Apparatus can comprise a probe movable in a direction along a probe axis that intersects a determination axis and a clamping pin can be movable along a clamping pin axis that intersects a product support area of a base. In some embodiments, methods of determining a height of an edge portion of a product can comprise aligning the edge portion of the product along a determination axis and clamping the product to a base at a clamping location of the product positioned over a product support area. Methods can further comprise extending a probe to contact a location of the edge portion of the product while the product is clamped to the base. Methods can further comprise determining a height of the edge portion of the product based on the position of the probe contacting the edge portion of the product.

Embodiments of the present invention disclose a target material thickness measuring apparatus including: a support; and a plurality of distance measuring units mounted on the support and arranged in a first direction, the plurality of distance measuring units being configured to respectively measure thicknesses of portions of a target material at a plurality of positions in the first direction. A plurality of thickness values of different portions of the target material along a straight line can be obtained at one time, for example, by performing a single measurement of thicknesses of the portions of the target material at the plurality of positions by means of the plurality of distance measuring units, thereby improving measurement efficiency.

Provided is an information processing apparatus including: an input unit into which shape data of a surface to be measured including a plurality of recesses is input; and a setting unit that detects each of the plurality of recesses on the basis of the input shape data and sets, for the detected recess, a region to be removed including the recess.

An inner-wall measuring instrument includes: a placement surface on which an object to be measured is placed; a base relatively movable with respect to the placement surface in three axis directions orthogonal to one another; a touch probe that is disposed at a first position of the base and brought into contact with the object; an image probe that is disposed at a second position of the base and capable of imaging the object with a direction parallel to the placement surface being an imaging direction; a rotational drive unit that rotates the image probe around an axis extending in a direction perpendicular to the placement surface; a linear drive unit that moves the image probe in the imaging direction; and a calculator that calculates an offset amount between the touch probe disposed at the first position and the image probe disposed at the second position.

A surface texture measuring apparatus includes an X axis displacement mechanism and a Y axis displacement mechanism displacing a measurable object having an interior wall along an XY plane; a measurement sensor measuring a surface texture of the interior wall without contact; a Z axis displacement mechanism displacing the measurement sensor in a Z axis direction orthogonal to the XY plane and bringing the measurement sensor to face the interior wall; a W axis displacement mechanism displacing the measurement sensor facing the interior wall in a normal direction of the interior wall; and a θ axis displacement mechanism displacing the measurement sensor facing the interior wall along the interior wall.

A surface texture measuring apparatus includes: a measurement sensor measuring, without contact, a surface texture of an interior wall of a cylinder portion of a measurable object while displacing in a normal direction of the interior wall at each measurement region into which the interior wall is divided in a circumferential direction of the cylinder portion; a W axis displacer displacing the measurement sensor in a W axis direction; a θ axis displacer displacing the measurement sensor in the circumferential direction, after measurement of the surface texture of a first measurement region, such that the measurement sensor faces a second measurement region adjacent to the first measurement region in the circumferential direction; and a controller adjusting a W axis direction measurement position for measuring the surface texture of the second measurement region while displacing the measurement sensor in the W axis direction.

A method for electrically activating a measurement stand with a movement of at least one measuring probe (26) from a starting position (31) into a measuring position (32) and also a measurement stand for supporting a measuring probe, in particular for measuring the thickness of thin layers, in which a motor (34) is activated by a control arrangement (25), which moves a ram (23) up and down via a drive arrangement (35), wherein a retainer (24) is provided on the ram (23), to which retainer the measuring probe (26) can be fastened, in which a freewheel is activated between the drive arrangement (35) and the ram (33) as soon as the measuring probe (26) or retainer (23) is set down in the measuring position (32) on an item to be measured (14) and the movement of the drive arrangement (35) is decoupled from the vertical movement of the ram (23), wherein a movement speed of the at least one measuring probe (14) from the starting position (31) into the measuring position (32) is reduced by mechanical damping or electrical damping before the measuring position (32) is reached.

The height measuring device is movably positioned on a scale surface, the height measuring device comprises: a bracket repeatedly attached to or detached from the scale surface; and a measuring unit assembled with the bracket, wherein the measuring unit includes a folding position and an extending position relative to the bracket, the measuring unit is close to the bracket in the folding position, and the measuring unit is perpendicular to the scale surface in the extending position. Then, it is convenient to accurately measure the height of users at kinds of objects with a scale surface.

An alignment tool for aligning and installing a plurality of pickets on a fence segment. The alignment tool comprises a body portion, and a picket level indicator. One or more upper guides and a lower guide assembly can be separated by a guide gap. The guide gap is at least as wide as a first cross member height of a first cross member of the fence segment. The alignment tool is configured to selectively attach and slide along the first cross member of the fence segment and position the picket level indicator at a selected height relative to the first cross member. The one or more upper guides and the lower guide assembly are configured to slide a forward direction and a reverse direction on the first cross member.

A milling machine includes a milling rotor, at least one leg, a grade sensor, and a control circuit. The milling rotor is configured to engage a surface beneath the milling machine. The at least one leg is controllable to raise and lower the milling machine. The grade sensor is configured to sense a position indicative of a cut depth of the milling rotor, and the control circuit is configured to receive data from the grade sensor. The control circuit is also configured to: identify a distance from the milling rotor to the surface based on a selected position of the at least one leg; identify a value associated with a detected condition using the grade sensor while the at least one leg is at the selected position; and calibrate the grade sensor by associating the identified distance from the milling rotor to the surface and the identified value.