An optical component for an attenuated total reflection interferometric imaging device, which includes: a planar waveguide, especially delimited by a front face and a rear face parallel to each other; an injection zone, comprising two input facets, each extending from a side face of the planar waveguide, configured to separate an initial light beam into two sub-beams each deflected in a respective direction when they enter the planar waveguide; and an extraction zone, including two output facets, configured to receive the two sub-beams, and to deflect the same when they exit the planar waveguide, the optical component being configured so that the two sub-beams can interfere with each other after emerging out of the planar waveguide.

The interferometer 10 according to this disclosure includes: a first optical component 12 that splits each of the P polarization component and the S polarization component of the light to be measured into the first optical path R1 and the second optical path R2 and combines the light to be measured; a second optical component 13 placed in the first optical path; a third optical component 14 that splits the light to be measured into the P polarization component and the S polarization component; and a P polarization detector 11a and an S polarization detector 11b that respectively detect the P polarization component and the S polarization component split by the third optical component, wherein the second optical component has an optical surface that changes the propagation direction of the light to be measured and gives a phase difference between the P polarization component and the S polarization component.

A method includes receiving a representation of an N-mode interferometer and a representation of at least one imperfection associated with the N-mode interferometer at a processor, N being a positive integer value. The processor identifies multiple two-mode interferometers and multiple phases based on the representation of the N-mode interferometer and the representation of the at least one imperfection. The multiple two-mode interferometers and the multiple phases are configured to apply a unitary transformation to an input signal. The method also includes sending a signal to cause at least one of storage or display of a representation of the multiple two-mode interferometers and a representation of the multiple phases.

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a laser source configured to provide light, a first ring resonator configured to produce a first frequency comb of light from the laser source, wherein at least a portion of the first frequency comb of light is directed at a moving object, a local oscillator configured to provide a reference beam, at least one waveguide structure configured to combine the reference beam with light reflected from the moving object to produce a measurement beam, a first multiplexer configured to split the measurement beam into a plurality of channels spaced in frequency, and a plurality of detectors configured to detect an intensity value of each channel of the plurality of channels to measure a distance between the digital measuring device and the moving object.

An optical delay line device, providing a fixed or variable optical delay, including an optical input, an optical output, an optical assembly that directs a beam along an optical path from the input to the output. The optical assembly including; a retroreflector, an optical element including first, second and third reflective surfaces, the second and third reflective surfaces being arranged to make therebetween an angle of 45°, a beam that propagates along the optical path and enters said optical element being reflected by the first surface with an angle of 90° toward the second surface, then being reflected by the second and third surfaces to exit from the optical element in a direction parallel to the direction of the beam incident on the optical element, and said optical element is arranged so as to steer said output beam onto said second surface of said retroreflector.

An interferometer includes a coherent light source and an array of electrically coupled light-sensitive pixel elements. The interferometer is configured to direct an internal optical path of the coherent light source and an external optical path of the coherent light source into a monolithic unit cell. In addition, the monolithic unit cell is configured to direct the internal optical path first through the monolithic unit cell and then onto the array and also configured to direct the external optical path back outside the monolithic unit cell through an external environment and then back into the monolithic unit cell and finally onto the array. In addition, interferometer is further configured to combine the internal optical path and the external optical path at the array and produce a first interferogram on the array, the interferogram characterizing an optical property of the external environment.

An optical system can include a mirror that reflects incoming light to a sensor for detection. The position and/or orientation of the mirror can be controlled to reflect incoming light from different locations and/or directions. Position and/or orientation of the mirror may be tracked and/or detected by an optical position sensor. The position sensor can transmit a beam to a reflector on the mirror, and the reflected beam can be received by the position sensor. Characteristics of the reflected beam can be measured to determine the position and/or orientation of the mirror. For example, the beam can be used for interferometric and/or intensity measurements, which can then be correlated with a position and/or orientation of the mirror.

Disclosed herein are optical integration technologies, designs, systems and methods directed toward Optical Coherence Tomography (OCT) and other interferometric optical sensor, ranging, and imaging systems wherein such systems, methods and structures employ tunable optical sources, coherent detection and other structures on a single or multichip monolithic integration. In contrast to contemporary, prior-art OCT systems and structures that employ simple, miniature optical bench technology using small optical components positioned on a substrate, systems and methods according to the present disclosure employ one or more photonic integrated circuits (PICs), use swept-source techniques, and employ a widely tunable optical source(s).

In another embodiment the system uses an optical photonic phased array. The phase array can be a static phased array to eliminate or augment the lens that couples light to and from a sample of interest or can be static and use a spectrally dispersive antenna and a tunable source to perform angular sweeping. The phased array can be active in 1 or 2 dimensions so as to scan the light beam in angle. The phased array can also adjust focus. The phased array can implement an optical waveform that will extend depth of field focus for imaging. The phase array can also be a separate standalone element that is fed by one or more optical fibers. The phased array can be for scanning a biomedical specimen used in conjunction with a swept-source OCT system, can be used in a free-space coherent optical communication system for beam pointing or tracking, used in LIDAR applications, or many other beam control or beam steering applications.

A digital measuring device implemented on a photonic integrated circuit, the digital measuring device including a tunable laser source implemented on the photonic integrated circuit configured to sweep over a frequency range to provide multi-wavelength light, a first waveguide structure implemented on the photonic integrated circuit configured to direct a first portion of light from the laser source at a moving object and receive light reflected from the moving object, a second waveguide structure implemented on the photonic integrated circuit configured to combine a second portion of light from the laser source with the light reflected from the moving object to produce a measurement beam, and a first detector implemented on the photonic integrated circuit configured to detect intensity values of the measurement beam to measure a distance between the digital measuring device and the moving object.

There is described an interferometer for use in an optical locker. The interferometer comprises at least two transparent materials having different thermal path length sensitivities. The interferometer is configured such that an input beam is split by the interferometer into first and second intermediate beams, which recombine to form an output beam, the first and second intermediate beams travelling along respective first and second intermediate beam paths which do not overlap. At least one of the intermediate beam paths passes through at least two of the transparent materials. A length of each intermediate beam path which passes through each transparent material is selected such that an optical path difference between the first and second intermediate beam path is substantially independent of temperature.