A method and equipment for dimensional measurement of a micro part based on fiber laser with multi-core fiber Bragg grating probe are provided, wherein a multi-core FBG probe with FBGs (12,29) inscribed in the core or cores out of the center of the multi-core fiber is used to transform the two-dimensional or three-dimensional contact displacement into the spectrum shifts with a high sensitivity. At the meantime, the FBGs in the multi-core FBG probe (12,29) work as the wavelength selection device of the fiber laser, the wavelength of the fiber laser will change thereby. So the contact displacement is finally converted into the wavelength change of the fiber laser. The method and equipment have the advantage of high sensitivity, low probing force, compact structure, high inspecting aspect ratio and immunity to environment interference.

An object is to provide a technique capable of measuring a shape of an object while maintaining accuracy even when positional accuracy of a mechanism configured to move a probe is insufficient. A measurement control device 210 controls a movement mechanism 500 to move a measurement probe 160 to a target position of a target to be measured, calculates an error between an actual position of the measurement probe 160 detected by the measurement probe 160 and the target position, corrects the error by moving the measurement probe 160 by the movement mechanism 500 based on the calculated error, and then causes the measurement probe 160 to perform a distance measurement.

A coordinate measuring system for determining 3D coordinates of an object, comprising a coordinate measuring device comprising an arrangement of sensors configured to generate measurement data from which 3D coordinates of measurement points on the object are derivable, and a computing device configured to determine, based on the measurement data, 3D coordinates of the measurement points, and for storing nominal data of the object in a data storage, the nominal data comprising nominal dimension data of the object for a pre-defined temperature, wherein the nominal data comprises one or more expansion coefficients of the object, the coordinate measuring system comprises at least one temperature sensor that is configured to determine actual temperature values of the object, the at least one temperature sensor is configured to generate temperature data; and the computing device is configured to determine tempered coordinates of the object.

A modular configuration for a scanning probe for a coordinate measuring machine include a stylus suspension module, a stylus position detection module, and a signal processing and control circuitry module. The stylus position detection module is configured to be assembled separately from the stylus suspension module before mounting to the stylus suspension module. The signal processing and control circuitry module is configured to be assembled separately from the stylus position detection module and the stylus suspension module before rigidly coupling to the stylus position detection module as part of assembling the scanning probe.

Provided is a three-dimensional measurement device applicable to a machining machine. A sensor head contains a body and a collet chuck. A light emitting window and a light receiving window are provided on the front end of the body. A non-contact sensor is incorporated in the body. Laser light emitted by the non-contact sensor is radiated onto a workpiece through the light emitting window. Laser light reflected from the surface of the workpiece is received by the light receiving window. A collet chuck is attached to the rear end of the body. The collet chuck has the same shape as a collet chuck provided by each tool housed in a tool magazine of a machining center.

A touch probe for a coordinate measuring machine with a processor which is programmed to generate a trigger signal signalling a contact between a stylus of the probe and a workpiece, whenever one of a plurality displacement signals exceeds a corresponding threshold. In addition, or in alternative, a delayed trigger is generated based on a processing a plurality of samples of displacement signals that are stored in a buffer. The processor is programmed to minimize anisotropy of the probe response. Furthermore, the thresholds can be modified during operations based on commands received from the CMM controller.

A probe for an optical measurement system includes a probe body arranged to be adjustably mounted in a measuring machine for optically measuring a test object. A single mode fiber optically coupled within the probe body transmits a source beam having an instantaneous or sequentially established bandwidth spanning a range of wavelengths to the probe body and also transmits a measurement beam from the probe body toward a detector. An adjustable beam manipulator within the probe body spatially excludes portions of the reference beam over a progression of different size portions from being focused within the acceptance cone of the single mode fiber to more closely balance the intensities of the reflected object beam and the reflected reference beam within the measurement beam.

An illumination device includes first, second, and third light-emitting diode chips arranged around a center axis along virtual outlines of first, second, and third geometric figures, respectively. The geometric figures are concentric. A bond wire is connected to a connection point of each chip in its peripheral region. Multiple groups are defined, with each including one each of the first, second, and third chips. Within a first group, the first, second, and third chips are arranged on first, second, and third virtual rays, respectively. The rays each intersect only a single light-emitting diode chip, are transverse to the center axis, and originate at, and extend outwardly from, the center axis. In the first group, the second chip neighbors the first chip, the third chip neighbors the second chip, and the chips are rotated relative to one another such that the respective connection points are oriented in different directions.

A system is provided for communicating between a 3D metrology instrument and a portable computing device via near field communications. In one embodiment, the metrology device is an articulated coordinate measurement machine (AACMM), a laser tracker, a laser scanner or a triangulation scanner, and the portable communications device is a cellular phone or a tablet. The portable device may use the NFC to retrieve data stored on a circuit associated with an object to be inspected and use the data to perform an inspection on the object using the metrology device.

A system is provided for communicating between a 3D metrology instrument and a portable computing device via near field communications. In one embodiment, the metrology device is an articulated coordinate measurement machine (AACMM), a laser tracker, a laser scanner or a triangulation scanner, and the portable communications device is a cellular phone or a tablet. The portable device may use the NFC to establish longer range communications modules, to change or establish settings and parameters or control the metrology device.