Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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7/00
Measuring arrangements characterised by the use of electric or magnetic techniques
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G01B7/16
for measuring the deformation in a solid, e.g. by resistance strain gauge
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G01B7/18
using change in resistance
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G01B7/20
formed by printed-circuit technique
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