A battery pack includes a battery, a sensor configured to detect a state of the battery. The sensor includes an insulating layer, and a resistor on one side of the insulating layer, the resistor being formed of a Cr composite film. The sensor detects the state of the battery as a change in a resistance value of the resistor.

Provided is a method for compensating a stress-sensitive parameter, and the method is applied to an electronic devices. The method includes: calculating (51) a deformation value of a first panel according to a pressure borne by the first panel; calculating (52) according to the deformation value of the first panel a deformation value of a second panel that is deformed due to the deformation of the first panel; calculating (53) according to the deformation value of the second panel a change in a stress-sensitive parameter of a stress-sensitive element on the second panel; and compensating (54) the stress-sensitive parameter according to the change in the stress-sensitive parameter. The quality of the parameters of corresponding electronic elements and electronic modules are thereby improved, ultimately enhancing the performance of electronic device.

A method includes measuring, using at least one sensor, strain on a nail plate of a subject, wherein the at least one sensor outputs a data stream corresponding to the measuring, communicating the data stream to a receiver, and interpreting, by the receiver, the data stream to determine a parameter of interest of the subject.

The present strain gauge includes a substrate having flexibility; a resistor formed from a material containing at least one of chromium and nickel, on the substrate; and an oxidation impeding layer formed on a non-oxidized surface corresponding to an upper surface of the resistor.

An inspection device comprises: a detecting unit that is connected to a plurality of semiconductor chips having mutually different rates of change of electrical resistance with respect to stress loading direction, and that detects an electrical resistance value of each semiconductor chip from electric current flowing in each semiconductor chip; a first memory unit that is used to hold model data meant for converting an electrical resistance value into a characteristic value indicating at least either temperature, or stress, or strain; a converting unit that converts the electrical resistance value of each semiconductor chip as detected by the detecting unit into the characteristic value using the model data held in the first memory unit; and a second memory unit that is used to store the characteristic value, which is obtained by conversion by the converting unit, as time-series data for each of the plurality of semiconductor chips.

Aspects include a method of manufacturing a flexible electronic structure that includes a metal or doped silicon substrate. Aspects include depositing an insulating layer on a silicon substrate. Aspects also include patterning a metal on a silicon substrate. Aspects also include selectively masking the structure to expose the metal and a portion of the silicon substrate. Aspects also include depositing a conductive layer including a conductive metal on the structure. Aspects also include plating the conductive material on the structure. Aspects also include spalling the structure.

According to the present disclosure, a strain gauge has: a flexible substrate; a resistor formed on the substrate; and a pair of electrodes formed on the substrate and electrically connected with the resistor via conductive traces, and, in this strain gauge, a width of the resistor is 10 m or more and 100 m or less, and the conductive traces include a portion with a width of 5 m or more and 100 m or less.

An apparatus comprising at least one sensor to detect the position and/or orientation of a body portion of a subject, the sensor in communication with a computing device to process sensor data and optionally a transmitter to transmit sensor data between the sensor and the computing device and/or one or more computing devices.

The present strain gauge includes a substrate having flexibility; a resistor formed from a material containing at least one of chromium and nickel, on the substrate; a pair of wiring patterns formed on the substrate and electrically connected to both ends of the resistor; and a pair of electrodes formed on the substrate and electrically connected to the pair of wiring patterns, respectively. The wiring patterns include a first layer extending from the resistor, and a second layer having a lower resistance than the first layer and layered on the first layer. On the substrate, an electronic component mounting area is demarcated, on which an electronic component electrically connected to the electrodes is mounted.

A strain gauge includes a flexible substrate; and resistors each formed of material including at least one from among chromium and nickel, on or above the substrate. The resistors include a first resistor formed on or above a predetermined surface of the substrate; a second resistor of which a grid direction faces a different direction from the first resistor, the second resistor formed on or above the predetermined surface of the substrate or a surface parallel to the predetermined surface; and a third resistor formed on or above a surface adjacent to the predetermined surface of the substrate.