg's law. The apparatus further includes a spatially resolving detector that includes a plurality of x-ray detection elements having a tunable first x-ray energy and/or a tunable second x-ray energy. The plurality of x-ray detection elements are configured to measure received dispersed x-rays having x-ray energies below the first x-ray energy while suppressing measurements above the first x-ray energy and/or to measure the received dispersed x-rays having x-ray energies above the second x-ray energy while suppressing measurements below the second x-ray energy.

NANOPATTERNED ELECTRON BEAMS FOR TEMPORAL COHERENCE AND DETERMINISTIC PHASE CONTROL OF X-RAY FREE-ELECTRON LASERS
20210343444 · 2021-11-04 ·

A method includes accelerating an electron bunch along a direction of propagation to a relativistic energy and partitioning the electron bunch by transmitting the electron bunch through a grating at the relativistic energy. The grating includes a plurality of alternating narrow portions and wide portions. The narrow portions have a first thickness in a direction substantially parallel to the direction of propagation of the electron bunch, and the wide portions have a second thickness in the direction substantially parallel to the direction of propagation of the electron bunch. The second thickness is greater than the first thickness. The method also includes generating a pulse of light using the partitioned electron bunch.

Instrument for moving and positioning of optical elements with nanometric mechanical stabiling and resolution in synchrotron light source beamlines

An instrument for moving and positioning of an optical element in beamlines comprises a mounting structure to which one (or more) optical element(s) is mounted, as well as a reference structure, in relation to which the mounting structure is moved by means of a moving means of low (or close to zero) mechanical stiffness and in relation to which the position of the mounting structure is metered by means of a high-resolution interferometer. The invention proposes that the instrument also comprises a balance mass for receiving the reaction force from the moving means of the mounting structure, and both the mounting structure and the balance mass are attached to the reference structure by spring means, with specific stiffness properties, allowing the positioning control of the mounting structure to be done by a control system with main feedback loop with high bandwidth (>100 Hz). In order to allow for a broader range of movement between the mounting structure and the reference structure, by means of a cascaded movement, the instrument may further comprise an intermediate structure attached to the reference structure, also preferably by spring means with specific stiffness properties, the complementary structure receiving the mounting structure and the balance mass in place of the reference structure. Such an instrument may be embodied in a new-generation synchrotron light source beamline mounted double-crystal monochromator, being sufficient for this that the spring means to be conveniently chosen, the reference structure to have a main rotation in relation to the incident beam, and in addition to the crystal mounted to the mounting structure, a complementary crystal to be mounted to the complementary mounting structure rigidly attached to the reference structure.

X-ray spectrometer and methods for use

A spectrometer includes a crystal analyzer having a radius of curvature that defines a Rowland circle, a sample stage configured to support a sample such that the sample is offset from the Rowland circle, x-ray source configured to emit unfocused x-rays toward the sample stage, and a position-sensitive detector that is tangent to the Rowland circle. A method performed via a spectrometer includes emitting, via an x-ray source, unfocused x-rays toward a sample that is mounted on a sample stage such that the sample is offset from the Rowland Circle, thereby causing the sample to emit x-rays that impinge on the crystal analyzer or transmit a portion of the unfocused x-rays to impinge on the crystal analyzer; scattering, via the crystal analyzer, the x-rays that impinge on the crystal analyzer; and detecting the scattered x-rays via a position-sensitive detector that is tangent to the Rowland circle.

X-ray fluorescence analyzer and a method for performing an x-ray fluorescence analysis

An X-ray fluorescence analyzer comprises an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit, and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. It is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The input power rating of said X-ray tube is at least 400 watts. The first crystal diffractor comprises a pyrolytic graphite crystal. The optical path between said X-ray tube and the slurry handling unit is direct with no diffractor therebetween.

Interferometer for x-ray phase contrast imaging
11813102 · 2023-11-14 ·

Disclosed herein is an x-ray interferometer for x-ray phase contrast imaging including an x-ray source, an x-ray source grating, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. An alternative interferometer includes a periodically structured x-ray source, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. The phase gratings are placed much closer to the x-ray detector than to the x-ray source and the image object is positioned upstream and close to the phase gratings to achieve high sensitivity and large field-of-view simultaneously.

NEUTRAL ATOM QUANTUM INFORMATION PROCESSOR

Systems and methods relate to arranging atoms into 1D and/or 2D arrays; exciting the atoms into Rydberg states and evolving the array of atoms, for example, using laser manipulation techniques and high-fidelity laser systems described herein; and observing the resulting final state. In addition, refinements can be made, such as providing high fidelity and coherent control of the assembled array of atoms. Exemplary problems can be solved using the systems and methods for arrangement and control of atoms.

Neutral atom quantum information processor

Systems and methods relate to arranging atoms into 1D and/or 2D arrays; exciting the atoms into Rydberg states and evolving the array of atoms, for example, using laser manipulation techniques and high-fidelity laser systems described herein; and observing the resulting final state. In addition, refinements can be made, such as providing high fidelity and coherent control of the assembled array of atoms. Exemplary problems can be solved using the systems and methods for arrangement and control of atoms.

SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL ANALYZER AND A PLURALITY OF DETECTOR ELEMENTS

A fluorescence mode x-ray absorption spectroscopy apparatus includes an electron bombardment source of x-rays, a crystal analyzer, the source and the crystal analyzer defining a Rowland circle having a Rowland circle radius (R), a detector, and at least one stage configured to position a sample at a focal point of the Rowland circle with the detector facing the sample.