A white light interferometric metrology device operates in the image plane and objective pupil plane. The interferometric metrology device extracts the electric field with complex parameters and that is a function of azimuth angle, angle of incidence and wavelength from interferometric data obtained from the pupil plane. Characteristics of the sample are determined using the electric field based on an electric field model of the azimuth angle, the angle of incidence and the wavelength that is specific for a zero diffraction order. A center of the pupil in the pupil plane may be determined based on a Fourier transform of the interferometric data at each new measurement and used to convert each pixel from the camera imaging the objective pupil plane into a unique set of angle of incidence and azimuth angle of light incident on the sample.

A system and method for surface inspection of an object using multiplexed optical coherence tomography (OCT) is provided. The method includes moving the object relative to two or more scanner heads along a direction of travel; alternatingly directing a sample beam to each of the two or more scanner heads; and when the sample beam is directed at each respective scanner head, scanning comprising: steering the sample beam from the respective scanner head to an unscanned region on the surface of the object; and performing an A-scan of the object.

A system and method for surface inspection of an object using optical coherence tomography (OCT) is provided. The method includes determining a first working distance; determining a first depth of field, based on the first working distance; changing the depth of field to the first depth of field; performing an A-scan of the object; moving the object; determining a subsequent working distance; determining whether the object is in focus at the subsequent working distance, if the object is not in focus: determining a subsequent depth of field based on the subsequent working distance; changing the depth of field to the first depth of field; and performing an A-scan of the object; and otherwise, performing an A-scan of the object.

An interferometric measuring machine includes an exchangeable lens module system for an optical probe. The probe includes a lens body containing the optical apparatus of an interferometer and a lens module containing an objective lens along an object arm of the interferometer that can be exchanged with other lens modules for varying the measuring characteristics of the probe. The lens modules are adapted to accommodate objective lenses having different focal lengths while maintaining a desired optical path length of the object arm of the interferometer.

The present invention is related with the two-channel point-diffraction interferometer for testing the optical systems or optical elements. The two-channel point-diffraction interferometer comprising a laser source inducing a linearly polarized laser beam which is divided by a beam splitter to a working channel and to a reference channel whereas the one half of light as working channel is directed from the first collimator to the working collimator by a first single-mode optical fiber to keep polarization of light unchanged, and another half of light as reference channel is directed from the second collimator to the reference collimator by a second single-mode optical fiber to keep polarization of light unchanged.

A device for measuring a distance to an object comprises a beam splitter for splitting broadband coherent light emitted by a light source in measuring light which is guided through an object arm to the object to be measured and in reference light which is guided to a reference arm. The object arm includes a focusing optics with a focus movable along an optical axis of the object arm. The focusing optics comprises a movable optical element and is configured such that a movement of the movable optical element along the optical axis causes a higher movement of the focus of the focusing optics along the optical axis. The movable optical element of the focusing optics is coupled to the reference arm such that the optical path length of the reference arm can be tracked synchronously with and dependent on the movement of the focus of the focusing optics.

A system and method for surface inspection of an object using optical coherence tomography (OCT) with anticipatory depth of field adjustment is provided. The method includes determining a present working distance and one or more forward working distances; determining a present depth of field in which the surface of the object is in focus at the location of the present working distance and at as many of the consecutive forward surface locations as determined possible; changing to the present depth of field; performing an A-scan of the object; moving the object such that the scanner head is directed at each of the consecutive forward surface locations determined to be in the present depth of field; and performing an A-scan at each of the consecutive forward surface locations determined to be in the present depth of field.

An arrangement for determining four-dimensional properties of an interface of an object, including a light source includes: a unit for forming photonic jets, a unit for performing large field of view interferometric imaging of the interface and their combination, a unit for passing the light being close to the interface and direct the light to the interface, and an image unit. The arrangement includes a unit for performing phase shifting interferometric imaging of the interface, imaging a unit for receiving light from the interface modulated by e.g. microspheres for forming super-resolution image information by combining light interferometry with the photonic jets, and a processor unit for determining four-dimensional properties of the interface on the basis of the image information formed by the phase shifting interferometric imaging by utilizing effect of the photonic jets. The arrangement also can also include a unit to carry out the measurement using polarized light.

An optical pen for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the pen body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the pen body and also transmits a measurement beam from the pen body toward a detector. A combination and configuration of optics within the pen body provides a more compact and efficient optical pen.

An optical pen for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the pen body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the pen body and also transmits a measurement beam from the pen body toward a detector. A combination and configuration of optics within the pen body provides a more compact and efficient optical pen.