Patent classifications
G
PHYSICS
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G01
MEASURING; TESTING
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G01B
MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
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9/00
Measuring instruments characterised by the use of optical techniques
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G01B9/02083
characterised by particular signal processing and presentation
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G01B9/02084
Processing in the Fourier or frequency domain when not imaged in the frequency domain
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