A probe for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A polarizing fiber optically coupled within the probe body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the probe body and also transmits a measurement beam from the probe body toward a detector. An adjustable beam manipulator is provided for angularly redistributing the reference beam along the reference arm.

A three-dimensional measurement device includes an optical system that: splits an incident light into two lights; radiates one light to a measurement object and the other light to a reference surface; and emits the combined light; a first irradiator that emits a first light that comprises a polarized light of a first wavelength and enters a first element of the optical system; a second irradiator that emits a second light that comprises a polarized light of a second wavelength and enters a second element of the optical system; a first camera that takes an image of the first light emitted from the second element when the first light enters the first element; a second camera that takes an image of the second light emitted from the first element when the second light enters the second element; and an image processor that performs measurement based on the images.

A system for inspecting a slab of material may include an optical fiber, a broadband light source configured to emit light having wavelengths of 780-1800 nanometers over the optical fiber, a beam-forming assembly configured to receive the light over the optical fiber and direct the light toward a slab of material, the beam-forming assembly may be configured to maintain the position of one or more elements within the beam-forming assembly despite changes in environmental temperature; a computer-controlled etalon filter configured to receive the light over the optical fiber, filter the light, and direct the light over the optical fiber; and a computer-controlled spectrometer configured to receive the light over the optical fiber after the light has been filtered by the etalon filter and after the light has been reflected from or transmitted through the slab of material and spectrally analyze the light.

Optical coherence tomography (OCT) systems using a polarization switch and/or a polarization beam splitter are generally described. In an example, an OCT system includes a light source configured to emit a beam and an interferometer configured to receive the beam. The interferometer includes a reference path and an interferometer sample path. The OCT system further includes a polarization switch configured to selectively change a polarization state of the beam and a lens system that includes a first sample path and a second sample path. The polarization switch is further configured to direct the beam onto the first sample path upon selection of a first polarization state and to direct the beam onto the second sample path upon selection of a second polarization state that is different from the first polarization state.

Example apparatuses and methods relating to imaging systems are provided. An example imaging system may include an optical source configured to generate an optical beam, a beam splitter configured to split the optical beam into a reference beam and an object beam, and a beam combiner configured to route a combined beam with reference beam and object beam components along a common path into a target medium. In this regard, the target medium may act upon the combined beam to form a common path interference beam. The example imaging system may further include an imaging sensor configured to receive the common path interference beam and generate common path interference beam data associated with the common path interference beam, and an image data processor configured to analyze the common path interference beam data to generate image data describing the target medium.

An imaging system uses polarized light to illuminate the target and then uses a polarization filter to remove the light that is reflected from the target without modification. The target can include one or more anisotropic objects that scatter the light and alter the polarization state of the reflected light and causing it to be selectively transmitted to the imaging device which can record the transmitted light through the filter. The illuminating light can be circularly polarized and the filter can remove the circularly polarized light. The target can include asymmetric nanoparticles, such as nanorods that alter the amplitude or phase of the scattered light enabling pass through the filter to be detected by the imaging device.

Disclosed herein is a simultaneous orthogonal scanning dual beam OCT system. The simultaneous orthogonal scanning dual beam OCT system includes: a light source 10; a light distribution unit 20; a sample arm 40; a reference arm 50; a interference unit 60; and a detection unit 70.

An interferometer uses a phase shift mask that includes an array of pixels that are aligned with a corresponding array of pixels of a detector. Each pixel in the phase shift mask is adapted to produce one of a number of predetermined phase shifts between a test beam and a reference beam. For example, the pixels may be linear polarizers or phase delay elements having one of the number of polarizer orientations or phase delays to produce the predetermined phase shifts between the test beam and the reference beam. The pixels in the phase shift mask are arranged in the array to include each of the predetermined phase shifts in repeating pixel groups in rows that are one column wide, columns that are one row high, or blocks of multiple rows and columns.

A system and corresponding method are presented. the system comprises: an illumination unit comprising at least one light source configured for emitting coherent illumination of one or more selected wavelength ranges having selected illumination modulation pattern and for directing said illumination onto one or more selected inspection regions; and a collection unit comprising at least one detector array and imaging optical arrangement configured for collecting interacting light from the one or more selected inspection regions and for generating corresponding one or more sequences of image data pieces at selected sampling rate. The image data pieces being indicative of secondary speckle patterns formed in collected interacting light. The illumination modulation pattern is selected for increasing temporal bandwidth collection of speckle patterns associated with temporal shifts in said one or more inspection regions.

This disclosure relates to an OCT apparatus configured to generate to electromagnetic (e.g., optical) signals having two different polarization states. Two or more silicon optical amplifiers (SOAs) can be configured to maintain a respective polarization state in an optical input signal provided from a light source (e.g., a broadband light source). The different polarization states can be combined by an optical combiner (e.g., a polarization maintaining fiber coupler) and provided to drive a reference arm and a sample arm implemented in an OCT system.