G01B9/02051

Measuring Apparatus, On-Chip Instrumentation Device and Measuring Method

This application discloses a measurement apparatus that does not use a femtosecond laser light source and a delay stage. The measurement apparatus mixes a first laser light from a first CW laser light source and a second laser light from a second CW laser light source to generate an interference light having a beat in a range from GHz to THz and demultiplexes the interference light into a pump light and a probe light. A generating photoconductive antenna is irradiated with the pump light, and a detecting photoconductive antenna is irradiated with the probe light. A current value of an electromagnetic wave propagating through a waveguide connecting the generating photoconductive antenna and the detecting photoconductive antenna is measured using a current system connected to the detecting photoconductive antenna.

METHOD AND APPARATUS FOR MAPPING AND RANGING BASED ON COHERENT-TIME COMPARISON
20230160681 · 2023-05-25 · ·

Provided is a system for range detection including at least one beam source arrangement configured to provide illumination of certain coherence length, an optical arrangement, and a detection arrangement including at least one detector unit.

Polarization-Separated, Phase-Shifted Interferometer

A polarization-separated, phase-shifted interferometer can generate interferograms without moving parts. It uses a phase shifter, such as an electro-optic phase modulator, to modulate the relative phase between sample and reference beams. These beams are transformed into orthogonal polarization states (e.g., horizontally and vertically polarized states) and coupled via a common path (e.g., polarization-maintaining fiber) to a polarizing beam splitter (PBS), which sends them into separate sample and reference arms. Quarter-wave plates in the sample and reference arms rotate the polarization states of the sample and reference beams so they are coupled out of the PBS to a detector via a 45° linear polarizer. The polarizer projects the aligned polarization components of the sample and reference beams onto the detector, where they interfere with known relative phase to produce an output that can be used to map surface topography of the test object.

Mirror unit and optical module

A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a part of an optical path between the beam splitter unit 3 and the fixed mirror 16. The light transmitting portion 14 is a portion that corrects an optical path difference that occurs between an optical path between the beam splitter unit 3 and the movable mirror 22 and the optical path between the beam splitter unit 3 and the fixed mirror 16. The second surface 21b of the base 21 and the third surface 13a of the optical function member 13 are joined to each other.

PRESSURE INSENSITIVE INTERFEROMETER
20170363412 · 2017-12-21 · ·

A device. The device includes a substrate a substrate, a first optical waveguide disposed on the substrate and a second optical waveguide disposed on the substrate. The device further includes a coupling element disposed on the substrate, the coupling element configured to couple an optical signal in the first optical waveguide to the second optical waveguide, and couple an optical signal in the second optical waveguide to the first optical waveguide. A first reflective element is disposed at an end of the first optical waveguide configured to reflect optical signals in the first optical waveguide. A second reflective element disposed at an end of the second optical waveguide configured to reflect signals in the second optical waveguide.

Scan pattern and signal processing for optical coherence tomography

An OCT system for measuring a retina as part of an eye health monitoring and diagnosis system. The OCT system includes an OCT interferometer, where the interferometer comprises a light source or measurement beam and a scanner for moving the beam on the retina of a patient's eye, and a processor configured to execute instructions to cause the scanner to move the measurement beam on the retina in a scan pattern. The scan pattern is a continuous pattern that includes a plurality of lobes. The measurement beam may be caused to move on the retina by the motion of a mirror that intercepts and redirects the measurement beam. The mirror position may be altered by the application of a drive signal to one or more actuators that respond to the drive signal by rotating the mirror about an axis or axes.

Apparatus for monitoring the output of an optical system

Apparatus for monitoring the output of an optical system. The apparatus comprises first and second fibre optic sections, a reflective coating, and a detector. The first fibre optic section has a first cladding and a first core, and is configured to receive light from the optical system at one end and has at the other end a first angled, polished face. The second fibre optic section has a second cladding and a second core, and has at one end a second angled, polished face. The first and second fibre optic sections are arranged such that the first and second angled, polished faces are substantially parallel and adjacent and the first and second cores are substantially aligned. The reflective coating is applied to the first or second angled, polished face, and is configured to reflect a portion of light transmitted through the first core. The detector is arranged to receive the reflected light.

Fixed distal optics endoscope employing multicore fiber
11256080 · 2022-02-22 ·

Disclosed herein are configurations for fiber optic endoscopes employing fixed distal optics and multicore optical fiber.

Ophthalmologic apparatus

The present invention relates to an ophthalmologic apparatus for acquiring depth information of an eye including a light source; a measurement optical path guiding measurement light; a reference optical path generating reference light; and a detector generating a detection signal containing an interference signal of the measurement light via the measurement optical path and the reference light coming from the reference optical path; an actuator driving at least part of the interference optical system to vary an optical path length difference between the measurement optical path and the reference optical path; a standard optical system including optical members disposed corresponding to the optical path length differences in one of the measurement optical path and the reference optical path. Optical members guide part of the measurement light or the reference light to the detector.

SWEPT FREQUENCY PHOTONIC INTEGRATED CIRCUIT FOR ABSOLUTE METROLOGY
20220049945 · 2022-02-17 ·

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.