A detection device and an image forming apparatus. The detection device includes a size sensor to detect a size of a sheet in a direction of conveyance, the sheet being conveyed when detected by the size sensor, a thickness sensor to detect a thickness of the sheet, and circuitry to determine whether a disparity in sizes is occurring to the sheet or a fed-with-overlap error is occurring to the sheet, based on the thickness of the sheet detected by the thickness sensor. The image forming apparatus includes a detection device including a size sensor to detect a size of a sheet in a direction of conveyance, a thickness sensor to detect a thickness of the sheet, and circuitry to determine whether a disparity in sizes is occurring to the sheet or a fed-with-overlap error is occurring to the sheet, based on the thickness of the sheet.

A film thickness measuring apparatus includes a light irradiation unit configured to irradiate an object with light in a planar shape, an optical element having a transmittance and a reflectance changing according to wavelengths in a predetermined wavelength range, the optical element being configured to separate light from the object by transmitting and reflecting the light, an imaging unit configured to photograph light separated by the optical element, and an analysis unit configured to estimate a film thickness of the object based on a signal from the imaging unit photographing light, in which the light irradiation unit emits light having a wavelength included in the predetermined wavelength range of the optical element.

The substrate has a plurality of chip regions each being provided with a structure to be a power device, and is provided with a to-be-processed film. The thickness profile of the to-be-processed film in the radial direction is measured by scanning with the sensor in the radial direction while the substrate is rotated. The average thickness of the thickness profile is calculated. At least one radial position where the thickness profile has an average thickness is extracted as at least one candidate position. At least one of the at least one candidate position is determined to be at least one measurement position. Processing liquid is supplied from a nozzle onto the to-be-processed film of the substrate while the substrate is rotated. The sensor monitors the time-dependent change in the thickness of the to-be-processed film in at least one measurement position while the substrate is rotated.

The present disclosure relates to a THz measuring device for measuring an extruded measuring object.

A method includes emitting a laser including a plurality of laser points onto a surface of a conveyor belt, capturing a plurality of first images of the surface of the conveyor belt during a first cycle of the conveyor belt, creating a first three-dimensional image of the surface of the conveyor belt during the first cycle, each of a plurality of locations of the surface of the conveyor belt in the first three-dimensional image being assigned first position data, capturing a plurality of second images of the surface of the conveyor belt during a second cycle of the conveyor belt; creating a second three-dimensional image of the surface during the second cycle, each of the plurality of locations of the surface in the second three-dimensional image being assigned second position data; and determining whether a difference between the first and second position data exceeds a predetermined threshold.

A height measurement apparatus includes: a light irradiation unit that irradiates a sample with irradiation light; a camera system that detects light from the sample irradiated with the irradiation light; and a control apparatus that calculates a height of the sample based on the wavelength information. The camera system includes an inclined dichroic mirror of which a transmittance and a reflectance change according to a wavelength in a predetermined wavelength range and which separates the light from the sample by transmitting and reflecting the light, a light detector that detects a reflected light quantity from light reflected by the inclined dichroic mirror, a light detector that detects a transmitted light quantity from light transmitted through the inclined dichroic mirror, and a processing unit that calculates the wavelength information based on a ratio between the reflected light quantity and the transmitted light quantity, to output the wavelength information.

The invention provides a method and an apparatus for measuring a thickness of each layer of a tire tread or a tire component, wherein the tire tread or tire component has conductive and non-conductive layers. One or more sensors are used, which emit radiation beams or pulses that travel through one or more of the layers. The radiation beams or pulses are reflected from the surfaces and interfaces of the layers and received by a receiving device of the one or more sensors. The reflected radiation beams or pulses are used to determine a thickness of each tread layer.

A system includes a local device and a remote computing system. The local device is disposed in a toilet paper dispenser and includes a sensor and a first processor. The sensor is configured to measure a distance to a toilet paper roll. The first processor is configured to calculate, using the measured distance to the toilet paper roll, a percentage of toilet paper remaining on the toilet paper roll. The first processor is further configured to transmit, when it is determined that the percentage of toilet paper remaining is less than a minimum threshold, sensor data across a wireless communications network. The remote computing system includes a second processor configured to receive the sensor data and send an alert for display on a user device in response to receiving the sensor data.

Embodiments of systems and methods for monitoring one or more characteristics of a substrate are disclosed. Various embodiments of utilizing optical sensors (in one embodiment a camera) to provide data regarding characteristics of a fluid dispensed upon the substrate are described. A variety of hardware improvements and methods are provided to improve the collection and analysis of the sensor data. More specifically, a wide variety of hardware related techniques may be utilized, either in combination or singularly, to improve the collection of data using the optical sensor. These hardware techniques may include improvements to the light source, improvements to the optical sensors, the relationship of the physical orientation of the light source to the optical sensor, the selection of certain pixels of the image for analysis, and the relationship of the optical sensor frame rate with the rotational speed of the substrate.

A lamination apparatus configured to manufacture an electrode cell assembly may include a lamination part configured to manufacture the electrode cell assembly through lamination, an inspection part configured to detect a defective electrode cell assembly by measuring a thickness of the manufactured electrode cell assembly, a discharge part configured to separate and discharge the defective electrode cell assembly from a normal electrode cell assembly, and a control part configured to perform control so as to calculate a time point at which the defective electrode cell assembly reaches the discharge part on the basis of distance data between a point at which the defective electrode cell assembly is detected and the discharge part and separate and discharge the defective electrode cell assembly when the defective electrode cell assembly reaches the discharge part. A method of discharging a defective electrode cell assembly by the lamination apparatus is also disclosed.