G01B9/02012

High-resolution handheld OCT imaging system
12298133 · 2025-05-13 ·

A high-resolution handheld OCT imaging system related to the optical imaging field solves the issues of handheld OCT systems with low resolution and the inability to measure the skin's stratum corneum thickness accurately. Through adopting the visible wavelength band of supercontinuum laser as the light source, mainly applying reflectors instead of lenses in the OCT system, and replacing fiber propagation with optical propagation in free space in the interference optical paths, to significantly reduce dispersion loss in the axial resolution and improve the axial resolution of OCT systems. The filter, attenuator, grating, camera, and other components are separated from the handheld module through modular design to reduce the handheld terminal's size and weight and realize the system construction. The invention improves the axial resolution, obtains the thickness information of whole-body skin's stratum corneum, and provides technical approaches for skin diagnosis and related medicine development.

OPTICAL DISPLACEMENT SENSOR ARRANGEMENT AND METHOD OF OPERATION

An optical displacement sensor arrangement including a light source, a light detector, and a reflective moveable member. The reflective moveable member is moveable relative to the light detector. The light source is disposed to direct light onto the reflective moveable member such that the light is reflected by the reflective moveable member. The light detector is arranged to detect the light reflected by the reflective moveable member, wherein the light is indicative of movement of the reflective moveable member. The optical displacement sensor arrangement is arranged to generate measurement data representing movement of the reflective moveable member based on the light detected by the light detector. The optical displacement sensor arrangement is further arranged to determine a change in a signal generated therein indicative of a rupture of the reflective moveable member; and, in response to determining said signal change, change a power level of the light source.

Optical comb measuring apparatus
12455235 · 2025-10-28 · ·

An optical comb measuring apparatus that measures an irradiation target having multiple types of measuring targets, includes: an interference signal acquiring section; and a frequency spectrum measuring section. The interference signal acquiring section acquires an interference signal between a post-irradiation signal comb obtained by irradiating the irradiation target with a pre-irradiation signal comb and a local comb set to be different from a repetition frequency of the pre-irradiation signal comb by a predetermined differential frequency. The frequency spectrum measuring section measures a frequency spectrum of a result of acquisition by the interference signal acquiring section. Either one or both of the post-irradiation signal comb and the local comb provided to the interference signal acquiring section have only components within a plurality of required bands including all of predetermined frequencies. Frequency bands of the interference signal corresponding to the plurality of respective required bands have no areas overlapping each other.

Interferometer system, positioning system, a lithographic apparatus, a jitter determination method, and a device manufacturing method
12481226 · 2025-11-25 · ·

An interferometer system includes an optics system configured to allow a first light beam to travel along a measurement path including a target, and a second light beam to travel along a fixed reference path excluding the target; and a signal generator configured to introduce a power-modulated optical signal in the measurement path or the reference path to determine jitter caused by components of the interferometer system downstream of the signal generator.

OPTICAL MEASUREMENT DEVICE AND METHOD
20260078999 · 2026-03-19 ·

The invention relates to the field of optical measurement devices, in particular to displacement sensors, 3D sensors for measuring the position and/or shape or thickness of a measurement object. Measurement light is projected onto a measurement object after 5 filtering by a Fabry-Prot filter such that at each point in a measurement plane, the filtered measurement light has a locally unique wavelength or combination of wavelengths in at least one direction in the measurement plane. Measurement light reflected from the surface of the measurement object is also filtered by a Fabry-Prot filter in order to filter out measurement light not reflected from the intersection of the measurement object with 0 the measurement plane. To be published with